ベクトルネットワークアナライザ

• 70 kHz～70 GHzの同軸測定に一筐体で対応、また70 kHz～145 GHzの広帯域構成が可能
• ユニバーサル・フィクスチャ・エクストラクション（UFX）ソフトウェアオプションは、テストフィクスチャ抽出用の高度なデエンベディングツールを提供します。
• 最大1.1 THzの測定に拡張可能
• IMDView™ソフトウエアと内蔵コンバイナーオプションは接続の切り替えをすることなく、SパラメータとIMD測定が可能
• 高性能のパルス測定： PulseView™による最小2.5 nsのパルス分解能と、100 dBのダイナミックレンジ
• DifferentialView™による4-portシングルエンド及び真の差動測定
• VNA内蔵のアイダイアグラムオプションを搭載することにより、タイムドメイン、Sパラメータ、およびアイダイアグラムの3つの解析が可能
• 優れたダイナミックレンジ：最大142dB（レシーバダイナミックレンジ）
• ハイパワー出力：最大+14 dBm（周波数により異なります）
• 優れたテストポート性能（方向性、ソースマッチ、ロードマッチ：50 dB）
• 優れたタイムドメイン解析能力
• MN4765B O/E校正モジュールによる、70 kHz〜40 GHz、70 GHz、110 GHzの850 nm、1060 nm、1310 nm、および1550 nmの高速かつ高確度なオプトエレクトロニクス測定

VectorStar Users Site

The VectorStar Users Site is a location where you can obtain Software, O/S Patches, and needed Utilities for your VectorStar instruments.

The following are various published works that have utilized the VectorStar vector network analyzer to conduct their measurements. These papers are the property of their authors who have given Anritsu permission to post these.

3D Smith charts scattering parameters frequency-dependent orientation analysis and complex-scalar multi-parameter characterization applied to Peano reconfigurable vanadium dioxide inductors
Mueller, Andrei A. et al; nature.com Scientific Reports, 04 Dec 2019

A novel reconfigurable CMOS compatible Ka band bandstop structure using split-ring resonators and Vadandium Dioxide (VO2) phase change switches
Muller, Anrei A. et al; Infoscience EPFL scientific publications, 22 Aug 2019

Radio-Frequency Characteristics of Ge-Doped Vanadium Dioxide Thin Films with Increased Transition Temperature
Muller, Anrei A. et al; ACS Applied Electronic Materials, 16 Apr 2020

Anritsu has partnered with the following industry-leading companies to provide a variety of proven material measurement capabilities that are compatible with the VectorStar and ShockLine vector network analyzer families.

Material Measurements

	Compass Technology Choose from off-the-shelf or custom-designed RF material measurement systems able to measure material properties from 100 MHz to 90 GHz. These solutions include: focused beam, resonant cavity, waveguides, spot probes, free space measurement systems, and more. Anritsu and Compass Technology Group Material Measurements Solutions Compass Technology Group VectorStar Integration [video]
	Keycom Technologies Select from a variety of material measurement solutions that leverage various methods including: resonator, frequency change, probe type, co-axial tube and waveguide type S-parameter, free space, capacitance, epsilometery, and more. Anritsu and Keycom Material Measurement Solution
	SWISSto12 Providing hardware and software technology capable of measuring: solid samples; soft sample and foam; liquid samples and powder; thin films; dielectric coatings and multilayer materials; alumina plate; and more. Anritsu and SWISSto12 Material Measurement Solution