Modular VNA Architectures – Closing the Distance Between DUT and VNA
This webinar will discuss a new approach and methodology to making distance measurements.
Watch the webinar to learn more. [1 hour]

A Guide to Making RF Measurements for Signal Integrity
This webinar reviews signal integrity measurements from both a frequency domain and time domain perspective. It covers signal integrity terms and measurements, a usage comparison of BERTs, VNAs and TDRs for SI applications, and time and frequency domain measurement considerations for SI testing.
Watch the webinar to learn more. [45 minutes]

Understanding VNA-based USB Type-C Signal Integrity Compliance Test
This webinar reviews the use of VNAs to conduct signal integrity compliance testing in an automated environment. Follow along as a USB Type C Method of Implementation is described and measurements are explained. Understand the underlying VNA measurements and learn tips and techniques for successful measurements.
Watch the webinar to learn more. [54 minutes]

Application Advantages of Modular VNA Architectures
Watch the video to learn more. [13 minutes]

ShockLine ME7868A 2-port VNA System Introduction
Watch the video to learn more. [4 minutes]

Measuring Radomes with a SP2040 Spot Probe and a ShockLine MS46131A VNA
Watch the video to learn more. [4 minutes]

Signal Integrity Testing with the ShockLine MS46524B Vector Network Analyzer
Watch the video to learn more. [4 minutes]

Demonstration of UFX option 21 and its advantages
Watch the video to learn more. [15 minutes]

What is Alias Free Zone and how does it calculate?
Watch the video to learn more. [2 minutes]

Overview of ShockLine E-Band VNAs
Watch the video to learn more. [3 minutes]

E-band dielectric material measurement using a ShockLine Vector Network Analyzer
Discussing material measurements using the E-band frequency option, which brings banded mm-wave measurement capabilities to an economic cost level unprecedented in the marketplace.
Watch the video to learn more. [7 minutes]

Antenna radiation pattern measurements using ShockLine Vector Network Analyzers
A new way of measuring any kind of antenna in the E-band range. With 5G it’s very important to have the capability of measuring antennas.
Watch the video to learn more. [3 minutes]

Demonstrating ShockLine E-band VNA Solution
This video produced by RF Globalnet was filmed during IMS 2016 in San Francisco, CA.  Here the Product managers from Anritsu are demonstrating the ShockLine MS46522B E-band VNA used with an antenna measurement system from Diamond Engineering.
Watch the video to learn more. [3 minutes]

ShockLine Performance MS46500B series Demonstration
The MS46500B series consists of 2-port MS46522B and 4-port MS46524B models. The 500B series VNAs bring the highest level of performance to the ShockLine family.
Watch the video to learn more. [2 minutes]

A Guide to Making RF Measurements for Signal Integrity Applications
VNAs play a key role in helping both the RF and signal integrity engineers meet the performance challenges of increasing data rates. This paper provides a review of signal integrity-based VNA measurements for digital engineers and correlated VNA measurements to key signal integrity parameters for RF engineers. Download this paper to read more.

Measuring Channel Operating Margin
Channel Operating Margin, COM measures the performance margin of an interconnect, but it can also be used to examine the interoperability margin of a high speed serial system. Since COM includes the calculation of the ISI (inter-symbol interference) that remains after equalization and the effects of noise, jitter, and crosstalk, the derivation of COM itself can offer insights into the strengths and weaknesses of a design. Download this paper to read more.

PAM4 Demands Accurate S-parameters
This paper will help you understand how to use S-parameters (scattering parameters), how to think of channel response and crosstalk in terms of S-parameters, and where to look for problems that might be caused by inaccurate measurements of S-parameters. See how PAM4 challenges signal integrity, test, and design engineers who are responsible for SERDES (serializer/deserializer) components, interconnects, backplanes, cables, connectors, circuits, and complete systems. Download this paper to read more.

E-Band Based Car Radar Emblem Measurements
Automotive radar systems must operate in complex and dynamic environments where interactions with the host vehicle and its surroundings can have a significant impact on their performance. In particular, the material properties of the vehicle bumpers and location of the radar behind or within the bumper can impact performance. This application note will provide insight into the theory of frequency-modulated continuous wave (FMCW) car radars, their application, and their placement in a car chassis. It will also discuss how various types of dielectric material in front of the radar antennas (e.g., antenna dome or color-coated bumper) influences the radar’s performance. This document will describe a way to characterize the 2D insertion loss of flat material slabs and logo emblems that are used today to cover the car radar sensors, and will present 2D measurements of the dielectric properties of such materials. Download this paper to read more.

E-Band VNA for Automotive Market: Bumper and Emblem Measurements
This application note, developed in conjunction with vendors in the automotive market, will present a configuration used to test and measure the transmission and reflection characteristics of materials (emblems and bumpers) placed in front of automotive radars. The configuration will make it possible to provide clear and accurate measurements for companies working in the automobile market. These are precise and repeatable measurements given in dBs for transmission and reflection characteristics. Download this paper to read more.

Electrical-to-Optical and Optical-to-Electrical (E/O and O/E) Converter Measurements
The E/O and O/E measurement utilities are discussed in this application note. This utility is essentially an advanced de-embedding tool allowing one to remove the effects of one optical conversion device to learn the properties of the other. There are a large number of configuration choices, particularly in the four port cases. Signal-to-noise ratio is often a limiting uncertainty factor so it is important to carefully choose drive levels, IF bandwidth, and averaging in order to optimize the measurements. Download this paper to read more.

Factors in Choosing a VNA for Microwave Applications in Manufacturing
There are many aspects to consider when selecting a VNA for microwave S-parameter testing in production. Cost-of-test needs must be balanced with performance requirements and different tradeoffs can be made depending on the specific application. Anritsu’s ShockLine family of VNAs target manufacturing applications by providing a combination of performance, robustness, configurability, and ease-of-use at a lower cost than the typical high-end VNA. Download this paper to read more.

LRL/LRM Calibration Theory and Methodology
A method of calibration using beadless airlines and LRL calibration has been shown to provide excellent results up to 70 GHz. A range of 2 GHz to 70 GHz can be covered using the Model 3657-1 Multi-line Calibration Kit. For lower frequencies, the VectorStar and ShockLine VNAs offer automatic concatenation of LRL and LRM calibrations to provide coverage down to low kHz frequencies. Download this paper to read more.

Performing Sequential Peeling Extraction and De-Embedding with an Anritsu ShockLine Vector Network Analyzer
The sequential peeling network extraction tool is an effective and simple solution that enables users to de-embed subsets of structure that behave as localized pseudo-lumped-element reflection centers. This is particularly popular for electrically small structures (e.g., on-wafer) with runs of transmission line punctuated by electrically small structures (e.g., PC boards with isolated vias or studs in transmission lines). This application note examines some of the steps in the sequential peeling process. Download this paper to read more.

Understanding Vector Network Analysis
Compared to the SNA, the VNA is a much more powerful analyzer. The major difference is that the VNA adds the ability to measure phase, as well as amplitude. With phase measurements come S-parameters, which are a shorthand method for identifying forward and reverse transmission and reflection characteristics. The ability to measure phase introduces two new displays, polar and Smith chart. It also adds vector-error correction to the measurement trace. Download this paper to read more.

Utilizing Line-Reflect-Line (LRL) Calibration Method to Measure a Surface-Mount Bandpass Filter on a Fixture
This application note introduces Line-Reflect-Line (LRL) calibration method to achieve an accurate measurement of the surface-mounted device (SMD) when it is soldered onto a PCB fixture. The advantage of LRL calibration is that the calibration kit has the same material or dielectric constant and similar trace characterization as the fixture, which enables customers to readily fabricate the LRL calibration kit from the same lot as the fixture. Download this paper to read more.