This application note will explore: application drivers for 43.5 GHz development; connector fundamentals; what traceability is and why it is important; connectors for 43.5 GHz applications; and finally, current solutions on the market that can address 43.5 GHz operation with traceability. P/N: 11410-01165
Application Note
pdf 503.4 KB
Version: B
30/06/2020
This simple guide is intended for test engineers with little experience in 5G base station Tx testing and for operators requiring efficient measurement; it explains an easy procedure using the MS2850A/MS269xA to measure the EVM of 5G NR downlink Test Model signals.
Application Note
pdf 1.4 MB
03/06/2020
This application note will examine the issues component and device manufacturers and their engineers will face when designing their solutions in higher frequencies. P/N: 11410-01190
Application Note
pdf 3.9 MB
Version: A
26/05/2020
This application brief will explain how to conduct radio frequency coverage mapping testing utilizing an Anritsu MS27101A-IBCM In-Building Coverage Mapping bundle made up of a Remote Spectrum Monitor MS27101A and NEON® Signal Mapper MA8100A solutions. P/N: 11410-01194
Application Note
pdf 1.8 MB
Version: A
19/05/2020
The purpose of this application note is to detail the procedure for creating off-line maps. While there are several open source options for tile map construction, this application note will be using Map Puzzle to detail the method for incorporating these maps into the Anritsu software application. P/N: 11410-01132
Application Note
pdf 901.1 KB
Version: A
28/04/2020
This application note introduces Line-Reflect-Line (LRL) calibration method to achieve an accurate measurement of the surface-mount device (SMD) when it is soldered onto a PCB fixture. The advantage of LRL calibration is that the calibration kit has the same material or dielectric constant and similar trace characterization as the fixture, which enables customers to readily fabricate the LRL calibration kit from the same lot as the fixture. P/N: 11410-01122
Application Note
pdf 1.4 MB
Version: A
28/04/2020
This application note explains the procedure for obtaining and measuring better EVM values for wide-band signals with an actual example using the Signal Analyzer MS2850A.
Application Note
pdf 1.4 MB
24/04/2020
This document explains the process from outputting 5G NR (New Radio) TDD (Time Division Duplex) wireless signals at the MG3710E to analyzing and displaying their properties with the Signal Analyzer MS2850A.
Application Note
pdf 1.0 MB
24/04/2020
This application note highlights how to perform quantitative measurements of the attenuation of a range of material in the FR2 frequency bands utilizing the Anritsu Microwave Site Master S820E handheld cable and antenna analyzer. It also highlights the additional losses that can result directly from rainfall and the absorption of water by certain materials that may be selected for screens. P/N: 11410-01189
Application Note
pdf 4.6 MB
Version: A
31/03/2020
This application note will discuss some of the differences in mmWave 5G NR signals versus sub-6 GHz and the challenges that introduces. It will then go into some methods for testing mmWave frequencies over-the-air (OTA) to clear spectrum, hunt interference, and verify installation and operation using Anritsu's Field Master Pro MS2090A handheld spectrum analyzer. P/N: 11410-01162
Application Note
pdf 2.0 MB
Version: A
24/03/2020
This application note, developed in conjunction with vendors in the automotive market, will present a configuration used to test and measure the transmission and reflection characteristics of materials (emblems and bumpers) placed in front of automotive radars. The configuration explained below will make it possible to provide clear and accurate measurements for companies working in the automobile market. These will be precise and repeatable measurements given in dBs for transmission and reflection characteristics. P/N: 11410-01181
Application Note
pdf 2.2 MB
Version: B
17/03/2020
This Application Brief is a condensed version of the Application Note which talks about the use of radars in the automotive industry. P/N: 11410-01170
Application Note
pdf 614.9 KB
Version: A
10/03/2020
This application note describes how to bias an active device up to 220 GHz using a Kelvin bias tee with the Anritsu VectorStar ME7838x broadband system. P/N: 11410-01168
Application Note
pdf 1.6 MB
Version: A
12/02/2020
Sequential peeling is a network extraction tool used for identifying and removing subsets of a structure that behave as localized pseudo-lumped-element reflection centers. It is particularly useful for electrically small structures with runs of transmission line, such as PC boards with isolated vias in the transmission lines. This application note will examine some of the steps in the sequential peeling process. P/N: 11410-01166
Application Note
pdf 636.5 KB
Version: A
04/02/2020
The VectorStar ME7838G is a broadband system providing coverage to 220 GHz. Performing power calibrations across the entire sweep range will require multiple sensors and multiple adapters. After the power calibration and de-embedding of the adapters, the reference plane needs to be positioned at the tip of the probe for optimum performance. Relocation of the reference plane requires embedding of the probe using the .s2p file. This application note describes how to update the .s2p file of the probe as wear of the probe becomes a concern. P/N: 11410-01163
Application Note
pdf 484.4 KB
Version: A
28/01/2020
This application note addresses how power sensors are combined to cover the wide bandwidths, and how adapters and probes can be de-embedded and embedded to move the power reference plane as close as possible to the DUT. P/N: 11410-01156
Application Note
pdf 589.2 KB
Version: A
28/01/2020
This paper presents an accurate, flexible and cost-effective technique to conduct electro-optical testing on fiber optic components, such as laser modulators and photodiodes, using VNAs. The simplicity of Anritsu’s MN4765B O/E calibration modules allows highly accurate, vector-error-corrected and stable measurements with the full line of Anritsu VNAs. P/N: 11410-01034
Application Note
pdf 343.8 KB
Version: C
24/01/2020
The introduction of active antenna systems on 5G base stations requires engineers installing and maintaining them to use alternative measurement methods, such as effective isotropic radiated power (EIRP) for transmitter power and beam verification. This application note highlights how the Field Master Pro facilitates the "over-the-air" (OTA) measurement of EIRP on active base stations using an accessory dual polarized waveguide antenna. P/N: 11410-01160
Application Note
pdf 3.8 MB
Version: A
22/01/2020
By utilizing a standard Ethernet- or Wi-Fi-to-USB sharing device, the Anritsu MA24400A USB Peak Power Sensor series offers the flexibility for remote connectivity over a corporate network. The USB power sensor can be conveniently controlled and monitored from a host PC. P/N: 11410-01159
Application Note
pdf 1.1 MB
Version: A
07/01/2020
Many microwave test applications do not need the level of performance provided by an expensive, high-end VNA. This is particularly true in production, where testing is typically not as rigorous as in device characterization and cost-of-test is critical. VNAs integrated into manufacturing test systems where S-parameter measurements represent only a part of the test list, may also require only moderate performance. This application note will examine these requirements and how they factor in to deciding which VNA is appropriate for a production environment. PN: 11410-01158
Application Note
pdf 1.5 MB
Version: A
11/12/2019
