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VectorStarâ„¢ Opto-Electronic Network Analyzers

The VectorStar opto-electronic network analyzer (ONA) series provides specified, traceable measurements of O/E, E/O, and O/O devices operating at 850, 1310, and 1550 nm wavelengths at 40 and 70 GHz

The VectorStar ME7848A opto-electronic network analyzer (ONA) provides a modular approach to optical measurements of O/E, E/O, and O/O devices operating at 850, 1310, and 1550 nm wavelengths. There are two configurations available: the VectorStar ME7848A-100 series includes the MN4765B O/E calibration module and the VectorStar ME7848A-200 series adds the MN4775A E/O converter.

The VectorStar ME7848A-200 series provides the ability to quickly switch between O/E, E/O, and O/O measurements with specified traceable measurements established by the MN4765B O/E calibration module.

The VectorStar ME7848A ONA can be easily modified to different wavelengths by adding the appropriate MN4775A E/O converter and MN4765B O/E calibration detector. The VectorStar ME7838A-100 series can be upgraded to a 200 series by including the appropriate MN4775A E/O converter.

Measurement Capabilities

With the addition of the two modulators, VectorStar, along with a 110 GHz O/E photodetector, can make the following measurements. The inherent advantages that we had on the 70 GHz system are still applicable to the 110 GHz system, namely upgradability, flexibility of making opto-electronic and E/E measurements, and NIST traceability on the reference calibration photodetector.

  • Responsivity parameters (frequency response, conversion efficiency, gain of receiver, etc.)
  • Transfer functions
  • Group delay measurements
  • Optical losses
  • Balanced measurements (four port differential frequency response, gain, etc. for differential electro-optical devices)
  • E/E measurements (S11/S22)

Opto-Electronic Features

  • Fast and accurate opto-electronic measurements — The VectorStar ME7848A 200 series ONA enables error-corrected transfer function, group delay, and return loss measurements of E/O and O/E components and subsystems.
  • MN4765B O/E calibration module — The O/E calibration module is a thermally stabilized photodiode reference standard detector that can eliminate drift over temperature. Accurate bias voltage to the photodiode is maintained internally.
  • MN4775A E/O converter — The E/O converter includes a lithium niobate (LiNbO3) modulator stabilized by a fully automatic bias controller and a tunable or fixed wavelength laser source. Excellent converter stability ensures characteristics remain consistent during measurement of opto-electronic DUT detectors and receivers.
  • National Institute of Standards and Technology (NIST) derived characterization — Magnitude and phase characterization of the O/E calibration module is obtained using a primary standard characterized by NIST and held in the Anritsu Calibration Lab.
  • Internal VNA de-embedding for simplified calibration — The built-in application menus provide instructions that guide the user through the set-up and calibrations required for making E/O, O/O, and O/E measurements.
  • Excellent stability and repeatability — Use of full 12-term calibration with de-embedding results in stable and repeatable measurements of opto-electronic devices using the VectorStar VNA.
  • Modularity and upgradeability — The VectorStar ME7848A ONA can be easily modified to a different wavelength by adding the appropriate MN4775A E/O converter and MN4765B O/E calibration detector. The VectorStar ME7838A 100 series can be upgraded to a 200 series by including the appropriate MN4775A E/O converter.

Spectrum Analyzer Option

  • SPA available from 70KHz to 20/40/70/110/125/145 and 220GHz. Also available for banded configuration to 1.1THz.
  • Dual SPA mode available: suitable for Mixers/Amplifier/ Harmonics /Spurious testing.
  • SPA available on all ports. User can define which port to use as SPA port.
  • Several detection types available in classical mode: Peak, minimum, RMS, Mean.
  • Various math functions can be applied on SPA mode like Min hold/max hold/ user defined equations.
  • Sources and receivers can be independently configured. Can be used as Tracking Generator.
  • For units that have a dual source, a dual drive option is available. Support for external source control also possible.
  • Phase synchronization for units with Dual source available. This feature allows users to control and configure the phase between the two sources.
  • Source and receiver attenuator available with VNA can be activated in SPA mode. Recommendation to use option 62 (with attenuator on receiver side) for measuring the spectrum content of high-power devices.
  • Software option: easy to install and upgrade existing user equipment.

Other Features

  • Broadest frequency span from a single coaxial test port covering 70 kHz to 70 GHz in a single instrument and 70 kHz to 145 GHz in the Broadband configuration. Extendable to 1.1 THz
  • Universal Fixture Extraction (UFX) software option provides advanced de-embedding tools for test fixture extraction.
  • IMDView™ software coupled with the internal combiner option offers the ability to switch from S parameters to IMD measurements in a single connection
  • Highest performance pulse measurements— PulseView™ offers 2.5 ns pulse resolution with 100 dB dynamic range
  • 4-port single-ended or balanced measurements using DifferentialView™ analysis
  • Internal trace-based eye diagram option provides the ability to display Time Domain, S-Parameters, and Eye Diagram analysis with active sweep updates
  • Superior Dynamic Range - up to 142 dB
  • High available power - up to +14 dBm
  • Best test port characteristic performance - up to 50 dB in Directivity
  • Best time domain analysis
  • Fast and accurate optoelectronic measurements from 70 kHz to 40, 70 GHz and 110 GHz, at 850, 1060, 1310 and 1550 nm wavelengths, using MN4765B O/E Calibration module

MN4775A EO Converter

Electrical to Optical Converter MN4775A

The MN4775A is an electrical to optical converter that uses an RF input signal to intensity modulate an internal laser. The E/O converter is used in conjunction with the VectorStar MS464xB or the Shockline MS4652xB series VNAs and the MN4765B optical to electrical (O/E) converter to perform highly accurate and stable optoelectronic measurements of both modulators (E/O) and photoreceivers (O/E). The MN4775A includes a laser, an optical Mach-Zehnder intensity modulator and a variable optical attenuator to control its output power. Internal circuitry provides various power and modulation configurations as well as stabilizes overall performance.

Configuration Options

  • MN4775A-0040 40 GHz modulation bandwidth and internal 850 nm laser
  • MN4775A-0070 70 GHz modulation bandwidth and internal C-Band laser set to 1550 nm
  • MN4775A-0071 70 GHz modulation bandwidth and internal 1310 nm fixed laser
  • MN4775A-0072 70 GHz modulation bandwidth and internal 1310 nm fixed laser and internal C-Band laser set to 1550 nm (optically switched)
  • MN4775A-0110 110 GHz modulation bandwidth and internal C-Band laser set to 1550 nm
  • MN4775A-0111 110 GHz modulation bandwidth and internal 1310 nm fixed laser

Additional Features

  • Fully integrated E/O to support a complete optoelectronic characterization system
  • Mach-Zehnder intensity modulator and bias controller with manual and fully automatic operation modes
  • Variable Optical Attenuator (VOA) for automatic or manual power control
  • Internal biasing for stable operation and temperature compensation
  • Internal optical power detection/monitoring
  • Configurability for adapting to measurement applications
    • Optical output power control
    • Modulator biasing alternatives
    • Intuitive Touchscreen Front panel control of optical components as well as remote control via rear panel USB or RS-232 connections
    • In Options -007x and -011x, a jumper loop is provided which enables using an external laser (with the internal modulator and output control) from 1250 nm to 1610 nm.

MN4775A EO Response

For additional information and specifications, read the Technical Datasheet.

The following are various published works that have utilized the VectorStar vector network analyzer to conduct their measurements. These papers are the property of their authors who have given Anritsu permission to post these.

3D Smith charts scattering parameters frequency-dependent orientation analysis and complex-scalar multi-parameter characterization applied to Peano reconfigurable vanadium dioxide inductors
Mueller, Andrei A. et al; Scientific Reports, 04 Dec 2019

A novel reconfigurable CMOS compatible Ka band bandstop structure using split-ring resonators and Vadandium Dioxide (VO2) phase change switches
Muller, Anrei A. et al; Infoscience EPFL scientific publications, 22 Aug 2019

Radio-Frequency Characteristics of Ge-Doped Vanadium Dioxide Thin Films with Increased Transition Temperature
Muller, Anrei A. et al; ACS Applied Electronic Materials, 16 Apr 2020

EduPack Bundle

Making Anritsu’s leading test and measurement solutions readily available to universities and R&D institutions ensures their engineering labs are equipped with the state-of-the-art resources they need to teach students and continue their ground-breaking research using the latest technologies. The Anritsu EduPack Bundle provides students, engineers, and researchers with just that – a modular, flexible solution that is customizable based on the unique needs of the institution. The bundle comes standard with a modular VectorStar™ MS4644B 40 GHz vector network analyzer, calibration kit, active measurement suite, and Cadence AWR lite software. From there, configure the bundle to meet your specific design needs by selecting from the various options available. Whether you are designing for 5G, antennas, material measurements, etc., the Anritsu EduPack Bundle can power your innovation with the industry’s leading technologies.

Anritsu EduPack Bundle Product Brochure

Universal Test Fixture

When developing any device on a microstrip or conventional coplanar waveguide (CPW) structure, the final product does not always end up with a connectorized interface. To test the device’s response at various frequencies, engineers often use a fixture like Anritsu’s Universal Test Fixture (UTF) to conduct measurements. This gives them a structure that provides a precise connection to the DUT when no input/output connectors are available and avoids substantial errors in measurement results due to improper soldering.

Anritsu’s 3680 series UTF are highly accurate and precise fixtures that provide a repeatable solution for measuring microstrip and CPW substrate devices. Input and output connections are made to the substrate device by two spring-loaded jaws that include coax-to-microstrip/CPW launchers. The jaws accommodate substrates from 0.13 to 1.9 mm in thickness.

Anritsu Universal Test Fixture EduPack Bundle Solutions Brief

Spectrum Master™ MS276xA Ultraportable Spectrum Analyzer (9 kHz to 44 GHz)

More often than not, a spectrum analyzer is an integral part of a test bench in an education/ R&D institute and is widely used in many applications. Bundle 2 incorporates a Spectrum Master MS276xA 44 GHz ultraportable spectrum analyzer to deliver best-in-class price/performance ratio unmatched by traditional benchtop instruments. Leveraging Anritsu’s patented NLTL technology, these high-performance solutions provide leading dynamic range, sweep speed, and amplitude accuracy, while their small size allows a direct connection to almost any DUT and eliminates the need for low loss, expensive cables. This enables customers to efficiently advance their technology development while reducing time-to-market.

When paired with the VectorStar MS4644B VNA, this combination is ideal for applications requiring intermodulation distortion (IMD), harmonics, on-wafer simultaneous S-parameters, and spectrum measurements. For 5G beamforming antennas (passive and active), the Spectrum Master MS276xA becomes a very useful tool as it can measure very low-level signals and, when combined with a directional antenna, be used as a reference signal measurement tool.

Anritsu Ultraportable Spectrum Analyzer EduPack Bundle Solutions Brief

Antenna Measurement System with MilliBox Anechoic Chamber

With continued 5G antenna research, especially in the 28 and 39 GHz frequencies, having a compact antenna testing solution is ideal for universities and R&D centers. While various parameters (e.g., return loss, polarization, radiation pattern, gain, E-H plane, 2D-3D patterns, etc.) are vital for antenna measurements, the most important are antenna radiation pattern measurements as these determine how effectively an antenna radiates in comparison to an isotropic antenna. This particular measurement requires a VNA, an anechoic chamber, and software. Bundle 3 includes a portable benchtop anechoic chamber and open source software from MilliBox, and equips universities and R&D labs with a complete, cost-effective antenna measurement system.

MilliBox offers a family of modular, compact, and affordable mmWave antenna test systems. Fully compatible with the VectorStar MS4644B VNA, these systems are tailored for applications between 18 GHz and 95 GHz, include various combinations of chambers and 3D positioners, and are easy to setup and take measurements. The positioner controller software is based on an open source Python script that communicates directly with the VectorStar VNA, enabling it to take the needed antenna radiation pattern measurements. Since the software is open source code, students, teachers, and researchers can modify and customize capabilities for antenna measurements on their own, which also provides students with another valuable opportunity to develop their real-world skill set (MilliBox will provide software support).

Anritsu Anechoic Chamber Measurement EduPack Bundle Solutions Brief


Spectrum Analyzer Options:

MS4642B-049 70 kHz to 20 GHz Spectrum Analyzer option
MS4644B-049 70 kHz to 40 GHz Spectrum Analyzer option
MS4647B-049 70 kHz to 70 GHz Spectrum Analyzer option
MS4640B-049 SPA options for all broadband and banded solutions

ME7848A VectorStar ONA Configurations:

Model Description
ME7848A-0140 VectorStar 10 MHz (70 kHz opt) to 40 GHz, with 850 nm O/E calibration module
ME7848A-0170 VectorStar 10 MHz (70 kHz opt) to 70 GHz, with 1550 nm O/E calibration module
ME7848A-0171 VectorStar 10 MHz (70 kHz opt) to 70 GHz, with 1310 nm O/E calibration module
ME7848A-0172 VectorStar 10 MHz (70 kHz opt) to 70 GHz, 1310/1550 nm system (VNA and O/E module only)
ME7848A-0240 VectorStar 10 MHz (70 kHz opt) to 40 GHz, with 850 nm O/E calibration module and E/O converter
ME7848A-0270 VectorStar 10 MHz (70 kHz opt) to 70 GHz, with 1550 nm O/E calibration module and E/O converter
ME7848A-0271 VectorStar 10 MHz (70 kHz opt) to 70 GHz, with 1310 nm O/E calibration module and E/O converter
ME7848A-0272 VectorStar 10 MHz (70 kHz opt) to 70 GHz, with 1310/1550 nm O/E module and E/O convertor

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