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Webinars

 

A Guide to Making RF Measurements for Signal Integrity
This webinar reviews signal integrity measurements from both a frequency domain and time domain perspective. It covers signal integrity terms and measurements, a usage comparison of BERTs, VNAs and TDRs for SI applications, and time and frequency domain measurement considerations for SI testing.
Watch the webinar to learn more. [45 minutes]

 



Understanding VNA-based USB Type-C Signal Integrity Compliance Test
This webinar reviews the use of VNAs to conduct signal integrity compliance testing in an automated environment. Follow along as a USB Type C Method of Implementation is described and measurements are explained. Understand the underlying VNA measurements and learn tips and techniques for successful measurements.
Watch the webinar to learn more. [54 minutes]

Videos

DesignCon 2017 EDA Café Interview
Sanjay Gangal interviews Joe Mallon, Business Development Manager of Anritsu at 2017 DesignCon Conference.
Watch the video to learn more. [4 minutes]



E-band dielectric material measurement using a ShockLine Vector Network Analyzer
Discussing material measurements using the E-band frequency option, which brings banded mm-wave measurement capabilities to an economic cost level unprecedented in the marketplace.
Watch the video to learn more. [7 minutes]



Antenna radiation pattern measurements using ShockLine Vector Network Analyzers
A new way of measuring any kind of antenna in the E-band range. With 5G it’s very important to have the capability of measuring antennas.
Watch the video to learn more. [3 minutes]



Demonstrating ShockLine E-band VNA Solution
This video produced by RF Globalnet was filmed during IMS 2016 in San Francisco, CA.  Here the Product managers from Anritsu are demonstrating the ShockLine MS46522B E-band VNA used with an antenna measurement system from Diamond Engineering.
Watch the video to learn more. [3 minutes]



ShockLine Performance MS46500B series Demonstration
The MS46500B series consists of 2-port MS46522B and 4-port MS46524B models. The 500B series VNAs bring the highest level of performance to the ShockLine family.
Watch the video to learn more. [2 minutes]

White Papers

A Guide to Making RF Measurements for Signal Integrity Applications
VNAs play a key role in helping both the RF and signal integrity engineers meet the performance challenges of increasing data rates. This paper provides a review of signal integrity-based VNA measurements for digital engineers and correlated VNA measurements to key signal integrity parameters for RF engineers. Download this paper to read more.

 

Measuring Channel Operating Margin
Channel Operating Margin, COM measures the performance margin of an interconnect, but it can also be used to examine the interoperability margin of a high speed serial system. Since COM includes the calculation of the ISI (inter-symbol interference) that remains after equalization and the effects of noise, jitter, and crosstalk, the derivation of COM itself can offer insights into the strengths and weaknesses of a design. Download this paper to read more.

 

Modern Architecture Advances VNA Performance
This paper provides an overview of the high-frequency technology deployed in Anritsu’s VNA families. It is shown that NLTL technology results in miniature VNA reflectometers that provide enhanced performance over broad frequency ranges, and reduced measurement complexity when compared with existing solutions. These capabilities, combined with the frequency-scalable nature of the reflectometers provide VNA users with a unique and compelling solution for their current and future high-frequency measurement needs. Download this paper to read more.

 

PAM4 Demands Accurate S-parameters
This paper will help you understand how to use S-parameters (scattering parameters), how to think of channel response and crosstalk in terms of S-parameters, and where to look for problems that might be caused by inaccurate measurements of S-parameters. See how PAM4 challenges signal integrity, test, and design engineers who are responsible for SERDES (serializer/deserializer) components, interconnects, backplanes, cables, connectors, circuits, and complete systems. Download this paper to read more.

Applications Notes

 

Electrical-to-Optical and Optical-to-Electrical (E/O and O/E) Converter Measurements
The E/O and O/E measurement utilities are discussed in this application note. This utility is essentially an advanced de-embedding tool allowing one to remove the effects of one optical conversion device to learn the properties of the other. There are a large number of configuration choices, particularly in the four port cases. Signal-to-noise ratio is often a limiting uncertainty factor so it is important to carefully choose drive levels, IF bandwidth, and averaging in order to optimize the measurements. Download this paper to read more.

Electro-Optical Measurements using Anritsu VNAs
This paper presents an accurate, flexible and cost-effective technique to conduct electro-optical testing on fiber optic components, such as laser modulators and photodiodes, using VNAs. The simplicity of Anritsu’s MN4765B O/E calibration modules allows highly accurate, vector-error-corrected and stable measurements with the full line of Anritsu VNAs. Download this paper to read more.

LRL/LRM Calibration Theory and Methodology
A method of calibration using beadless airlines and LRL calibration has been shown to provide excellent results up to 70 GHz. A range of 2 GHz to 70 GHz can be covered using the Model 3657-1 Multi-line Calibration Kit. For lower frequencies, the VectorStar and ShockLine VNAs offer automatic concatenation of LRL and LRM calibrations to provide coverage down to low kHz frequencies. Download this paper to read more.

 

Understanding Vector Network Analysis
Compared to the SNA, the VNA is a much more powerful analyzer. The major difference is that the VNA adds the ability to measure phase, as well as amplitude. With phase measurements come S-parameters, which are a shorthand method for identifying forward and reverse transmission and reflection characteristics. The ability to measure phase introduces two new displays, polar and Smith chart. It also adds vector-error correction to the measurement trace. Download this paper to read more.

Poster

VNA Fundamentals

VectorStar – Anritsu’s Premium VNA line, provides the highest Vector Network Analysis performance on a modern platform.

Shockline - Simple, economic and performance Vector Network Analyzers aimed at cost-sensitive device test applications in engineering, manufacturing and education.

VNA Master - VNA + Spectrum Analyzer, the industry’s broadest frequency handheld solution to address cable, antenna, component and signal analysis needs in the field.

Download your own copy of this poster [approximate size: 8.75”x11.5”]


Selection Guide

ShockLine Vector Network Analyzers Selection Guide

Brochures

Vector Network Analyzer Use in Antenna Measurement Systems

VNA Product Portfolio

Quick Fact Sheets

MN25208A SmartCal Vector Network Analyzers

MN25218A SmartCal Vector Network Analyzers

MN25408A SmartCal Vector Network Analyzers

MN25418A SmartCal Automatic Calibration Unit

MS46121B 1‐Port ShockLine Vector Network Analyzers

MS46122B Compact ShockLine Vector Network Analyzers

MS46322B Economy ShockLine Vector Network Analyzers

MS46522B 2-port ShockLine Vector Network Analyzers

MS46524B 4-Port Performance ShockLine Vector Network Analyzer