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Measurement Solutions for Semiconductors

Efficient, Scalable and Reliable Measurement Solutions for Semiconductor in 5G, IoT and High-Speed Communication

How to Assure “Communications Quality” of Semiconductor?

Following are some of the common challenges and considerations in assuring the communications quality on the performance of end device.

Challenges for Leading Edge Technologies

Semiconductor design is essential for ensuring good performance of end device, and leading edge technologies are required at times.

Cellular

Cellular5G technologies rollout expands the use cases of cellular devices for IoT applications. Anritsu is ready to support your testing needs with our versatile and efficient solutions as well as extensive experience in wireless testing that began with the 2G era.
As for future technologies after the current “5G”, Anritsu has already started research.

Short Range Wireless

Short Range WirelessWi-Fi and Bluetooth® technologies are used widely especially for IoT devices, and new specifications have been introduced to the market. Anritsu is ready to support your testing needs efficiently with testing solutions ranging from legacy to latest specification.

The Bluetooth® word mark and logos are registered trademarks owned by Bluetooth SIG, Inc. and any use of such marks by Anritsu is under license. Other trademarks and trade names are those of their respective owners.

High-Speed Test Solution

High-Speed Test SolutionThe number of data centers is growing worldwide to support the huge increases in data traffic volumes caused by the rollout of 5G services and spread of IoT applications. It requires the data traffic to enhance the high-speed communications using large volumes of data. This brings the upgrades of PCI Express® to enable faster transmission of larger data traffic. Anritsu is ready to efficiently support your testing.

RF parametric and Telecommunication Protocol, From Pre-Silicon to Post-Silicon

Test environment is necessary for both RF parametric and telecommunication protocol and Anritsu is ready to support you across the phases, ranging from Pre-Silicon to Post-Silicon development.

Manufacturing Stage Challenges

Full Range of Test Solutions Supporting All Stages of IoT Device Development

Research and development
Design Verification
Intergration/Evaluation Equipment
Compliance
Production

Use Case Challenges

Let’s look at what kind of challenges and considerations are there for several use cases of finished devices.

Click here >

Please also check on the additional resources from the menu for the further information.

Additional Resources

White paper
A Bottom-Up Approach to 5G Network Slicing Security in User Equipment

5G network infrastructure equipment and the mobile devices that use them must be reliable and highly resistant to cyberattack, particularly when implementing Network Slicing. This white paper introduces more information.

Click Here to Download
Poster Key Technical Aspects of 5G-NR
Poster
Key Technical Aspects of 5G-NR

With the current worldwide 5G rollout, this poster outlines the key aspects and the latest trends of 5G technology.

Click Here to Download
White paper
Poster
Key Technology and Physical layer Test Specifications for IoT

IoT is expected to support a wide range of applications. This poster lists the key technologies and RF measurements for each standard supporting IoT use cases.

Click Here to Download

Please also check on the additional resources from the menu for the further information.

Anritsu Measurement Solutions

5G

All-in-one solution for testing both RF parametric and telecommunication protocol tests in FR1 (~ 7.125 GHz) and FR2 (Millimeter-Wave) bands.

Radio Communication Test Station MT8000A >
Introduction of Radio Communication Test Station MT8000A 5G Entry Model (PDF) >
Learn more about 5G Single Box Solution (PDF) >

MT8000A 5G Entry Model

Conformance test system supporting 3GPP protocol and carrier acceptance tests certified by GCF and PTCRB.

5G NR Mobile Device Test Platform ME7834NR >

5G NR Mobile Device Test Platform ME7834NR

Conformance test system supporting 3GPP RF conformance tests, certified by GCF and PTCRB.

New Radio RF Conformance Test System ME7873NR >

New Radio RF Conformance Test System ME7873NR

Performs TRx tests at high speed for large-lot mass-production lines with support for various wireless communications standards by selecting installed plug-in units

Universal Wireless Test Set MT8870A >

LTE, LTE Cat-M1, NB-IoT

Verifies RF TRx characteristics for development of products with LTE, LTE Cat-M1, NB-IoT R&D into mobile devices, with its easy-to-use measurement functions.

Radio Communication Analyzer MT8821C >
4G MT8821C/MD8475B

Performs TRx tests at high speed for mass-production lines with support for various wireless communications standards by selecting installed plug-in units

Universal Wireless Test Set MT8870A >
MT8870A

Wireless LAN (Wi-Fi)

Verifies RF TRx characteristics for the development of wireless LAN products, including support for the 6-GHz band products

Wireless Connectivity Test Set (for WLAN measurement) MT8862A >
WLAN (WiFi6E) MT8862A

Performs TRx tests at high speed for mass-production lines with support for various wireless communications standards by selecting installed plug-in units

Universal Wireless Test Set MT8870A >
MT8870A

Related Pages
Advantages and challenges of 6-GHz band >

Advantages and challenges of 6-GHz band

Bluetooth®

Supports RF tests of Bluetooth® modules and devices with a wide applications range from R&D to manufacturing test.

Bluetooth Test Set MT8852B >
Bluetooth Test Set MT8852B

Related Pages
Bluetooth® v5.1 Test Solution >

The Bluetooth® word mark and logos are registered trademarks owned by Bluetooth SIG, Inc. and any use of such marks by Anritsu is under license. Other trademarks and trade names are those of their respective owners.

General Purpose

VECTOR NETWORK ANALYSER/SPECTRUM ANALYSER/SIGNAL ANALYSER/SIGNAL GENERATOR for Leading Edge Development and General Purpose

Multiport VNA lowers the cost-of-test and speeds time-to-market in numerous test applications up to 43.5 GHz.

ShockLine™ 4-Port Performance VNA MS46524B >
ShockLine™ 4-Port Performance VNA MS46524B

Premium VNA line, providing the highest overall performance on a modern platform, with the broadest coverage in a single instrument

VectorStar Family of RF, µW, mmW VNAs MS4640B Series >
VectorStar Family of RF, µW, mmW VNAs MS4640B Series

Signal analyzer supports next-generation broadband and multicarrier communication systems.

Signal Analyzer MS2850A >
Signal Analyzer MS2850A

Best-of-class, multi-function, signal generator with excellent RF and baseband performance

Vector Signal Generator MG3710E >
Vector Signal Generator MG3710E

High-Speed Test Solution

BIT ERROR RATE TESTERS (BERT)/OSCILLOSCOPE

All-in-one support for both high-speed Ethernet and PCI Express interface tests

Signal Quality Analyzer-R MP1900A >
Signal Quality Analyzer-R MP1900A

BERT and sampling oscilloscope for up to 4ch installed one unit, with NRZ and PAM4 signals with high-spend, low-noise sampling oscilloscope

BERTWave™ MP2110A >
BERTWave™ MP2110A

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