DATE OF DISCONTINUANCE: March 2005
Accurate Jittter Measurements at OTN G.709, FEC and Standard Telecom Rates with the 80 MHz Bandwidth Specification Required for Testing
The MP1777A is the world's first jitter measuring instrument that accurately measures jitter characteristics at Standard Telecom, FEC and the latest OTN 10.709 Gb/s data rates. It fully conforms to the jitter specifications standardized by ITU-T O.172 and Bellcore (now Telcordia) for measuring instruments. It offers the required jitter bandwidth of up to 80 MHz on jitter generation and measurement, as well as up to a maximum of 3200 UIp-p jitter modulation amplitude for testing at 10Gb/s and FEC rates.
The jitter signal generation and measuring functions of the MP1777A permit highly accurate evaluation of jitter characteristics such as: Jitter Tolerance, Jitter Transfer, and Output Jitter, which are widely used for the quality evaluation of transmission equipment and optical modules used in high-speed digital transmission systems. Besides the standard OC-48/STM-16, OC-96/STM-32, and OC-192/STM-64 rates, jitter measurement is also supported at various FEC rates adopted by optical submarine transmission systems. Its high sensitivity input (option) allows the jitter measurement of input signals with amplitudes as low as 150mVp-p.
The MP1777A Jitter Analyzer works with your popular Anritsu MP1763 and MP1764 series 12.5 Gb/s BER Test Systems which ensures protection of investments in these products. The standard MX177701A Jitter Performance Test Software simplifies testing with automatic measurements of jitter tolerance and jitter transfer characteristics remotely from a PC. Automatic Jitter Sweep measurement function enhances the measurement speed that significantly helps decrease the test time in production environment.
With the addition of the MP1777A*06 option, the MP1777A supports jitter measurements at 10.709 Gb/s FEC (Digital Wrapper) rate for OTU-2 per ITU-T G.709 OTN (Optical Transport Network). You can now accelerate your OTN development with the characterization and evaluation of the jitter performance of devices, electrical/optical modules, and CDRs using the MP1777A Jitter Test Solution.