Skip to main content

Emerging High-frequency Design Test Challenges To be Met by Anritsu Company at IMS 2017

6/1/2017

NLTL Technology, Signal Analysis Solutions Headline Global Test Leader’s Offering to Meet Stringent Requirements of Today’s Microwave and Millimeter Designs

Richardson, TX – June 1, 2017 – Emerging test technologies, processes, and solutions that address the growing applications in the microwave and millimeter wave (mmWave) bands will be showcased by Anritsu Company (booth #1116) throughout the IEEE MTT International Microwave Symposium (IMS) conference, to be held June 4-9 in Honolulu. The benefits of Anritsu’s patented Nonlinear Transmission Line (NLTL) technology, as well as its signal analyzer and vector network analyzer (VNA) test solutions will be shown in its booth, while company experts will present new techniques and offer insight on test challenges throughout IMS.

“Today’s military/aerospace and commercial communications systems are becoming increasingly complex and operate at higher frequencies. At IMS 2017, Anritsu will showcase technologies and test solutions to help engineers meet the demands associated with these challenging designs. Through our tutorials, speaking engagements and exhibits, we will offer novel testing approaches that will help successfully and efficiently move technology forward into higher frequencies,” said Paul Innis, Vice President and General Manager of Anritsu Company.

Advanced Test Technology
At the forefront of the test leadership will be Anritsu’s VectorStar® and ShockLine™ VNA families that feature NLTL technology. Among the benefits of the technology are superior dynamic range of >100 dB spanning microwave and mmWave frequency ranges and ultra-high stability. Additionally, it creates a much smaller form factor, as well as improved capability-to-cost ratio for more economical testing – all critical elements in high-frequency designs.

NLTL benefits will be on display in the Anritsu IMS booth. One station will feature simultaneous VNA and spectrum analysis. The demonstration will consist of fully corrected on-wafer VNA measurements from 70 kHz to 110 GHz and spectrum analysis from 10 GHz to 110 GHz using 1mm modules and couplers with on-wafer probes.

Stability advantages of NLTL-based VNAs will be displayed in a mmWave active device measurement demonstration. S-parameter, noise figure and intermodulation distortion measurements will be made in a simple and economical configuration. Also on display will be the 60-90 GHz E-Band ShockLine VNA, and the Ultraportable Spectrum Master™ VNA MS2760A that brings unprecedented measurement capability in a solution the size of a mobile device.

Anritsu will also highlight its Spectrum Analyzer/Signal Analyzer MS2830A, an economical solution that features high performance, including excellent +/-0.3 dB (typical) absolute level accuracy and best-in-class 168 dB dynamic range. A built-in vector signal generator (VSG) outputs continuous wave (CW) and modulated signals that can be used as reference signal sources when testing Tx characteristics as well as signal sources for evaluating Rx characteristics. At IMS, the MS2830A will transmit a modulated signal from the VSG that will be received on the analyzer’s input port and demodulated to display constellation diagram, power level, and EVM.

Speaking Sessions and Tutorials
Anritsu will participate in technical paper presentations, workshops, and tutorials throughout IMS. The sessions provide engineers with new methods and advanced theories so they have greater confidence in their high-frequency designs. The schedule includes:

Monday, June 5 – Anritsu will participate in two workshops, both of which begin at 8:00 a.m. RF to/from Bits: Challenges in High Frequency Mixed Signal Measurements and Design will be held in room 316B and include a 10-minute session on “Challenges in Characterization of Mixed Signal Systems” by Dr. Jon Martens of Anritsu. Dr. Martens will also give a 10-minute session entitled “Millimeter-Wave Multi-GHz-IF Receivers: Linearity and Correction Considerations,” as part of Novel 5G Applications of Nonlinear Vector Network Analyzer for Broadband Modulation and Millimeter Wave Characterization. This workshop will be held in room 318B.

Wednesday, June 7- Anritsu VNA Product Manager Steve Reyes will speak on the Future of RF Semiconductor Test, which is part of the MicroApp (Microwave Applications Seminars). The panel will be held in booth #1946 in the exhibit hall from noon to 1:00 p.m.

Friday, June 9 – Anritsu will take part in the 89th ARFTG Microwave Measurement Symposium on Advanced Technologies for Communications. The all-day event incorporates oral sessions, exhibits, and interactive forums.

About Anritsu

Anritsu Company is the United States subsidiary of Anritsu Corporation, a global provider of innovative communications test and measurement solutions for 120 years. Anritsu’s “2020 VISION” philosophy engages customers as true partners to help develop wireless, optical, microwave/RF, and digital solutions for R&D, manufacturing, installation, and maintenance applications, as well as multidimensional service assurance solutions for network monitoring and optimization. Anritsu also provides precision microwave/RF components, optical devices, and high-speed electrical devices for communication products and systems. The company develops advanced solutions for 5G, M2M, IoT, as well as other emerging and legacy wireline and wireless communication markets. With offices throughout the world, Anritsu has approximately 4,000 employees in over 90 countries.

To learn more visit www.anritsu.com and follow Anritsu on Facebook, Google+, LinkedIn, Twitter, and YouTube.

Anritsu Contact:
Kim Collins
Director, Americas Marketing
Kim.collins@anritsu.com
972.761.4625
Agency Contact:
Patrick Brightman
3E Public Relations
pbrightman@3epr.com
973.263.5475