Opto-electronic devices have become an integral part of the modern world. They provide almost critical capabilities to bandwidth-hungry data transmissions and high-speed interconnects. However, application usage is requiring opto-electronics to shrink in size. While this miniaturization allows more opto-electronic or electro-optical devices to be placed on a single wafer, it increases complexity when testing and verifying their performance. As device technologies evolve from simple transmission lines to optical-to-electrical converters to optical modulators and beyond, manufacturers must produce proper platforms that enable chip designers to test and improve their rapidly maturing silicon photonic (SiPh) designs.

What you will learn:

This webinar will discuss SiPh probing applications, which fall into three categories: modeling and characterization, wafer acceptance testing, and production process monitoring. You will learn more about each of these categories and their unique emphasis relative to accuracy, throughput, and test flexibility.

Presenter:

Navneet Kataria

Navneet Kataria is the Product Marketing Engineer at Anritsu company USA. He has a vast experience of 10 years working in the field of Test and Measurement in various technical and Business roles. Navneet earned his full time Bachelor’s degree (Hons.) with specialization in Electronics and Communication from India.