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Anti-Virus Measures for Instruments with Windows Operating System

We take measures to protect Anritsu instruments that run Windows operating systems from computer viruses. This white paper provides ways of protecting your instrument from computer viruses.

White Paper pdf 414.4 KB 6/6/2018

The Impact of Return Loss on Base Station Coverage in Mobile Networks

In this paper we will focus on losses due to reflections. These reflections are measured using a cable and antenna analyzer such as the Anritsu Site Master. Operators often specify that the worst case reflections (return loss) over the operating frequency range of the system must be 18 dB. But, what exactly does that mean? It means the reflected signal must be 18 dB lower than the signal that is transmitted into the system. Or, another way of looking of this is that the reflected signal must be less than 1/64th the magnitude of the signal transmitted into the system. Where did this limit come from? In many cases, it has been based on what an operator knows is possible when high quality components are installed according to the manufacturer’s specifications using good workmanship. As feed systems become shorter and antenna systems are required to operate over broader frequency ranges, achieving an 18 dB return loss may not be practical.

White Paper pdf 711.3 KB Version: B 3/29/2018

Superposition vs. True-Balanced: What's Required for your Signal Integrity Application White Paper

The superposition technique relies on the inherent linear nature of a transmission line, and mathematically derives the differential and common-mode transmission line characteristics through superposition while stimulating just one side of the balanced transmission line at a time. The true-balanced/differential technique, also known as True-Mode Stimulus, uses two sources to create actual differential and common-mode stimuli. This white paper offers guidance to signal integrity designers on the differences between these approaches and which one may best fit their need.

White Paper pdf 79.3 KB Version: C 3/28/2018

RF and Microwave Material Measurements: Techniques and Applications White Paper

Continual demand to accurately measure dielectric and magnetic properties of materials is a common need and is apparent in our every day lives. There is a need to quantitatively characterize material properties at RF and microwave frequencies. Learn more about the use of vector network analyzers (VNAs) as a flexible and versatile tool to accurately and quantitatively characterize material properties and showcase the broad applicability of the VNA as a tool to accurately do this at high frequencies.

White Paper pdf 1.2 MB Version: A 3/14/2018

Wideband Optical Modulator and Detector Characterization

Uncertainties and the Impact on Eye Diagrams/Time Domain Modeling

The characterization and measurement of E/O and O/E components at higher microwave frequencies has a different uncertainty distribution than at lower frequencies. A careful process can help minimize many of those categories. The individual uncertainty components have very different effects on final subsystem modeled time domain results, such as eye diagrams. Understanding that error propagation can be useful. In a practical example, optimizing the critical uncertainty components can lead to noticeably better eye behavior in the final model.

White Paper pdf 817.7 KB Version: B 2/6/2018

Understanding Cable & Antenna Analysis

The cable and antenna system plays a crucial role of the overall performance of a Base Station system. Degradations and failures in the antenna system may cause poor voice quality or dropped calls. From a carrier standpoint, this could eventually result in loss of revenue.

White Paper pdf 1.5 MB Version: F 10/24/2017

Impact of Reciprocal Path Loss on Uplink Power Control for LTE

This case study shows the impact of testing LTE PUCCH power control of the device under truly reciprocal channel conditions that factor the downlink and uplink variations.

White Paper pdf 672.3 KB 10/2/2017

Testing Drones – The Challenges & Smart Solutions

This white paper talks about the emergence of (nonmilitary) drones, with a focus on some of the challenges associated with testing drones and proposed solutions.

White Paper pdf 598.4 KB 10/2/2017

Classical and Wi-Fi Doppler Spectra – Comparison and Applicability

This white paper introduces and compares the classical (Jakes) and Wi-Fi (Bell) spectra and provides some much-needed guidance on the Doppler Spectrum to be used for mobile Wi-Fi devices.

White Paper pdf 499.1 KB 10/2/2017

Understanding LTE‐A HetNet Interference Mitigation Techniques

This white paper discusses the evolution from LTE to LTE-A, and the benefits and challenges this has brought about. It then talks about heterogeneous networks (HetNet), the interference challenges they create, and the interference mitigation techniques added in response.

White Paper pdf 817.0 KB 10/2/2017

Burst Detect

Burst detect is a sweep method that makes it easy to see short-duration, bursty signals, such as those emanating from an improperly installed cell phone booster. It can also show the envelope of a Wi-Fi signal – which is basically anything that occurs infrequently. A 1% duty cycle is enough to detect a bursty signal. As many as 20,000 measurements per second – thousands of times faster than a normal FFT – can be made with the Burst Detect method. The result is that users can see a 200 microsecond pulse every time, making it much easier to find burst signals.

White Paper pdf 1.9 MB Version: B 6/30/2017

Sequential Peeling: a Model-Based Approach to Structure Identification and De-embedding

Sequential peeling is a model/measurement-based method at network extraction for de-embedding. It uses isolatable phase responses of defects to create a lumped-element description of a structure (shunt, series, or cross-bar) that can be physically meaningful and useful in sequential de-embedding. The method works best when the significant reflections are electrically small and isolated and the overall loss of the fixture is not too great but there are corrections available to help with the loss element.

White Paper pdf 1.3 MB Version: A 6/6/2017

Scaling the Test Equipment Size to Match Millimeter Wave Test Needs

This white paper will discuss issues of transferring millimeter wave signals through coax cable within a test system and the benefits of improved measurement accuracy by reducing the size of the test equipment and using fewer interconnections.

White Paper pdf 1.7 MB Version: A 2/14/2017

Wireless Backhaul Challenging Large-Capacity and High-Speed Transfers

This white paper describes an overview of the wireless backhaul, its technology trend, and its measurement. It explains that the use of higher dimensional modulation, higher frequency and wider bandwidth in wireless backhaul might need new technical requirements and challenge for its transmitter and receiver.

White Paper pdf 1.1 MB 1/16/2017

Identifying Sources of External PIM

Identifying the location of external PIM sources has been an extremely difficult problem for mobile operators worldwide. With Anritsu’s PIM Hunter™, PIM Master™ and Spectrum Master™ products, operators finally have the tool set required to precisely identify external PIM sources. Once identified, a variety of PIM mitigation techniques can be deployed to reduce PIM levels and improve system performance.

White Paper pdf 2.3 MB Version: A 11/22/2016

Modern Architecture Advances Vector Network Analyzer Performance White Paper

This paper provides an overview of the high-frequency technology deployed in Anritsu's VNA families. It is shown that NLTL technology results in miniature VNA reflectometers that provide enhanced performance over broad frequency ranges, and reduced measurement complexity when compared with existing solutions. These capabilities, combined with the frequency-scalable nature of the reflectometers provide VNA users with a unique and compelling solution for their current and future high-frequency measurement needs.

White Paper pdf 2.1 MB Version: B 11/8/2016

A Guide to Making RF Measurements for Signal Integrity Applications

Higher data rates require accurate measurements to provide the confidence needed to achieve the desired performance. Measurement tools must help shorten design times and ensure stable signal integrity in mass production. VNAs play a key role in helping both the RF and signal integrity engineers meet the performance challenges of increasing data rates. This paper provides a review of signal integrity-based VNA measurements for digital engineers and correlated VNA measurements to key signal integrity parameters for RF engineers. For those needing to increase their current measurement performance, Anritsu offers a wide range of test equipment that is designed to meet both your budget and performance needs for either R&D or manufacturing.

White Paper pdf 2.5 MB Version: A 10/31/2016

Measuring Channel Operating Margin

Channel Operating Margin, COM, has emerged at high data rates as a single measure of channel performance that includes the effects of both signal impairments and the techniques used to compensate for those impairments.

COM measures the performance margin of an interconnect, but it can also be used to examine the interoperability margin of a high speed serial system. Since COM includes the calculation of the ISI (inter-symbol interference) that remains after equalization and the effects of noise, jitter, and crosstalk, the derivation of COM itself can offer insights into the strengths and weaknesses of a design.

COM was developed for channel characterization in 100, 200, and 400 Gigabit Ethernet (GbE) standards: IEEE 802.3bj and IEEE 802.3bs. It’s specified for both NRZ (non-return to zero) and PAM4 (4-level pulse amplitude modulation) standards and is derived nearly the same way in both cases.

White Paper pdf 2.8 MB Version: A 10/10/2016

Optimizing Your Millimeter-Wave Test Capability White Paper

This white paper discusses the challenges associated with millimeter-wave testing and how to optimize your Vector Network Analyzer (VNA) measurement capability to provide the confidence required to make performance/cost tradeoffs.

White Paper pdf 2.2 MB Version: B 10/10/2016

PAM4 Demands Accurate S-parameters

In this paper we’ll see how PAM4 challenges signal integrity, test, and design engineers who are responsible for SERDES (serializer/deserializer) components, interconnects, backplanes, cables, connectors, circuits, and complete systems. The problems solved by PAM4 outweigh the problems it introduces, but PAM4’s increased complexity means that we must address a host of new issues.

This paper will help you understand how to use S-parameters (scattering parameters), how to think of channel response and crosstalk in terms of S-parameters, and where to look for problems that might be caused by inaccurate measurements of S-parameters. We’ll introduce the ins and outs of PAM4 in the next section.

White Paper pdf 1.1 MB Version: A 9/19/2016

By Document Type

MS4640B VectorStar Application (Software and DSP Firmware)

Unzip the downloaded file into a flash drive. Important: New software installation instructions are included. Please be sure to read the "VectorStar How To Install" document before installing.

Drivers Software Downloads zip 515.4 MB Version: 2018.6.1 7/11/2018

Software Update MT8852B Firmware version 5.00.011

MT8852B Firmware Version 5.00.011

MD5 : 4554881bdbbb94e3f50cc86fe840773d

Drivers Software Downloads zip 4.5 MB Version: 5.00.011 7/5/2018

Firmware Update for the Remote Spectrum Monitor MS27100A, MS27101A, MS27102A and MS27103A

Download the latest firmware for the Anritsu Remote Spectrum Monitor models MS27100A, MS27101A, MS27103A, and MS27103A.

Drivers Software Downloads tar 55.4 MB Version: 2018.6.1 6/30/2018

Firmware Revision History for the MS2710xA

Firmware Revision History for the MS27100A, MS27101A, MS27102A, and MS27103A Spectrum Monitors.

Drivers Software Downloads pdf 70.9 KB Version: 2018.6.1 6/30/2018

Firmware Update for the Spectrum Master MS2720T

This firmware update contains the latest upgrades for your instrument. Once downloaded, run the file on your computer to see the installation instructions.

Drivers Software Downloads exe 42.8 MB Version: 3.13 6/29/2018

Firmware Revision History for the MS2720T

Complete firmware release history for the MS2720T Spectrum Master Handheld Spectrum Analyzer.

Drivers Software Downloads pdf 262.7 KB Version: 3.13 6/29/2018

Firmware Update for the BTS Master MT8220T

This firmware update contains the latest upgrades for your instrument. Once downloaded, run the file on your computer to see the installation instructions.

Drivers Software Downloads exe 69.4 MB Version: 3.13 6/29/2018

Firmware Revision History for the BTS Master MT8220T

Firmware release history for the MT8220T BTS Master.

Drivers Software Downloads pdf 267.6 KB Version: 3.13 6/29/2018

Firmware Update for the BTS Master MT822xB

This firmware update contains the latest upgrades for your instrument. Once downloaded, run the file on your computer to see the installation instructions.

Drivers Software Downloads exe 70.1 MB Version: 3.13 6/29/2018

Firmware Revision History for the MT822xB Family

Firmware release history for the MT8221B and the MT8222B BTS Master Handheld Base Station Analyzers.

Drivers Software Downloads pdf 329.6 KB Version: 3.13 6/29/2018

Firmware Update for the Spectrum Master MS271xE

This firmware update contains the latest upgrades for the Spectrum Master MS2711E, MS2712E, and the MS2713E. Once downloaded, run the file on your computer to see the installation instructions.

Drivers Software Downloads exe 75.0 MB Version: 3.13 6/29/2018

Firmware Update for the Cell Master MT821xE

This firmware update contains the latest upgrades for the Cell Master MT8212E and MT8213E. Once downloaded, run the file on your computer to see the installation instructions.

Drivers Software Downloads exe 75.0 MB Version: 3.13 6/29/2018

Firmware Revision History for the MS271xE and MT821xE

Firmware release history for the Spectrum Master MS2711E, MS2712E and MS2713E handheld spectrum analyzer Family. Also includes the history for the Cell Master MT8212E and MT8213E

Drivers Software Downloads pdf 460.4 KB Version: 3.13 6/29/2018

Firmware Update for the Site Master S33xE

This firmware update contains the latest upgrades for your instrument. Once downloaded, run the file on your computer to see the installation instructions.

Drivers Software Downloads exe 61.8 MB Version: 3.12 6/22/2018

Firmware Update for the Site Master S36xE

This firmware update contains the latest upgrades for your instrument. Once downloaded, run the file on your computer to see the installation instructions.

Drivers Software Downloads exe 61.8 MB Version: 3.12 6/22/2018

Firmware Revision History for the S33xE and S36xE

Firmware release history for the Site Master S331E, S332E, S361E, and S362E Cable and Antenna Analyzers.

Drivers Software Downloads pdf 326.7 KB Version: 3.12 6/22/2018

MX183000A High-Speed Serial Data Test Software

It is an installer to install the MX183000A High-Speed Serial Data Test Software.
The use of the latest version is recommended.

MD5 : a5d8372609ee1266148a3ad845ea725f

Drivers Software Downloads zip 63.9 MB Version: 3.03.01 6/18/2018

uOTDR_Firmware_v234_E

Firmware and documents for MU909014A/A1/B/B1/15B/B1 are contained in the zip file.

MD5 : e5277227a00f8dfb06f935047d6244a2

Drivers Software Downloads zip 18.8 MB Version: 2.34 6/14/2018

uOTDR_Rev2_Firmware_v234_E

Firmware and documents for MU909014C/C6/15A6/C/C6 are contained in the zip file. This program falls under the regulation of EAR. The ENC license exception is applicable.

MD5 : 021b305f17322f8c86a2d91a59580ec7

Drivers Software Downloads zip 18.9 MB Version: 2.34 6/14/2018

Advanced Time Domain ADK Software

Advanced Signal Integrity Design Kits (or, ADK) is a collection of many signal integrity utility tools. It is designed to pre- and post-process signal integrity (SI) simulation and measurement data in an easy-to-use, mobile-apps-like package. It helps SI engineers identify and correct errors and correlate between simulation and measurement within a few mouse clicks. A system's design cycle time is greatly improved as a result. ADK software is required for the Advanced Time Domain (option 22). Option 22 is a licensed option available on MS4652xB VNAs. For purchase and installation information, please contact Anritsu.

Drivers Software Downloads msi 39.3 MB Version: 2018.04.17 6/6/2018

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