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Semiconductor
Site Master S810D covers 2 MHz to 10.5 GHz.
Standard measurement capabilities includes VSWR, return loss, cable loss, and distance-to-fault (DTF) analysis, using frequency domain reflectometry (FDR) technology. Patented RF interference rejection enables accurate measurements in the presence of high RF activity. Both coaxial and waveguide connections are supported.
For supporting documentation, see Library.
