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Shortened Measurement Time

All-in-One Simultaneous BER and Eye Pattern Measurements


Since one set can perform simultaneous BER measurement and Eye Pattern analysis, both equipment investment costs and test times are halved. Additionally, the Tracking function makes it easy to set both the BERT and Eye/pulse scope functions.


4ch Simultaneous BER Measurements


Using the built-in All BER Result function supports simultaneous BER measurement of 4 channels, cutting measurement time to less than 1/3 that of legacy models.


High-Speed Eye Mask Test


The Fast Sampling Mode executes Eye Mask tests in shorter times of about 8 s*, helping cut measurement times.
*Typical time at bit rate of 10.3125 Gbit/s with PRBS 31 test pattern and back-to-back measurements with 1,000,000 samples.


High-Speed Mask Margin Measurement


The Mask Margin is measured automatically to confirm Mask Margins in almost real-time, helping cut measurement time.


Shorter Measurement Times

Using simultaneous 4ch BER measurement and the Fast Sampling Mode slashes measurement times by up to 80% compared to legacy models.


Legacy Model 1 is a combination of a 2ch BERT and sampling oscilloscope.
Legacy Model 2 integrates a 2ch BERT and sampling oscilloscope into one instrument (set).
The MP2100B integrates a 4ch BERT and sampling oscilloscope into one instrument (set).
Capture BER for 3 points for each of 1E-3, 1E-5, 1E-7, 1E-8, 1E-9, and 1E-10 for 4ch × 10 Gbit/s.
Compare to the waveform of 1 Msample.



Full-Featured Measurement Functions

Wideband Operating Frequency


Since the BERT function (with Opt-092 installed) supports speeds from 125 Mbit/s to 12.5 Gbit/s, one set can be used for various applications, including 100BASE-FX, GE-PON, CPRI, 10GFC, OTU2, etc.


Eye Pattern Analysis

Eye Mask analysis is supported for many applications because the sampling oscilloscope supports DC to 25 GHz for electrical I/F; and DC to 9 GHz for optical I/F.

Time, Amplitude Tests

Measurements include 0 level, 1 level, SNR, Eye loss ratio, Eye amplitude, Eye height, Eye width, Jitter p-p, Jitter rms, extinction ratio, rise time, fall time, duty cycle distortion, and average power. Additionally, extinction ratio is measured with the excellent accuracy required for confirming optical module characteristics.


For easy troubleshooting, waveform data component analysis can be performed by measuring the mean, standard deviation, and dispersion of the measured in-band data distribution.



High-Quality Waveforms (PPG) and High-Sensitivity Input (ED)

High-Quality Waveforms (PPG) and High-Sensitivity Input (ED)


The built-in high-waveform quality PPG (1 ps Jitter typ.) and high-accuracy (10 mVp-p) ED simplify precision measurement of DUT characteristics.



Jitter Analysis Function

Jitter Analysis Software MX210001A

This software supports two Jitter measurement methods: the Histogram method for basic Jitter analysis, and the Pattern Search method for detailed Jitter analysis. Each method can be chosen according to the application.




Transmission Analysis Function

Transmission Analysis Software MX210002A

With functions for analyzing transmissions (S21 gain and phase), plus a waveform simulation function executed by linear equalizer, filter, and Emphasis calculations, this software can sample and simulate waveforms simultaneously as well as execute simultaneous Eye Pattern and Eye Mask functions.


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