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VectorStarâ„¢ Opto-Electronic Network Analyzers

ME7848A
The VectorStar opto-electronic network analyzer (ONA) series provides specified, traceable measurements of O/E, E/O, and O/O devices operating at 850, 1310, 1550 nm wavelengths up to 110 GHz
overview

The VectorStar ME7848A opto-electronic network analyzer (ONA) provides a modular approach to optical measurements of O/E, E/O, and O/O devices operating at 850, 1310, and 1550 nm wavelengths. There are two configurations available: the VectorStar ME7848A-100 series includes the MN4765B O/E calibration module and the VectorStar ME7848A-200 series adds the MN4775A E/O converter.

The VectorStar ME7848A-200 series provides the ability to quickly switch between O/E, E/O, and O/O measurements with specified traceable measurements established by the MN4765B O/E calibration module.

The VectorStar ME7848A ONA can be easily modified to different wavelengths by adding the appropriate MN4775A E/O converter and MN4765B O/E calibration detector. The VectorStar ME7838A-100 series can be upgraded to a 200 series by including the appropriate MN4775A E/O converter.

Measurement Capabilities

With the addition of the two modulators, VectorStar, along with a 110 GHz O/E photodetector, can make the following measurements. The inherent advantages that we had on the 70 GHz system are still applicable to the 110 GHz system, namely upgradability, flexibility of making opto-electronic and E/E measurements, and NIST traceability on the reference calibration photodetector.

  • Responsivity parameters (frequency response, conversion efficiency, gain of receiver, etc.)
  • Transfer functions
  • Group delay measurements
  • Optical losses
  • Balanced measurements (four port differential frequency response, gain, etc. for differential electro-optical devices)
  • E/E measurements (S11/S22)


OE Calibration Module

MN4765B O/E Calibration Module (70 kHz to 40/70/110/145 GHz)

The MN4765B is a characterized, unamplified high-speed photodiode module. It is used as an optical receiver with the Anritsu MS4640B Series VectorStar VNAs to perform highly accurate and stable optoelectronic measurements of both modulators (E/O) and photoreceivers (O/E). The MN4765B is the base calibration module part number only. Customers are required to also order an option to configure the bandwidth and wavelength coverage.

The MN4765B with option 70 configures the calibration module for 70 kHz to 70 GHz frequency and 1550 nm wavelength coverage. This option consists of a high-speed photodiode that converts modulated optical signals to electrical signals and includes additional circuitry for temperature and bias stability. The high-speed photodiode has exceptional bandwidth response to 70 GHz and a typical responsivity of 0.7 A/W. Option 71 is configured from 70 kHz to 70 GHz and 1310 nm, while Option 72 is configured from 70 kHz to 70 GHz at both 1310 and 1550 nm.

Option 110 configures the module for 70 kHz to 110 GHz and 1550 nm. Option 111 configures the module for 70 kHz to 110 GHz and 1310 nm, while Option 112 configures the module from 70 kHz to 110 GHz at both 1310 and 1550 nm.

The MN4765B with Option 140 configures the module for 70 kHz to 145 GHz and 1550 nm.The MN4765B is the first O/E module with traceability to a recognized National Metrology Institute up to 145 GHz and all O/E modules are characterized in both magnitude and phase using a NIST derived calibration standard up to 110 GHz.

Note: MN4765B is the base calibration module part number only. Customers are required to also order an option to configure the bandwidth and wavelength coverage. These options consist of a high-speed photodiode that converts modulated optical signals to electrical signals, and includes additional circuitry for temperature and bias stability.

Configuration Options:

Model Description
MN4765B-0040 Configured for 70 kHz to 40 GHz range, with 850 wavelength coverage
MN4765B-0042 Configured for 70 kHz to 40 GHz range, with 850 and 1060 nm wavelength coverage
MN4765B-0043 Configured with 70 kHz to 40 GHz range, with 850/1060/1310/1550 nm wavelength coverage
MN4765B-0070 Configured for 70 kHz to 70 GHz range, with 1550 nm wavelength coverage
MN4765B-0071 Configured for 70 kHz to 70 GHz range, with 1310 nm wavelength coverage
MN4765B-0072 Configured for 70 kHz to 70 GHz range, with 1310 and 1550 nm wavelength coverage
MN4765B-0110 Configured for 70 kHz to 110 GHz range, with 1550 nm wavelength coverage
MN4765B-0111 Configured for 70 kHz to 110 GHz range, with 1310 nm wavelength coverage
MN4765B-0112 Configured for 70 kHz to 110 GHz range, with 1310 and 1550 nm wavelength coverage
MN4765B-0140
Configured for 70 kHz to 145 GHz range, with 1550 nm wavelength coverage
MN4765B-0098
Standard Calibration, ISO 17025 compliant, without data
MN4765B-0099
Premium Calibration, ISO 17025 compliant, with data

Additional Features

  • Fast and accurate optoelectronic measurements- The MS4640B VectorStar series VNAs, when calibrated using the MN4765B module, enable error-corrected Transfer Function, Group Delay, and Return Loss measurements of E/O and O/E components and subsystems
  • National Institute of Standards and Technology derived characterization - Magnitude and phase characterization is obtained using a primary standard characterized by NIST and held in the Anritsu Calibration Lab. The magnitude and phase data is provided on a USB drive with the module
  • Temperature Stable - The MN4765B is thermally stabilized to eliminate drift in photodiode performance over temperature
  • Internal Biasing - Accurate bias voltage to the photodiode is maintained internally. An external, multi-country, AC adapter is included for easy operation
  • High Linearity - Linear operating range to +6 dBm for transfer function measurement uncertainties of <0.45 dB @ 50 GHz and <0.7 dB @ 70 GHz (typical specifications for MN4765B-0070)
  • High Responsivity - 0.7 A/W and 0.5 A/W (Typical specification for MN4765B-0070 and -0110 respectively)

For additional information and specifications:

Opto-Electronic Features

  • Fast and accurate opto-electronic measurements — The VectorStar ME7848A 200 series ONA enables error-corrected transfer function, group delay, and return loss measurements of E/O and O/E components and subsystems.
  • MN4765B O/E calibration module — The O/E calibration module is a thermally stabilized photodiode reference standard detector that can eliminate drift over temperature. Accurate bias voltage to the photodiode is maintained internally.
  • MN4775A E/O converter — The E/O converter includes a lithium niobate (LiNbO3) modulator stabilized by a fully automatic bias controller and a tunable or fixed wavelength laser source. Excellent converter stability ensures characteristics remain consistent during measurement of opto-electronic DUT detectors and receivers.
  • National Institute of Standards and Technology (NIST) derived characterization — Magnitude and phase characterization of the O/E calibration module is obtained using a primary standard characterized by NIST and held in the Anritsu Calibration Lab.
  • Internal VNA de-embedding for simplified calibration — The built-in application menus provide instructions that guide the user through the set-up and calibrations required for making E/O, O/O, and O/E measurements.
  • Excellent stability and repeatability — Use of full 12-term calibration with de-embedding results in stable and repeatable measurements of opto-electronic devices using the VectorStar VNA.
  • Modularity and upgradeability — The VectorStar ME7848A ONA can be easily modified to a different wavelength by adding the appropriate MN4775A E/O converter and MN4765B O/E calibration detector. The VectorStar ME7838A 100 series can be upgraded to a 200 series by including the appropriate MN4775A E/O converter.

Spectrum Analyzer Option

  • SPA available from 70KHz to 20/40/70/110/125/145 and 220GHz. Also available for banded configuration to 1.1THz.
  • Dual SPA mode available: suitable for Mixers/Amplifier/ Harmonics /Spurious testing.
  • SPA available on all ports. User can define which port to use as SPA port.
  • Several detection types available in classical mode: Peak, minimum, RMS, Mean.
  • Various math functions can be applied on SPA mode like Min hold/max hold/ user defined equations.
  • Sources and receivers can be independently configured. Can be used as Tracking Generator.
  • For units that have a dual source, a dual drive option is available. Support for external source control also possible.
  • Phase synchronization for units with Dual source available. This feature allows users to control and configure the phase between the two sources.
  • Source and receiver attenuator available with VNA can be activated in SPA mode. Recommendation to use option 62 (with attenuator on receiver side) for measuring the spectrum content of high-power devices.
  • Software option: easy to install and upgrade existing user equipment.

Other Features

  • Broadest frequency span from a single coaxial test port covering 70 kHz to 70 GHz in a single instrument and 70 kHz to 145 GHz in the Broadband configuration. Extendable to 1.1 THz
  • Universal Fixture Extraction (UFX) software option provides advanced de-embedding tools for test fixture extraction.
  • IMDView™ software coupled with the internal combiner option offers the ability to switch from S parameters to IMD measurements in a single connection
  • Highest performance pulse measurements— PulseView™ offers 2.5 ns pulse resolution with 100 dB dynamic range
  • 4-port single-ended or balanced measurements using DifferentialView™ analysis
  • Internal trace-based eye diagram option provides the ability to display Time Domain, S-Parameters, and Eye Diagram analysis with active sweep updates
  • Superior Dynamic Range - up to 142 dB
  • High available power - up to +14 dBm
  • Best test port characteristic performance - up to 50 dB in Directivity
  • Best time domain analysis
  • Fast and accurate optoelectronic measurements from 70 kHz to 40, 70 GHz and 110 GHz, at 850, 1060, 1310 and 1550 nm wavelengths, using MN4765B O/E Calibration module

The following are various published works that have utilized the VectorStar vector network analyzer to conduct their measurements. These papers are the property of their authors who have given Anritsu permission to post these.

3D Smith charts scattering parameters frequency-dependent orientation analysis and complex-scalar multi-parameter characterization applied to Peano reconfigurable vanadium dioxide inductors
Mueller, Andrei A. et al; nature.com Scientific Reports, 04 Dec 2019

A novel reconfigurable CMOS compatible Ka band bandstop structure using split-ring resonators and Vadandium Dioxide (VO2) phase change switches
Muller, Anrei A. et al; Infoscience EPFL scientific publications, 22 Aug 2019

Radio-Frequency Characteristics of Ge-Doped Vanadium Dioxide Thin Films with Increased Transition Temperature
Muller, Anrei A. et al; ACS Applied Electronic Materials, 16 Apr 2020

EduPack Bundle

Making Anritsu’s leading test and measurement solutions readily available to universities and R&D institutions ensures their engineering labs are equipped with the state-of-the-art resources they need to teach students and continue their ground-breaking research using the latest technologies. The Anritsu EduPack Bundle provides students, engineers, and researchers with just that – a modular, flexible solution that is customizable based on the unique needs of the institution. The bundle comes standard with a modular VectorStar™ MS4644B 40 GHz vector network analyzer, calibration kit, active measurement suite, and Cadence AWR lite software. From there, configure the bundle to meet your specific design needs by selecting from the various options available. Whether you are designing for 5G, antennas, material measurements, etc., the Anritsu EduPack Bundle can power your innovation with the industry’s leading technologies.

Anritsu EduPack Bundle Product Brochure

Universal Test Fixture

When developing any device on a microstrip or conventional coplanar waveguide (CPW) structure, the final product does not always end up with a connectorized interface. To test the device’s response at various frequencies, engineers often use a fixture like Anritsu’s Universal Test Fixture (UTF) to conduct measurements. This gives them a structure that provides a precise connection to the DUT when no input/output connectors are available and avoids substantial errors in measurement results due to improper soldering.

Anritsu’s 3680 series UTF are highly accurate and precise fixtures that provide a repeatable solution for measuring microstrip and CPW substrate devices. Input and output connections are made to the substrate device by two spring-loaded jaws that include coax-to-microstrip/CPW launchers. The jaws accommodate substrates from 0.13 to 1.9 mm in thickness.

Anritsu Universal Test Fixture EduPack Bundle Solutions Brief

Spectrum Master™ MS276xA Ultraportable Spectrum Analyzer (9 kHz to 44 GHz)

More often than not, a spectrum analyzer is an integral part of a test bench in an education/ R&D institute and is widely used in many applications. Bundle 2 incorporates a Spectrum Master MS276xA 44 GHz ultraportable spectrum analyzer to deliver best-in-class price/performance ratio unmatched by traditional benchtop instruments. Leveraging Anritsu’s patented NLTL technology, these high-performance solutions provide leading dynamic range, sweep speed, and amplitude accuracy, while their small size allows a direct connection to almost any DUT and eliminates the need for low loss, expensive cables. This enables customers to efficiently advance their technology development while reducing time-to-market.

When paired with the VectorStar MS4644B VNA, this combination is ideal for applications requiring intermodulation distortion (IMD), harmonics, on-wafer simultaneous S-parameters, and spectrum measurements. For 5G beamforming antennas (passive and active), the Spectrum Master MS276xA becomes a very useful tool as it can measure very low-level signals and, when combined with a directional antenna, be used as a reference signal measurement tool.

Anritsu Ultraportable Spectrum Analyzer EduPack Bundle Solutions Brief

Antenna Measurement System with MilliBox Anechoic Chamber

With continued 5G antenna research, especially in the 28 and 39 GHz frequencies, having a compact antenna testing solution is ideal for universities and R&D centers. While various parameters (e.g., return loss, polarization, radiation pattern, gain, E-H plane, 2D-3D patterns, etc.) are vital for antenna measurements, the most important are antenna radiation pattern measurements as these determine how effectively an antenna radiates in comparison to an isotropic antenna. This particular measurement requires a VNA, an anechoic chamber, and software. Bundle 3 includes a portable benchtop anechoic chamber and open source software from MilliBox, and equips universities and R&D labs with a complete, cost-effective antenna measurement system.

MilliBox offers a family of modular, compact, and affordable mmWave antenna test systems. Fully compatible with the VectorStar MS4644B VNA, these systems are tailored for applications between 18 GHz and 95 GHz, include various combinations of chambers and 3D positioners, and are easy to setup and take measurements. The positioner controller software is based on an open source Python script that communicates directly with the VectorStar VNA, enabling it to take the needed antenna radiation pattern measurements. Since the software is open source code, students, teachers, and researchers can modify and customize capabilities for antenna measurements on their own, which also provides students with another valuable opportunity to develop their real-world skill set (MilliBox will provide software support).

Anritsu Anechoic Chamber Measurement EduPack Bundle Solutions Brief

Options

ME7848A VectorStar ONA Configurations:

Model Description
ME7848A-0210 110 GHz 1550 nm system with O/E Calibration Module and E/O Converter (based on ME7838AX broadband VNA system)
ME7848A-0211 110 GHz 1310 nm system with O/E Calibration Module and E/O Converter (based on ME7838AX broadband VNA system)
ME7848E-0210 110 GHz 1550 nm system with O/E Calibration Module and E/O Converter (based on ME7838EX broadband VNA system)
ME7848E-0211 110 GHz 1310 nm system with O/E Calibration Module and E/O Converter (based on ME7838EX broadband VNA system)
ME7848A-0240 40 GHz, 850 nm system with O/E Calibration Module and E/O Converter (Requires Option 51, 61, or 62 (for MS4644B), sold separately)
ME7848A-0270 70 GHz, 1550 nm system with O/E Calibration Module and E/O Converter (Requires Option 51, 61, or 62 (for MS4647B), sold separately)
ME7848A-0271 70 GHz, 1310 nm system with O/E Calibration Module and E/O Converter (Requires Option 51, 61, or 62 (for MS4647B), sold separately)
ME7848A-0272 70 GHz, 1310/1550 nm system with O/E Calibration Module and E/O Converter (Requires Option 51, 61, or 62 (for MS4647B), sold separately)
ME7848A-0110 110 GHz 1550 nm system with O/E Calibration Module only (based on ME7838AX broadband VNA system)
ME7848A-0111
110 GHz 1310 nm system with O/E Calibration Module only (based on ME7838AX broadband VNA system)
ME7848A-0112
110 GHz 1310/1550 nm system with O/E Calibration Module only (based on ME7838AX broadband VNA system)
ME7848E-0110
110 GHz 1550 nm system with O/E Calibration Module only (based on ME7838EX broadband VNA system)
ME7848E-0111
110 GHz 1310 nm system with O/E Calibration Module only (based on ME7838EX broadband VNA system)
ME7848E-0112
110 GHz 1310/1550 nm system with O/E Calibration Module only (based on ME7838EX broadband VNA system)
ME7848A-0140
40 GHz, 850 nm system with O/E Calibration Module only (Requires Option 51, 61, or 62 (for MS4644B), sold separately)
ME7848A-0170
70 GHz, 1550 nm system with O/E Calibration Module only (Requires Option 51, 61, or 62 (for MS4647B), sold separately)
ME7848A-0171
70 GHz, 1310 nm system with O/E Calibration Module only (Requires Option 51, 61, or 62 (for MS4647B), sold separately)
ME7848A-0172
70 GHz, 1310/1550 nm system with O/E Calibration Module only (Requires Option 51, 61, or 62 (for MS4647B), sold separately)
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