Comprehensive test and evaluation solutions for every layer of AI data centers, supporting semiconductors through networks from R&D to mass production.
產品介紹
pdf 5.4 MB
2026/10/8
The Protection Adapters J1678A and J1679A are for protecting DUTs and measuring instruments against ESD/EOS and support high-reliability measurements.
傳單
pdf 611.5 KB
2026/9/9
Overview of data center interconnect technologies, from coherent pluggable optics and IP-over-DWDM to 800G, 1.6T, and advanced optical fibers.
傳單
pdf 337.3 KB
2026/9/8
With a built-in BERT (for Bit Error Rate measurements) and a sampling oscilloscope (for Eye pattern analysis) the All-in-one BERTWave MP2110A is optimized for manufacturing 100 GbE and 25 GbE optical modules.
The BERTWave MP2110A will improve optical module production efficiency and reduce manufacturing costs.
摺頁冊
pdf 5.5 MB
2026/8/21
BERTWave MP2110A 專為 100 GbE/25 GbE 光學模組的生產所設計，結合了誤碼分析儀 （誤碼率測試） 與取樣示波器（眼圖分析） 到單一機體內。其提高了光學模組的生產效率， 並有助於降低生產成本。
摺頁冊
pdf 6.3 MB
2026/8/21
BERTWave Series Remote Control Operation Manual
作業手冊
pdf 4.2 MB
Version: 29th Edition
2026/7/1
MP2110A BERTWave Operation Manual
作業手冊
pdf 15.3 MB
Version: 33rd Edition
2026/7/1
This document introduces three types of tests required for Co-Packaged Optics (CPO): electrical signals for Switch ASICs, optical signals for optical engines, and Ethernet signals for CPO Switches.
應用說明
pdf 935.5 KB
2026/5/20
Introducing Anritsu's measurement solutions for high-speed digital interfaces, optical transceivers, and transport networks.
產品介紹
pdf 3.7 MB
2026/5/18
Anritsu Electronic Measuring Instruments Catalog Condensed Version (Traditional Chinese)
目錄
pdf 2.9 MB
2026/4/20
The Anritsu MP2110A Option x8x is a 60 GHz bandwidth optical-channel sampling oscilloscope designed to evaluate
200G/lane optical signals. It supports PAM4 optical-signal measurements up to 120 Gbaud.
傳單
pdf 205.7 KB
2026/2/25
Anritsu Electronic Measuring Instruments Catalog Condensed Version
目錄
pdf 6.1 MB
Version: 2025
2026/1/14
This leaflet introduces testing solutions to enhance the efficiency of AI semiconductor R&D.
傳單
pdf 1.5 MB
2025/9/26
This document discusses the characteristics of instrument and components when measuring high-speed digital signals.
應用說明
pdf 1.8 MB
2025/8/26
Introduces Anritsu 5G solutions and products.
Anritsu will contribute to customer's 5G product development and future innovation of network.
摺頁冊
pdf 2.9 MB
2025/7/30
This article introduces high-precision measurement technology for data center interconnections.
文章
pdf 426.8 KB
2025/7/1
Electronic components of electronic devices and measurement devices break down when subjected to high voltages caused by electrostatic discharge (ESD).
This document explains the basic knowledge for eliminating ESD Failures.
應用說明
pdf 561.5 KB
2024/4/1
Anritsu’s 100G/lane test solution is configured using the Signal Quality Analyzer-R MP1900A sampling
oscilloscope and BERTWave MP2110A bit error tester. This solution supports TDECQ measurement in accordance
with the 400GbE-VR4 and SR4 850 nm multimode standards to facilitate efficient development and production of
optical devices.
傳單
pdf 377.0 KB
2023/7/26
To cut power consumption by data centers and computers, electrical wiring is being replaced by optical lines and interconnects using Photonics-Electronics convergence devices and Co-Packaged Optics (CPO) technologies.
Optical interconnects are expected to have applications in many fields, including optical transceivers in data centers, on-board communications, and high-performance computing (HPC).
Anritsu’s measurement solution for testing the CPO and its optical engine combines the company’s Bit Error Rate Tester MP1900A and Sampling Oscilloscope MP2110A.
傳單
pdf 196.9 KB
2023/6/14
Installing this option makes it easy to configure a versatile production line for testing both SMF and MMF
optical transceivers using Anritsu’s powerful all-in-one MP2110A.
傳單
pdf 296.4 KB
2022/6/8
