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VectorStar 寬頻向量網路分析儀 ME7838A/E/D

VectorStar 寬頻向量網路分析儀

ME7838A/E/D/G
The VectorStar ME7838x Series broadband VNA offers the widest available 2-port single frequency sweep from 70 kHz to 110, 125, 145, and 220 GHz with mmWave bands up to 1.1 THz
Overview

The VectorStar ME7838 broadband series system provides high performance in a compact mmWave module utilizing the Anritsu Nonlinear Transmission Line (NLTL) technology, with system coverage from 70 kHz to 110, 125, 145, and 220 GHz. The ME7838 series is the only broadband system with positive raw directivity in multiple bands. The result is better calibration and measurement stability with significantly longer time between calibrations for accurate measurements and improved productivity.

The VectorStar ME7838 VNA series delivers 109 dB dynamic range at 110 GHz, 102 dB at 220 GHz and excellent noise floor performance for high-sensitivity measurements across the entire sweep range. Stable broadband performance means you can make high-accuracy measurements all day, with the confidence that your calibration remains rock solid! Spend less time calibrating and more time measuring.

The VectorStar ME7838G VNA addresses the market need to conduct on-wafer measurements that span into the sub-Terahertz region for more accurate device characterization. The system offers unprecedented broadband coverage from 70 kHz to 220 GHz in a single sweep and is optimized for on-wafer measurements utilizing the TITAN T220 probe from MPI. An innovative design allows the 220 GHz probe to connect directly to the mmWave module for accurate, stable on-wafer measurements and avoiding the limits of threaded connectors.

VectorStar ME7838 系列寬頻向量網路分析儀提供最寬的單次掃描頻率範圍,從70 kHz 至 110 / 125 / 145 GHz,搭配毫米波 (mmWave) 模組可高達 1.1 THz

  • ME7838A 或 E 型號可輕鬆升級至 145 GHz
  • 全系列型號皆可配置毫米波模組,頻率高達 1.1 THz
  • 業界最佳校準與量測穩定度:0.1 dB vs 0.6 dB over 24 hrs.
  • All versions support the 3744x-Rx receiver for noise figure measurements, including the ability to characterize differential noise figure, to 125 GHz
  • 輕巧型毫米波 (mmWave) 模組 (0.6 lb vs 7+ lbs 與1/50的體積) 為低安裝成本的小型探針台

The following are various published works that have utilized the VectorStar vector network analyzer to conduct their measurements. These papers are the property of their authors who have given Anritsu permission to post these.

3D Smith charts scattering parameters frequency-dependent orientation analysis and complex-scalar multi-parameter characterization applied to Peano reconfigurable vanadium dioxide inductors
Mueller, Andrei A. et al; nature.com Scientific Reports, 04 Dec 2019

A novel reconfigurable CMOS compatible Ka band bandstop structure using split-ring resonators and Vadandium Dioxide (VO2) phase change switches
Muller, Anrei A. et al; Infoscience EPFL scientific publications, 22 Aug 2019

Radio-Frequency Characteristics of Ge-Doped Vanadium Dioxide Thin Films with Increased Transition Temperature
Muller, Anrei A. et al; ACS Applied Electronic Materials, 16 Apr 2020

Anritsu has partnered with the following industry-leading companies to provide a variety of proven material measurement capabilities that are compatible with the VectorStar and ShockLine vector network analyzer families.

Material Measurements

Compass Technology Group logo
Compass Technology
Choose from off-the-shelf or custom-designed RF material measurement systems able to measure material properties from 100 MHz to 90 GHz. These solutions include: focused beam, resonant cavity, waveguides, spot probes, free space measurement systems, and more.

Anritsu and Compass Technology Group Material Measurements Solutions
Compass Technology Group VectorStar Integration [video]
KEYCOM Characteristic Technologies logo
Keycom Technologies
Select from a variety of material measurement solutions that leverage various methods including: resonator, frequency change, probe type, co-axial tube and waveguide type S-parameter, free space, capacitance, epsilometery, and more.

Anritsu and Keycom Material Measurement Solution
Swiss to 12 logo
SWISSto12
Providing hardware and software technology capable of measuring: solid samples; soft sample and foam; liquid samples and powder; thin films; dielectric coatings and multilayer materials; alumina plate; and more.

Anritsu and SWISSto12 Material Measurement Solution
Options

Broadband VNA Configurations:

Model Description
ME7838A 70 kHz ~ 110 GHz (操作頻率 40 kHz ~ 125 GHz),寬頻向量網路分析儀,1 mm 同軸輸出
ME7838E 70 kHz ~ 110 GHz,寬頻向量網路分析儀,1 mm 同軸輸出
ME7838D 70 kHz ~ 145 GHz,寬頻向量網路分析儀,0.8 mm 同軸輸出
ME7838G 70 kHz ~ 220 GHz,寬頻向量網路分析儀,0.6 mm/G 輸出

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