To ensure good network performance, operators and technicians must verify PIM performance at both the 600 and 1900 MHz uplink frequencies when transmitting two 600 MHz tones. Testing outlined in this document shows that mitigating PIM issue on 600 MHz band does not guarantee the same for the 1900 MHz band. Testing PIM at both frequency bands is imperative in order to mitigate PIM issues in the field. P/N: 11410-01125
应用指南
pdf 1.5 MB
Version: A
2019/5/14
RF technologies are reaching into ever more areas of our lives and the RF spectrum at all frequencies is becoming more crowded. In addition to the spectrum demands of cellular systems sub-6 GHz for mobile applications, 5G radios are now being deployed at 28 GHz and 39 GHz. 5G radios are implementing new technologies including Active Antenna Systems that use beamforming to maximize range and efficiency. This is forcing changes to the way networks are tested, including a move toward over-the-air testing and use of test model waveforms. This eBrief will discuss how 5G Radios can be tested in a field environment and what measurements are important to ensure smooth integration with legacy networks. P/N: 11410-01130
应用指南
pdf 6.2 MB
Version: A
2019/4/30
5G mobile communications systems use multiple connections to meet the need for increases in mobile data traffic volumes as well as new functions such as ultra-low-latency.
3GPP determining the standards released the 5G NR non-standalone (NSA) specifications for making connections via multiple radio technologies, such as LTE, in Release 15 in June 2018.
Release 15 presumes the use of frequency bands up to 52.6 GHz and specifies the band from 450 MHz to 6 GHz as FR1 (Frequency Range 1), and from 24.25 GHz to 52.6 GHz as FR2 (Frequency Range 2). FR1 assumes use of the same wired tests as conventional wireless technologies whereas FR2 assumes OTA (Over the Air) testing.
This application note references the 3GPP TS38.104 and TS38.141 Conformance Test specifications, and introduces TRx test measurement examples for wired connections with sub-6 GHz base stations covering FR1 using the Signal Analyzer MS2850A and Vector Signal Generator MG3710A.
应用指南
pdf 1.6 MB
2019/4/18
Anritsu's Field Master Pro MS2090A spectrum analyzer and NEON Signal Mapper MA8100A are the ideal solution for anyone conducting coverage testing of RF and microwave communications systems, including 5G systems operating in both FR1 (<6 GHz) and FR2 (>6 GHz) bands and testing of indoor DAS systems. P/N: 11410-01123
应用指南
pdf 2.3 MB
Version: A
2019/3/26
Although the TRL family of calibration algorithms have been around for over 40 years, there are still questions sometimes regarding differences between the family members. This is partially due to differences in various implementations over the years. The purpose of this document is to discuss some of the differences in the context of vector network analyzers (VNAs). P/N: 11410-01124
应用指南
pdf 271.3 KB
Version: A
2019/3/26
This two page brief shows the challenges of today, and features the benefits of using VectorStar as a solution. P/N: 11410-00689
应用指南
pdf 743.8 KB
Version: C
2019/3/19
This Application Note focuses on the xRAN (implemented in O-RAN) network requirements and how to test them.
应用指南
pdf 906.1 KB
2019/3/6
This application note reviews frequency modulated continuous wave (FMCW) signal basics, discusses measurement challenges and solutions, and shows how the Spectrum Master MS2760A Ultraportable Spectrum Analyzer can conduct basic FMCW radar testing. P/N: 11410-01095
应用指南
pdf 3.2 MB
Version: A
2018/12/18
The ideal combination for indoor and outdoor, multi-frequency radio coverage mapping measurements. This application note explains how to build and use a radio frequency coverage mapping test system utilizing Anritsu's Remote Spectrum Monitor MS27101A, Vision MX280001A software, and NEON Signal Mapper MA8100A solutions. P/N: 11410-01096
应用指南
pdf 1.8 MB
Version: B
2018/12/5
In recent years, numerous improvements have been made in noise figure measurements through better algorithmic understanding of the measurements (e.g., [1]-[6]), more sensitive receivers, and less error-prone methods of processing noise power measurements. Anritsu has incorporated a number of these improvements in the single-ended Noise Figure Measurement Option of the VectorStar vector network analyzer (VNA) platform.
This application note offers insights in to and examples of performing differential noise figure measurements. P/N: 11410-01094
应用指南
pdf 2.8 MB
Version: A
2018/12/4
Vector network analyzers (VNAs) are used to measure the performance of a wide variety of passive and active RF and microwave devices. Passive devices can be less demanding to test than active devices, thus requiring less performance from the VNA. However, one interesting exception to this is the measurement of very low insertion loss passive components such as precision adapters or airlines. These types of devices can present a difficult challenge to characterize because of the desire for very low uncertainties on these small insertion losses. This application note talks about these challenges and provides a helpful technique. P/N: 11410-01090
应用指南
pdf 975.1 KB
Version: A
2018/9/25
PIM over CPRI is Anritsu's new patented technology that enables users to make PIM measurements on a live system at ground level by monitoring regular LTE traffic carried by an optical fiber connection. By tapping into the CPRI data on the downlink and uplink between the remote radio head (RRH) and baseband unit (BBU), the BTS Master MT8220T base station analyzer can calculate the PIM desensitization of the LTE uplink. P/N: 11410-01078
应用指南
pdf 3.0 MB
Version: A
2018/8/21
This document describes the configuration and characteristics of the 5G mobile network and its measurement.
应用指南
pdf 585.9 KB
2018/7/17
This article outlines Anritsu’s PCI-Express Gen4 RX Test Solution, test procedures, and precautions.
应用指南
pdf 2.0 MB
2018/6/13
The recent improvement to semiconductor device performance has seen bit rates of 28 Gbps become commonplace. As a result, accurate evaluation of device characteristics requires testing by injecting multiple types of jitter on the device under test (DUT). This Application Note explains each type of jitter, gives some guidance about measurements for complex jitter tests, and describes some concrete examples of jitter tolerance measurements using the Anritsu MP1900A.
应用指南
pdf 1.1 MB
2018/4/17
The purpose of an in-building wireless (IBW) system is to provide enhanced network coverage
and/or capacity when the existing macro network is not able to adequately service the
demand. Coverage may be poor due to high penetration losses caused by the building
structure or due to low emissivity glass installed to improve the thermal performance of the building. In dense urban environments, adjacent buildings may create an RF barrier that blocks coverage from nearby macro sites. Tall buildings typically have poor coverage on
upper floors since macro site antennas, many floors below, are specifically designed to
suppress energy radiating above the horizon. Capacity may be an issue in venues such as
stadiums, coliseums and convention centers where many thousands of users may be trying to
simultaneously access the network.
应用指南
pdf 1.8 MB
Version: C
2018/3/28
This application note explains how to upgrade the MT8870A firmware. The firmware is upgraded using the MX887900A Utility Tool. The Utility Tool is supplied on the DVD and must be installed separately from the main CombiView installation.
应用指南
pdf 682.5 KB
2018/3/22
Instead of transferring 1 bit information using two values of 1 or 0 in one time slot like NRZ, the PAM4 signal transfers 2 bits information using four values in one time slot.
Although PAM has dual advantages of aintaining the signal bit rate while increasing the data transfer capacity it has the disadvantage of
simultaneously minimizing voltage level differences for each signal in one time slot,
causing a degraded signal to noise ratio (SNR).
This Application Note explains generation of PAM signals with the above characteristics
as well as the relative BER measurement method.
应用指南
pdf 1.7 MB
2018/2/20
As fiber and free-space optical communication bandwidths increase, the need for very high speed optical
modulators and detectors has also increased. The frequency response characterization of these electrical-to optical
(E/O, modulators sometimes integrated with lasers) and optical-to-electrical (O/E, photo detectors and receivers) converters can be important in terms of such parameters as bandwidth, flatness, phase linearity and
group delay.
应用指南
pdf 5.8 MB
Version: D
2018/2/6
This paper presents an accurate, flexible and cost-effective technique to conduct electro-optical testing on fiber optic components, such as laser modulators and photodiodes, using VNAs. The simplicity of Anritsu’s MN4765B O/E calibration modules allows highly accurate, vector-error-corrected and stable measurements with the full line of Anritsu VNAs.
应用指南
pdf 646.0 KB
Version: B
2018/2/6
技术
