VectorStar 系列射频、微波、毫米波矢量网络分析仪 MS4640B 系列

VectorStar 家族：射频、微波、毫米波矢量网络分析仪

MS4640B Series

索取报价

下载

概述
选件
软件
资料库

Overview

描述
特征
Users Site
Published Content
Third Party Solutions

VectorStar™ 系列是 Anritsu 的高级矢量网络分析仪系列，在现代化工作平台上提供最出色的整体性能。 MS4640B VectorStar 矢量网络分析仪在单台仪器中提供 70 kHz 到 70 GHz 的最宽频率覆盖范围。 70 GHz 的最高频率固然令人赞叹，但低频端额外带来的二十倍频程更令人激动。

IMDView™ 提供了灵活的菜单栏，修改关键的IMD参数时，可显示实时测量。内部组合选件提供有源器件的单个连接测试，可在S参数和IMD测量之间自动切换，而无需重新连接DUT。

PulseView™ 脉冲测量功能, 结合创新式 IF 数字化选项，能够提供业界领先的 2.5 ns 脉冲分辨率和 100 dB 动态范围，对于不同的占空比，不需要妥协或平衡性能使用。 PulseView 能够提供脉冲测量的实时显示，且能够同时动态地修改脉冲参数,以及时的验证设计指标。

DifferentialView™ 差分选件, 结合内部双源选项，能够提供差分设备、器件和组件的实时显示分析，且同时能够自动地修改内部双源的相位和幅度关系。

噪音系数测量选项以冷源技术为基础，能够提高噪音系数测量精度。 VectorStar 是仅有的一款能够测量 70 kHz 到 125 GHz 噪音系数的矢量网络分析仪，且配有 30 GHz 到 125 GHz 测量所用的优化噪音接收器。 Additionally, VectorStar is the only VNA that offers a Differential Noise Figure option for characterizing the noise figure of differential devices.

在宽带应用中，ME7838 系列通过一个同轴测试端口就能提供跨距为 70 kHz 到 110 GHz，125 GHz 和 145 GHz 的卓越性能和频率覆盖范围。 Anritsu 所开发的非线性传输线技术的 mmWave 模块，采用紧凑型设计，且同时能够提供高达 145 GHz 高性能。

Anritsu MS4640B 矢量网络分析仪提供了更高水平的性能，能够帮助器件建模工程师实现精确可靠的器件建模；帮助 R&D 工程师尽量扩大其产品设计动态范围，以研发出最先进的设备；帮助制造工程师在保证精准度的情况下最大程度地提高其生产测试效率。标配的 3 年保修，再加上响应迅速的销售支持队伍，MS4640B 矢量网络分析仪定会成为工程师的明智选择。

业界最宽的频率跨度:单台仪器的单一同轴测试端口可覆盖 70 kHz ~ 70 GHz频率范围，宽带系统配置频率覆盖 70 kHz ~ 145 GHz。可扩展至 1.1 THz

IMDView™ 软件加上内部组合选件可实现在单个连接中从S参数切换到IMD测量的能力

最高性能的脉冲测量 —PulseView™ 提供 2.5 ns 脉冲分辨率和 100 dB 动态范围

4 端口单端或平衡测量，使用 DifferentialView™ 差分分析功能

内部基于跟踪的眼图选件提供了显示时域、S参数和眼图的功能，能够主动进行扫描更新

卓越的动态范围 - 最高达 142 dB

高输出功率 - 最高达 +14 dBm

最佳测试端口性能 - 方向性高达 50 dB

最佳时域分析

快速精确的光电测量，从 70 kHz 到 70 GHz 和 110 GHz，1310和1550 nm波长，使用 MN4765B O/E 校准模块。

VectorStar Users Site

The VectorStar Users Site is a location where you can obtain Software, O/S Patches, and needed Utilities for your VectorStar instruments.

The following are various published works that have utilized the VectorStar vector network analyzer to conduct their measurements. These papers are the property of their authors who have given Anritsu permission to post these.

3D Smith charts scattering parameters frequency-dependent orientation analysis and complex-scalar multi-parameter characterization applied to Peano reconfigurable vanadium dioxide inductors
Mueller, Andrei A. et al; nature.com Scientific Reports, 04 Dec 2019

A novel reconfigurable CMOS compatible Ka band bandstop structure using split-ring resonators and Vadandium Dioxide (VO2) phase change switches
Muller, Anrei A. et al; Infoscience EPFL scientific publications, 22 Aug 2019

Radio-Frequency Characteristics of Ge-Doped Vanadium Dioxide Thin Films with Increased Transition Temperature
Muller, Anrei A. et al; ACS Applied Electronic Materials, 16 Apr 2020

Anritsu has partnered with the following industry-leading companies to provide a variety of proven material measurement capabilities that are compatible with the VectorStar and ShockLine vector network analyzer families.

Material Measurements

	Compass Technology Choose from off-the-shelf or custom-designed RF material measurement systems able to measure material properties from 100 MHz to 90 GHz. These solutions include: focused beam, resonant cavity, waveguides, spot probes, free space measurement systems, and more. Anritsu and Compass Technology Group Material Measurements Solutions Compass Technology Group VectorStar Integration [video]
	Keycom Technologies Select from a variety of material measurement solutions that leverage various methods including: resonator, frequency change, probe type, co-axial tube and waveguide type S-parameter, free space, capacitance, epsilometery, and more. Anritsu and Keycom Material Measurement Solution
	SWISSto12 Providing hardware and software technology capable of measuring: solid samples; soft sample and foam; liquid samples and powder; thin films; dielectric coatings and multilayer materials; alumina plate; and more. Anritsu and SWISSto12 Material Measurement Solution

选件

主要配置项：

MS4642B	VNA，10 MHz ~ 20 GHz，双端口，K型（阳头）
MS4644B	VNA，10 MHz ~ 40 GHz，双端口，K型（阳头）
MS4647B	VNA，10 MHz ~ 70 GHz，双端口，V型（阳头）
选件 001	机架固定件
选件 002	具备高级功能的时域分析选件
选件 007	接收器配置测量选件，具备多源控制功能，能够对频率转换器件测量
选件 031	第二源
选件 032	内部组合器
选件 035	IF 数字化仪
选件 036	扩展内存 (必须与选件35一同购买)
选件 041	噪音系数
选件 042	脉冲测量
选件 043	差分测量
选件 044	IMDView™
选件 046	快速连续波
选件 047	眼图
选件 048	Differential Noise Figure
选件 053	External ALC leveling
选件 05x	直接访问环路，能够整体提高测量的灵活性
选件 06x	有源测量套件, 包含 2 只或 4 只衰减器
选件 070	70 kHz 低端频率扩展，提供前所未有的低频频率覆盖范围
选件 08x	宽带/毫米波接口
MN469xC	4 端口测量组件，K 和 V 型 40 MHz ~ 70 GHz 多端口解决方案
MN4765B	Optical VNA measurements O/E Calibration Module. Options available for 40, 70 GHz and 110 GHz, at 850, 1060, 1310, and 1550 nm wavelengths

相关链接

资料库

产品手册

产品手册	发布日期
Anritsu's RF and Microwave Test and Measurement Solutions Product Brochure	2023/6/5
VectorStar E and W Band Millimeter-Wave VNA System Quick Fact Sheet	2023/2/21
Vector Network Analysis Product Portfolio	2022/12/19
VectorStar MS4640B Series Product Brochure	2022/8/9
Anritsu and Polar Instrument Solution for Delta-L 4.0 Measurement Based on Atlas SI Software with Anritsu 4-Port Benchtop VNAs Solution Flyer	2022/5/11
VNA Fundamentals Poster	2021/4/30
Anritsu Ultraportable Spectrum Analyzer EduPack Bundle Solutions Brief	2020/12/4
Anritsu Universal Test Fixture EduPack Bundle Solutions Brief	2020/12/4
Anritsu Anechoic Chamber Measurement EduPack Bundle Solutions Brief	2020/12/4
Anritsu EduPack Bundle Product Brochure	2020/12/4

技术指标

技术指标	发布日期
UK VectorStar (Microwave Vector Network Analyzer) Declaration of Conformity	2023/8/21
EU VectorStar (Microwave Vector Network Analyzer) Declaration of Conformity	2023/6/22
VectorStar MS464xB Series Microwave Vector Network Analyzer Technical Data Sheet	2023/4/11
Multiport VectorStar MN469xC Technical Data Sheet	2023/4/11
VectorStar MS464xB Product Information, Compliance, and Safety	2022/8/9

应用指南

应用指南	发布日期
Configuring IC-CAP 2020 for VectorStar Operation	2023/2/21
Offline Split 2x-Thru Touchstone File to Two 1x-Thru Using Equation Editor in ShockLine Vector Network Analyzer Application Note	2022/5/11
Accessing 43.5 GHz Measurements with Traceability Application Note	2020/6/30
Material Measurements with Vector Network Analyzers Application Note	2020/5/26
On-Wafer Biasing Using Anritsu Kelvin Bias Tees on VectorStar ME7838x Broadband Systems Application Note	2020/2/12
Electro-Optical Measurements Using Anritsu VNAs	2020/1/24
Generating Eye Diagrams in VectorStar VNAs Including PAM-4	2019/6/21
Distinction Between TRL and LRL	2019/3/26
Performing Differential Noise Figure Measurements Application Note	2018/12/4
Technique for Improving Low Insertion Loss VNA Measurements Application Note	2018/9/25
Electrical-to-Optical and Optical-to-Electrical (E/O and O/E) converter measurements	2018/2/6
Understanding Vector Network Analysis Application Note	2017/7/27
De-embedding and Network Extraction	2017/5/24
LRL-LRM Calibration Theory and Methodology Application Note	2017/3/21
Vector Network Analyzer Use in Antenna Measurement Systems	2016/10/25
VNA Signal Integrity Measurement Challenges Application Brief	2016/9/12
IMD Measurements Using Dual Source and Multiple Source Control Application Note	2015/5/27
IMD Measurements with IMDView Application Note	2015/5/18
NxN Measurements using VectorStar Application Note	2015/3/6
Externally Synchronized VNA Measurements Application Note	2014/12/4
Mixer Measurements utilizing the Mixer Setup Application and Dual Sources on VectorStar VNAs Application Note	2014/10/29
Creating Eye Diagrams using VectorStar SnP files and AWR Microwave Office Application Note	2014/9/22
True Mode Stimulus Measurements Application Note	2014/9/18
On making corrected measurements of multipliers	2014/9/15
Understanding PulseView Measurements Application Note	2014/4/11
PulseView Calibrations	2014/3/3
Pulse Measurements Application Note	2013/8/19
Time Domain Measurements Using Vector Network Analyzers Application Note	2013/8/19
Radar Pulse Measurement Application Brief	2013/8/19
Passive Components Test Application Brief	2013/8/19

传单

传单	发布日期
VectorStar VNA Spectrum Analyzer Option 49 Application Flyer	2022/8/9
Anritsu and Compass Technology Group Material Measurements Solution	2022/1/27
Anritsu and SWISSto12 Material Measurements Solution	2022/1/27
Anritsu and Keycom Material Measurement Solution	2022/1/27
Anritsu, Diamond Engineering, and Diamond Microwave Chambers Antenna Measurement Solution	2020/8/26
Anritsu Vector Network Analyzers — The Perfect Tool for Electro-Optical Measurements	2018/2/6

白皮书

白皮书	发布日期
Total Harmonic Distortion (THD) Measurements White Paper	2023/8/30
Superposition vs. True-Balanced: What's Required for your Signal Integrity Application White Paper	2018/8/23
Millimeter-wave Partial Information De-embedding: Errors and Sensitivities White Paper	2018/8/23
Wideband Optical Modulator and Detector Characterization	2018/2/6
Sequential Peeling: a Model-Based Approach to Structure Identification and De-embedding	2017/6/6
Scaling the Test Equipment Size to Match Millimeter Wave Test Needs	2017/2/14
Modern Architecture Advances Vector Network Analyzer Performance White Paper	2016/11/8
A Guide to Making RF Measurements for Signal Integrity Applications	2016/10/31
Optimizing Your Millimeter-Wave Test Capability White Paper	2016/10/10
Measuring Channel Operating Margin	2016/10/10
PAM4 Demands Accurate S-parameters White Paper	2016/9/19
Using VNA’s as a Tool for Signal Integrity in High Speed Digital Systems White Paper	2016/5/3
Pulse-to-Pulse Stability Measurements White Paper	2014/10/29
Technologies and Approaches for Improved Mixer Measurements White Paper	2014/9/15
Open-ended Coaxial Probe for Permittivity Measurements to 125 GHz White Paper	2014/9/15
Overcoming High-Speed Interconnect Challenges White Paper	2013/8/19
Higher Data Rates Require New De-embedding Techniques White Paper	2013/8/19
Signal Integrity- Frequency Range Matters	2013/8/19

综合产品手册

综合产品手册	发布日期
Electronic Measuring Instruments Digest 2023	2023/3/23
Precision RF & Microwave Components Catalog	2022/7/26

快速参考指南

快速参考指南	发布日期
VectorStar Broadband/Banded Millimeter-Wave Module Reference Manual	2022/8/9
365xx-x Mechanical Calibration Kits Reference Manual	2022/8/9
3655x Waveguide Calibration Kit Coefficients	2014/7/29

快速启动指南

快速启动指南	发布日期
366xX-1 Verification Kits and 3-2300-527 (67688) Performance Verification Software for VectorStar MS4640B Series VNAs	2017/10/4
VectorStar MN4690C Series Multiport VNA Test Set Quick Start Guide	2017/7/14
VectorStar 2300-531-R MS464x Instrument Test Software Quick Start Guide	2016/9/8
VectorStar MN4690B Series Multiport VNA Test Set Quick Start Guide	2009/10/21

操作手册

操作手册	发布日期
VectorStar MS464xB Operation Manual	2022/8/9

用户手册

用户手册	发布日期
366xX-1 Verification Kits and 2300-579-R Performance Verification Software Application	2022/8/9
VectorStar MS464xB Series User Interface Reference Manual	2022/8/9
3659 0.8 mm Calibration/Verification Kit and 2300-580-R System Performance Verification Software User Guide	2021/2/8
3656B W1 Calibration/Verification Kit and 2300-584-R System Performance Verification Software User Guide	2019/8/29

测量指南

测量指南	发布日期
VectorStar MS464xB Series Calibration and Measurement Guide	2022/10/4

说明文件

说明文件	发布日期
Connector Care Instruction Sheet	2019/10/8

安装指南

安装指南	发布日期
VectorStar ME7838A4 Multiport Broadband VNA Installation Guide	2021/9/14
Multiport VectorStar MN4690C Installation Guide	2017/7/14
VectorStar Pulse Modulator Test Set SM66xx Installation Guide	2017/2/8
Multiport VectorStar MN4690B Installation Guide	2010/7/14

在线帮助系统

在线帮助系统	发布日期
VectorStar MS464xB Help	2022/8/9

编程手册

编程手册	发布日期
VectorStar MS464xB Programming Manual	2022/8/9
VectorStar MS464xB Programming Manual Supplement	2016/9/30

维护手册

维护手册	发布日期
VectorStar MS464xB Maintenance Manual	2022/8/9
VectorStar MN469xC Series Multiport Test Set Maintenance Manual	2021/9/14
Precision AutoCal 36585 Series Reference Manual	2015/5/27
VectorStar® MN4690B Series Multiport Test Set	2011/11/16

文章

文章	发布日期
VNA Eases On-Wafer Measurements to 110GHz	2011/10/5

图像

视频

需要报价

获取技术支持

购买