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4-Channel x 12.5G Error Detector

MP1776A
此产品已停产 替换型号: MP1800A
Overview
DATE OF DISCONTINUANCE: July 2006

Simultaneous and Parallel BER Measurements up to 12.5 Gbps per Channel


The MP1776A is an Error Detector with the capability of housing up to 4 error detector units that enable simultaneous or independent BER testing from 100 Mbps to 12.5 Gbps.


Its unique design offers the flexibility of operating in a single channel, 2-channel, or 4-channel combined mode. Operation in combined mode is especially useful when testing 1:2 or 1:4 DEMUX units and is performed very effectively. For example, when the MP1776A is in the 4-channel combined mode, relationships are made between the channels to treat all 4 channels as a single rate data input (4 times the data rate of one channel).


Each channel has the capability of measuring BER up to 12.5 Gbps. Simultaneous BER testing and analysis up to 4 channels is possible when used with the MP1775A 4-channel Pulse Pattern Generator. Depending on its operating mode, the MP1776A supports different sizes of programmable patterns for specific testing, a variety of PRBS patterns up to 231-1, Zero Substitution patterns up to 215, and Consecutive Zero patterns.


Anritsu's core competence and expertise in high speed BER testing and the high performance technology of our popular single channel 12.5 Gbps BERT system is built into this MP1776A 4-channel Error Detector. Its error insertion and fast synchronization methods make it an ideal BER analyzer for the evaluation and characterization of 10 Gbps WDM equipment, modules, and electrical/optical devices.


To protect your future investments in 40G development, the MP1776A 4-Channel Error Detector can be used as part of Anritsu’s ME7760B 43.5G BER Test System or ME7780A 48B BER Test System. With the ongoing R&D into 40+ Gbps transmission systems, there is a high demand for instruments for testing SONET/SDH frames. To meet this requirement, Anritsu's MX177601A software is optionally available for use with the MP1776A for analyzing SONET/SDH frames as well as CID patterns for stress testing clock recovery circuits.


MP1776A operation is simple because the platform is based on Microsoft Windows with an intuitive GUI, large color LCD, mouse, and touch screen in addition to a rotary encoder and front panel keys. Remote control operation utilizing SCPI command sets is also available via GPIB or a parallel interface.

  • 4-channel parallel data input from 100 Mbps to 12.5 Gbps
  • Supports measurements up to 50 Gbps based on the total bit rate of 4 channels in combined mode
  • Three operating modes: Independent, 2-Channel Combined, and 4-Channel Combined modes
  • Independent adjustments for each of the 4 channels
  • Configurable with 1, 2, 3, or 4 Error Detector units
  • Supports Programmable Patterns, PRBS Patterns, Zero Substitution Patterns, and Consecutive Zero Patterns
  • Burst data BER measurement for optical circulating loop tests
  • Independent or simultaneous BER testing/analysis up to 4 channels using the MP1775A 4-channel Pulse Pattern Generator
  • Testing of SONET/SDH frames up to OC-768c/STM-256c and CID patterns with MX177601A software
  • Higher rate BER testing 25 Gbps to 43.5 Gbps when used in ME7760B BER Test System, or up to 48 Gbps with ME7780A 48B BER Test System
  • Excellent operability with touch screen, mouse, keypad, rotary encoder, and eeyboard
  • Easy-to-use Windows intuitive GUI
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