This two page brief shows the challenges of today, and features the benefits of using VectorStar as a solution. P/N: 11410-00689
This Application Note focuses on the xRAN (implemented in O-RAN) network requirements and how to test them.
This application note reviews frequency modulated continuous wave (FMCW) signal basics, discusses measurement challenges and solutions, and shows how the Spectrum Master MS2760A Ultraportable Spectrum Analyzer can conduct basic FMCW radar testing. P/N: 11410-01095
The ideal combination for indoor and outdoor, multi-frequency radio coverage mapping measurements. This application note explains how to build and use a radio frequency coverage mapping test system utilizing Anritsu's Remote Spectrum Monitor MS27101A, Vision MX280001A software, and NEON Signal Mapper MA8100A solutions. P/N: 11410-01096
In recent years, numerous improvements have been made in noise figure measurements through better algorithmic understanding of the measurements (e.g., -), more sensitive receivers, and less error-prone methods of processing noise power measurements. Anritsu has incorporated a number of these improvements in the single-ended Noise Figure Measurement Option of the VectorStar vector network analyzer (VNA) platform.
This application note offers insights in to and examples of performing differential noise figure measurements. P/N: 11410-01094
Vector network analyzers (VNAs) are used to measure the performance of a wide variety of passive and active RF and microwave devices. Passive devices can be less demanding to test than active devices, thus requiring less performance from the VNA. However, one interesting exception to this is the measurement of very low insertion loss passive components such as precision adapters or airlines. These types of devices can present a difficult challenge to characterize because of the desire for very low uncertainties on these small insertion losses. This application note talks about these challenges and provides a helpful technique. P/N: 11410-01090
PIM over CPRI is Anritsu's new patented technology that enables users to make PIM measurements on a live system at ground level by monitoring regular LTE traffic carried by an optical fiber connection. By tapping into the CPRI data on the downlink and uplink between the remote radio head (RRH) and baseband unit (BBU), the BTS Master MT8220T base station analyzer can calculate the PIM desensitization of the LTE uplink. P/N: 11410-01078
This document describes the configuration and characteristics of the 5G mobile network and its measurement.
This article outlines Anritsu’s PCI-Express Gen4 RX Test Solution, test procedures, and precautions.
The recent improvement to semiconductor device performance has seen bit rates of 28 Gbps become commonplace. As a result, accurate evaluation of device characteristics requires testing by injecting multiple types of jitter on the device under test (DUT). This Application Note explains each type of jitter, gives some guidance about measurements for complex jitter tests, and describes some concrete examples of jitter tolerance measurements using the Anritsu MP1900A.
The purpose of an in-building wireless (IBW) system is to provide enhanced network coverage
and/or capacity when the existing macro network is not able to adequately service the
demand. Coverage may be poor due to high penetration losses caused by the building
structure or due to low emissivity glass installed to improve the thermal performance of the building. In dense urban environments, adjacent buildings may create an RF barrier that blocks coverage from nearby macro sites. Tall buildings typically have poor coverage on
upper floors since macro site antennas, many floors below, are specifically designed to
suppress energy radiating above the horizon. Capacity may be an issue in venues such as
stadiums, coliseums and convention centers where many thousands of users may be trying to
simultaneously access the network.
This application note explains how to upgrade the MT8870A firmware. The firmware is upgraded using the MX887900A Utility Tool. The Utility Tool is supplied on the DVD and must be installed separately from the main CombiView installation.
Instead of transferring 1 bit information using two values of 1 or 0 in one time slot like NRZ, the PAM4 signal transfers 2 bits information using four values in one time slot.
Although PAM has dual advantages of aintaining the signal bit rate while increasing the data transfer capacity it has the disadvantage of
simultaneously minimizing voltage level differences for each signal in one time slot,
causing a degraded signal to noise ratio (SNR).
This Application Note explains generation of PAM signals with the above characteristics
as well as the relative BER measurement method.
As fiber and free-space optical communication bandwidths increase, the need for very high speed optical
modulators and detectors has also increased. The frequency response characterization of these electrical-to optical
(E/O, modulators sometimes integrated with lasers) and optical-to-electrical (O/E, photo detectors and receivers) converters can be important in terms of such parameters as bandwidth, flatness, phase linearity and
This paper presents an accurate, flexible and cost-effective technique to conduct electro-optical testing on fiber optic components, such as laser modulators and photodiodes, using VNAs. The simplicity of Anritsu’s MN4765B O/E calibration modules allows highly accurate, vector-error-corrected and stable measurements with the full line of Anritsu VNAs.
This note describes how the Network Master Pro Auto Discovery feature discovers other remote Network Master Pro units on the network, and use of the In-Band Control feature to control and adjust discovered remote units.
This Application Note explains how to cut development and manufacturing time and costs by combining the Signal Analyzer MS2850A with a dedicated data-transfer interface for high-speed transfer of large amounts of digitized data captured over long time periods. It also explains the excellent performance of the MS2850A as a single port digitizer for RF / microwave signals.
It is becoming increasingly important to complete testing on the OTN (Optical Transport Network) at different layers and levels to ensure the underlying transport layer is performing correctly. This is necessary to ensure upper layers can transport their payload without causing any network errors.
As modern operators move OTN closer to customers, all ODU (Optical channel Data Unit) layers must be tested to ensure the circuit delivers or exceeds “five 9s” performance.
As operators migrate from legacy (SDH/SONET/PDH/DSn) networks to the current or future (10 GigE/1 GigE, MPLS-TP/PBB-TE) networks, today's test equipment must be able to test OTN (Optical Transport Network) as well as legacy and future networks running over OTN. Operators’ Metro to Core networks are evolving and must support all technologies both future and legacy. Testing these networks must confirm the "five 9s" performance on the OTN layer as well as from the Access to Core network—the focus of this Application Note.
Until recently, one of the only options available to engineers for making spectrum analysis measurements at mmWave frequencies required using external harmonic mixers to downconvert signals into frequency ranges of available spectrum analyzers. These mixers can produce artifacts, making it difficult to distinguish between the behavior of the device under test (DUT) and the mixer. These artifacts can also add erroneous power to the signal, impacting the measurement. This is in addition to the already reduced amplitude
sensitivity, frequency accuracy/stability, and the increased cost of adding the mixer.
The Spectrum Master MS2760A does not use harmonic mixers in order to reach the required frequencies. By utilizing Anritsu's patented non-linear transmission line (NLTL) technology, it is capable of performing
single sweep coverage from 9 kHz up to 110 GHz (model dependent). As a result, the Spectrum Master MS2760A provides a cleaner response in the mmWave bands.