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ETRI Selects Anritsu VectorStar™ ME7838G for High-Frequency Evaluation Platform for GaN MMICs

10/09/2026

September 10, 2026 - ANRITSU CORPORATION is pleased to announce that the Electronics and Telecommunications Research Institute (ETRI), one of Korea’s leading research institutes, has selected Anritsu’s Broadband Vector Network Analyzer (VNA) VectorStar™ ME7838G for the characterization and design verification of high-frequency devices using GaN MMICs. By deploying the ME7838G, ETRI has established an evaluation platform for millimeter-wave and sub-THz applications, improving measurement reproducibility and enabling reliable design verification.

As next-generation communications technologies advance, device evaluation is expanding into millimeter-wave and sub-THz frequency ranges. To improve design accuracy and performance prediction for GaN MMIC-based device development, ETRI conducts broadband characterization that covers not only the operating frequency band but also harmonic frequency ranges. On-wafer measurements, which evaluate device characteristics directly on the wafer while excluding the effects of packaging and mounting, are widely used for this purpose. However, in millimeter-wave and sub-THz on-wafer measurements, probe contact conditions and measurement-system effects can easily cause measurement variation, making it a challenge to establish an evaluation platform that enables highly reliable comparison and verification between design and measured data.

To address these challenges, ETRI deployed the ME7838G. The ME7838G supports single-sweep measurements up to 220 GHz and enables evaluation from millimeter-wave to sub-THz frequencies on a single platform. Since broadband evaluation can be performed using a single measurement system, ETRI established an on-wafer evaluation platform that enables measurements from millimeter-wave to sub-THz frequencies under consistent test conditions, without switching measurement systems between frequency bands. This provided an environment in which measurement data acquired across a wide bandwidth could be compared with and analyzed against design data under consistent conditions and with a high degree of accuracy.

Anritsu recognizes that measurement technologies that combine broadband characterization with high measurement reproducibility will become increasingly important for high-frequency device development for 6G and next-generation satellite communications. Anritsu will continue to support customers’ semiconductor research, development, and evaluation through its test and measurement technologies.

Further details of this case study are available in PDF format on the Anritsu website.
“Establishing a High-Frequency Evaluation Platform to Support Foundry-Grade Quality”
This case study describes how the high-frequency evaluation platform established by ETRI contributes to improving design verification and performance prediction accuracy for GaN MMICs.

About Electronics and Telecommunications Research Institute (ETRI)
ETRI is one of Korea’s leading research institutes in the fields of information and communications technology, electronics, and semiconductors. The institute promotes research and development in next-generation communications technologies, including 6G, as well as advanced semiconductor technologies.

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