Anritsu Displaying Test Solutions that Support Development of Next-Generation 40G/100G Networks at ECOC
MP1800A Signal Quality Analyzers Offer Signal Generation/Analysis Up to 56 Gbps to Measure BER of Optical Modulation Devices and 10G/40G/100G Optical/Digital Devices
Vienna, Austria - September 21, 2009 - Anritsu Corporation (Hall Z Booth 662) announces it will be displaying its new 56 Gbit/s MUX/DEMUX modules for its MP1800 Signal Quality Analyzers at ECOC 2009. The new modules are part of Anritsu’s expanding measurement portfolio that meets the stringent demands of testing technologies developed for next-generation communications networks.
Engineered for both cost-conscious manufacturing and advanced R&D, the MP1800 Series is the most flexible test instrument in its class. The options enable large parallel configurations with new MUX/DEMUX modules that provide a design solution for 10G/20G/40G/100G applications. The MP1800A, when equipped with the modules, accurately evaluates next-generation IFs that support operation frequencies up to 56 Gbit/s. Incorporating I and Q signal dynamic skew control, the configuration can measure DQPSK modulators.
Internet Exchanges (IX) and ISPs require larger network capacities, as more Internet users access more rich-content services over faster access networks such as DSL, LTE, WiMax, and FTTx. To meet these needs, IEEE, ITU-T, and OIF are defining new standards for next-generation 40G and 100G networks. To overcome the price/performance issue that has slowed 40G network deployment, these new standards use WDM transmission equipment and phase-modulation technologies to implement more robust and easier-to-maintain transmission, even with looming higher symbol rates.
With many equipment vendors focusing to meet these needs, the MP1821A 50G/56Gbit/s MUX and MP1822A 50G/56Gbit/s DEMUX are essential tools to help development teams assess quality of transmission, and verify performance of next-generation components and devices.
Covering bit rates from 8 Gbps to 56 Gbps, the new MUX and DEMUX units have been developed to help designers bring products to market in the fastest possible time. They have been designed to reduce the usual complexity and issues faced by engineers when testing very high bit rates in the R&D laboratory.
These new MUX/DEMUX modules can be used for both research on signal transmission and development of high-speed components, including direct evaluation of wafers on probe stations.