Full Range of 1550-nm Band SLD Light Sources
Anritsu Corporation (President Hirokazu Hamada) is pleased to announce the successful development and September 1 sales launch of the company’s 1550-nm band super-luminescent diodes (SLD) for application as sensing light sources in a wide range of fields, including industrial, medical, and precision measurements.
The two new SLD models are the AS5B310KM50M with a low fiber output of 3 mW (typ.) and the AS5B320EM50M with a high fiber output of 25 mW (typ.). The wide-spectrum, low-coherence light features output from a polarization-maintaining fiber as well as operation over a wide temperature range due to a built-in temperature-regulating Peltier cooler. Additionally, a built-in photodiode (PD) facilitates in-module monitoring of generated light levels. The built-in optical isolator mitigates the impact of reflected returning light at interference measurement.
Typical applications for these light sources include assembly in interferometers, such as industrial OCT*1 and thickness measurement, auto focus units for position detection in semiconductor production equipment, precision position-detection devices, such as encoders and linear scales.
The SLD is an optical device featuring similar optical power output levels to laser diodes (LD) as well as the same low coherence as light emitting diodes (LED), plus a wide spectrum width. With its low coherence noise supporting high-precision measurement, the SLD has a wide application range in fields covering optical measurements, medical imaging, and various types of sensing.
More recently, optical communications networks are using less-expensive 1550-nm band devices as part of a cost-cutting trend. Based on our long experience in mass-production of high-quality modules, these new models extend Anritsu’s line of SLD light sources to help further development of sensing technologies.
Anritsu’s wide-spectrum SLD light sources covering the 850, 1330, 1550, and 1650-nm bands are ideal for sensing applications. The high-resolution, 1550-nm SLD AS5B320EM50M model with a 55-nm (typ.) spectrum width is especially suitable for interferometry measurements. In addition, with similar directivity to an LD, the SLD can focus light at an optical fiber as well as support long-distance emission through free space.
Comparison of SLD, LD, and LED Features >
Target Markets and Applications
- Target Markets
- Industrial and precision measurements
- Industrial Measurements
- Industrial OCT applications, thickness measurement, auto focus unit for semiconductor manufacturing equipment
- Precision Measurements
- *1 OCT
- OCT is the abbreviation for Optical Coherence Tomography, a non-destructive, non-contact technology for precision measurement of surface roughness and generation of cross-section images of living materials using optical interference phenomena.