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High Speed PAM4 BER Measurement Solution

One box over 400G Testing

【Video】Signal Quality Analyzer-R MP1900A PAM4 Solution Duration: 00:02:55
Anritsu has implemented more accurate signal integrity tests, such as bit error rate (BER) measurements, crosstalk tests, Jitter Tolerance tests, etc., in its MP1900A test solution for 32G/64G NRZ/PAM4.

Three Features Supporting PAM Measurement



All In One

All Instruments for PAM Measurement in One Unit
Efficient Measurement with High-Quality Output Waveforms

PAM4 Test Solution


High-Quality Data Output with High-Speed Tr/Tf and Low Intrinsic Jitter

The PAM4 PPG MU196020A supports output of low-noise and low-distortion high-quality data signals with a high Tr/Tf speed (20 to 80%) of 8.5 ps, a low intrinsic jitter of 170 fs rms, and a high analog bandwidth for generating wide open Eye PAM4 waveforms and high-reproducibility measurements.

NRZ waveform
Typical 58-Gbit/s PRBS15 Output Waveform
(J1789A 40 cm Cable and 1400 mV Differential)
PAM4 waveform
53.125-Gbaud PRBS15 Output Waveform
(J1789A 40 cm Cable and Differential)

4Tap Emphasis Output at 20 dB max

The optional 4Tap Emphasis function built into the MU196020A can generate the Pre-Emphasis and De-Emphasis signals required by each standard for maximum rates of 64.2G. Since each tap can be changed independently up to 20 dB, corrected waveforms for various transmission paths can be output with good reproducibility.

PAM4 Emphasis

Receive Electrical Stressed Eye with BER of <1E–12 using High-Sensitivity, Wideband Input ED

The electrical Stressed Eye BER standard is specified by IEEE, IBTA, etc. IEEE 802. 3 specifies a BER of <1E-6 for the electrical Stressed Eye which the PAM 4 ED MU196040A easily exceeds with a specification of <1E-12.
With an analog band of 40 GHz and a high sensitivity performance of 23 mV (PAM4, PRBS31), the MU196040A can easily correct for transmission path losses to recover the open Eye and achieve high BER Rx performance.

Stress waveform Electrical Stressed Eye Waveform (QPRBS13, Differential, with CTLE)
Electrical Stressed Eye Waveform
(QPRBS13, Differential, with CTLE)
Stress waveform PAM 4 BER Measurement Screen
PAM 4 BER Measurement Screen


The MP1900A series is an 8-slot, modular, high-performance BERT.
Installing multiple 64G PAM4 PPG module boards in the slots provides the performance for measuring not only 400GbE systems but also future 800GbE systems as well. This flexible expandability helps customers maximize product development-cost efficiencies and bring products to market early.

MP1900A Expandability NRZ Solution
MP1900A Expandability PAM4 Solution

All In One

All-in-One Measurement Solution

The 8-slot main chassis can accommodate various module combinations, such as the newly developed 32/64G PAM4 PPG/ED, existing 21/32G SI PPG/ED, synthesizer, jitter modulation source, noise generator, etc.
A compact, high cost-performance, next-generation, all-in-one measurement solution can be configured without other external instruments.

All In One PAM4 Solution

PAM4 Signal Jitter Tolerance Test using One MP1900A

PAM4 Jitter Tolerance Test

Jitter/Noise Types*      *: The upper noise addition rate is 32.1G.

Sine Wave Jitter (SJ)
Sine Wave Jitter (SJ)
Random Jitter (RJ)
Random Jitter (RJ)
CM/DM Noise
CM/DM Noise
White Noise
White Noise

Jitter Tolerance Test Function (MX183000A-PL001)

  • Easy Jitter Tolerance measurement
  • PHY device Jitter Tolerance test with impressed SJ/RJ/BUJ
  • Mask measurements supporting various standards
  • Shorter measurement times using low error rate (1E-12, 1E-15, etc.) estimation function
  • Tolerance measurement for device characteristics using four Binary, Upward, Downward, and Binary + Linear measurement methods
  • Built-in Jitter Tolerance Mask standards for 200/400G including IEEE 802.3, CEI, etc.
  • Support for both user-defined masks and new standards

More details about Signal Quality Analyzer-R MP1900A

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