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APPLICATIONS

40 Gbit/s QSFP+ (4 x 10 Gbit/s) Measurement

40 Gbit/s QSFP+ (4 x 10 Gbit/s) Measurement

fig11-e

 

Required 40 Gbit/s QSFP+ Measurement Items
  • All-in-one simultaneous BER and Eye Pattern measurements
  • 4ch Simultaneous BER measurements
  • Eye Pattern Analysis
  • High-quality PPG and high-sensitivity ED

 

  • Simultaneous Measurements
    Optical modules used in data centers are handling increasing data volumes, some more multichannel optical modules such as QSFP+ are being used. The MP2100B supports simultaneous BER measurements of multichannel optical modules for four channels using the built-in BERT. In addition, Eye Pattern and BER can be measured simultaneously using the built-in BERT and sampling oscilloscope.
  • Fast Sampling Mode(High-speed Eye Pattern analysis)
    The MP2100B has a built-in new Fast Sampling Mode, supporting sampling speeds up to 150 ksample/s and Eye Pattern analyses 1.5 times faster than compared to legacy models.
  • High-Quality PPG and High-Sensitivity ED
    Accurate testing of DUT characteristics requires a PPG outputting a high-quality signal as well as a high-sensitivity ED. The MP2100B PPG outputs a high-quality signal with a Jitter of 1 ps and a Tr/Tf of 24 ps . Additionally, the ED has a high sensitivity of 10 mVp-p min.

 

fig5-e

Legacy Model 1 is a combination of a 2ch BERT and sampling oscilloscope.
Legacy Model 2 integrates a 2ch BERT and sampling oscilloscope into one instrument (set).
The MP2100B integrates a 4ch BERT and sampling oscilloscope into one instrument (set).
Capture BER for 3 points for each of 1E-3, 1E-5, 1E-7, 1E-8, 1E-9, and 1E-10 for 4ch × 10 Gbit/s.
Compare to the waveform of 1 Msample.

 

 

Active Optical Cable (AOC) Measurement

Active Optical Cable (AOC) Measurement

fig12-2-e

 

Requires Active Optical Cable (AOC) Measurements
  • Jitter Analyses: TJ, DJ, RJ, DDJ Measurements, DDPWS etc
  • Multi-channel BER Measurements

 

  • Jitter Analysis
    Evaluation of Active Optical Cables (AOCs) not only requires BER measurements and Eye Pattern analyses but also requires Jitter Analysis due to a analysis at electrical signal conversion. By using the MP2100B along with the Jitter Analysis Software MX210001A option, the Jitter of high-speed, multichannel AOCs can be measured at the same time as performing Eye Pattern and Eye Mask tests. Moreover, adoption of high-speed trigger methods supports high-speed DDJ measurements, cutting measurement times by 80% compared to legacy models, thereby cutting overall measurement times.
  • Simultaneous Multi-channel Measurements
    Both-ways transmissions of multichannel AOCs using InfiniBand, etc., can be measured simultaneously. Since the MP2100B has a built-in 4ch PPG and ED, it can also measure BER simultaneously, helping cut measurement times.

 

 

PON Device BOB (BOSA On Board) Evaluation

PON Device BOB (BOSA On Board) Evaluation

fig13-e

 

Requires Transmission Equipment PHY Layer Measurement Items
  • High-speed Eye Pattern analysis with Clock Recovery and Automatic Mask Margin tests

 

  • Clock Recovery Options
    Because the MP2100B has a built-in clock recovery option supporting 8.5 GHz to 12.5 GHz and 0.1 GHz to 2.7 GHz, it can be used to confirm the optical output characteristics of transmission equipment without requiring a trigger source.
  • High-Speed Mask Margin Measurement
    Eye Pattern analysis can be performed at sampling rates up to 150 ksample/s using the Fast Sampling Mode. In addition, automated Mask Margin tests shorten measurement times and increase measurement efficiency.

 

 

Direct Attach Cable (DAC) Measurement

Direct Attach Cable (DAC) Measurements

The Eye opening of passive cables like Direct Attach Cables (DAC) used for short connections between server racks, etc., can be assured using the equalizer built into the equipment Rx section. The MX210002A can measure the S21 Gain and Phase characteristics of these devices. Moreover, since waveforms with optimized equalizer, filter, and emphasis values can be predicted from these transmission characteristics, Eye Pattern measurements and Eye Mask tests of simulated waveforms can be performed. In addition, combination with the MX210001A supports tests required for DAC manufacturing, such as Eye Pattern measurement and Jitter analysis, in one unit.

fig14-e

 

 

Emphasis Effect Simulation

Emphasis Effect Simulation

The same 4Tap Emphasis as the 4Tap Emphasis MP1825B can be set. The type of Eye Pattern measurement resulting from equalization and Emphasis correction of a waveform with an Eye Pattern measurement degraded by transmission path loss, or analysis using on-the-spot waveform simulation to determine the required equalization or Emphasis can be fed-back into the Emphasis design.

fig15-e

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