High Speed Serial Data Test Solutions

Next-Generation Digital I/F Rx Tests

The spread of IoT devices and Cloud Computing services is causing explosive growth in data traffic handled by digital devices, in turn requiring faster serial device interfaces. The PCIe and USB interfaces used by digital devices are handling ever larger data volumes so the resulting next-generation PCI Express Rev 4.0 standard reaches higher speeds of 16 GT/s, while USB3.1 Gen 2 supports 10 Gbit/s, and USB3.1 Type-C is also compatible with Thunderbolt which also supports 20 Gbit/s.

Multi-interface Support using Wideband MP1800A/MP1900A BERT

With 32 Gbit/s PPG, ED, jitter and noise addition functions, and a full lineup of application software, the Signal Quality Analyzer MP1800A supports every measurement need for high-speed, next-generation, digital interfaces (CEI-28G/56G, InfiniBand, 100/400G Ethernet, Fibre Channel, Thunderbolt 3, PCI Express, USB) from early development through production.

Multi-interface Support using Wideband MP1800A BERT

High Speed Interface Receiver Test Solutions

Installing this application software in the MP1800A/MP1900A supports generation of Link Sequence patterns required for evaluation of PCI Express and USB devices and Jitter Tolerance tests. The MX183000A can be used for SERDES IC Jitter Tolerance tests as well as for tests of digital equipment internal and external interfaces by generating the Link Sequence required for evaluation of devices supporting next generation PCI Express and USB standards.

Jitter Tolerance Test Function (MX183000A-PL001)

Supports versatile Jitter Tolerance measurements
Injects SJ/RJ/BUJ for PHY device Jitter Tolerance tests
Supports Mask measurements for various standards
Shortens measurement time using low-error-rate (1E-12, 1E-15, etc.) estimation function
Uses Binary, Upward, Downward, and Binary + Linear search methods to measure tolerance points dependent on device characteristics

Low-Rate Estimated BER Measurement

PCI Express Link Sequence Generation Function (MX183000A-PL011)

Uses training sequence generation to set PCI Express Gen1 to 4 devices to Loopback state
Automates Pass/Fail evaluation of devices transitioned to Loopback state
Generates 8B/10B, 128B/130B, Scramble, SKIP Insertion

LTSSM Parameter Setting Screen

Pass/Fail Screen

PCIe Link Training and LTSSM Analysis Function (MX183000A-PL021)

Protocol aware, all-in-one, PCI Express Gen 1 to 5 Receiver Test
Link Training and LTSSM Analysis functions

Supports physical layer measurements of add-in cards and system boards

Tx/Rx Link Equalization Response Test
Rx Link Equalization Test
Receiver Jitter Tolerance Test

Link Training State transitions

LTSSM Log

USB Link Sequence Generation Function (MX183000A-PL012)

Sets Link Sequence, Sequence type, and test pattern, and transitions to Loopback mode for evaluating USB3.1 Gen1, Gen 2 devices
Generates 8B/10B, 128B/132B, Scramble, SKIP Insertion, LFPS

Link Sequence Setting Screen

LFPS Setting Screen

USB Link Training (MX183000A-PL022)

Protocol aware, all-in-one, USB3.1 Rx test solution
Link Training and LTSSM Analysis

Controls transition to Loopback (Link Training function)

Supports Link troubleshooting (LTSSM Analysis function)

Software

Item		PCI Express	USB	Thunderbolt	General
Calibration		*	GRL-USB31-RXA *	GRL-TBT3-RXA *	–
Link Sequence Generation		MX183000A-PL011	MX183000A-PL012	–	–
Link Training		MX183000A-PL021	MX183000A-PL022	–	–
Jitter Tolerance Test	Pass/Fail	–	GRL-USB31-RXA	GRL-TBT3-RXA	–
Jitter Tolerance Test	Margin	MX183000A-PL001	MX183000A-PL001	–	MX183000A-PL001

*: Please Contact our Business Section about MP1900A support.