The spread of IoT devices and Cloud Computing services is causing explosive growth in data traffic handled by digital devices, in turn requiring faster serial device interfaces. The PCIe and USB interfaces used by digital devices are handling ever larger data volumes so the resulting next-generation PCI Express Rev 4.0 standard reaches higher speeds of 16 GT/s, while USB3.1 Gen 2 supports 10 Gbit/s, and USB3.1 Type-C is also compatible with Thunderbolt which also supports 20 Gbit/s.
Multi-interface Support using Wideband MP1800A/MP1900A BERT
With 32 Gbit/s PPG, ED, jitter and noise addition functions, and a full lineup of application software, the Signal Quality Analyzer MP1800A supports every measurement need for high-speed, next-generation, digital interfaces (CEI-28G/56G, InfiniBand, 100/400G Ethernet, Fibre Channel, Thunderbolt 3, PCI Express, USB) from early development through production.
High Speed Interface Receiver Test Solutions
Installing this application software in the MP1800A/MP1900A supports generation of Link Sequence patterns required for evaluation of PCI Express and USB devices and Jitter Tolerance tests. The MX183000A can be used for SERDES IC Jitter Tolerance tests as well as for tests of digital equipment internal and external interfaces by generating the Link Sequence required for evaluation of devices supporting next generation PCI Express and USB standards.
Jitter Tolerance Test Function (MX183000A-PL001) 
- Supports versatile Jitter Tolerance measurements
- Injects SJ/RJ/BUJ for PHY device Jitter Tolerance tests
- Supports Mask measurements for various standards
- Shortens measurement time using low-error-rate (1E-12, 1E-15, etc.) estimation function
- Uses Binary, Upward, Downward, and Binary + Linear search methods to measure tolerance points dependent on device characteristics
Low-Rate Estimated BER Measurement
PCI Express Link Sequence Generation Function (MX183000A-PL011)
- Uses training sequence generation to set PCI Express Gen1 to 4 devices to Loopback state
- Automates Pass/Fail evaluation of devices transitioned to Loopback state
- Generates 8B/10B, 128B/130B, Scramble, SKIP Insertion
LTSSM Parameter Setting Screen
Pass/Fail Screen
PCIe Link Training and LTSSM Analysis Function (MX183000A-PL021)
- Protocol aware, all-in-one, PCI Express Gen 1 to 5 Receiver Test
- Link Training and LTSSM Analysis functions
Supports physical layer measurements of add-in cards and system boards
- Tx/Rx Link Equalization Response Test
- Rx Link Equalization Test
- Receiver Jitter Tolerance Test
Link Training State transitions
LTSSM Log
USB Link Sequence Generation Function (MX183000A-PL012)
- Sets Link Sequence, Sequence type, and test pattern, and transitions to Loopback mode for evaluating USB3.1 Gen1, Gen 2 devices
- Generates 8B/10B, 128B/132B, Scramble, SKIP Insertion, LFPS
Link Sequence Setting Screen
LFPS Setting Screen
USB Link Training (MX183000A-PL022)
- Protocol aware, all-in-one, USB3.1 Rx test solution
- Link Training and LTSSM Analysis
Controls transition to Loopback (Link Training function)
Supports Link troubleshooting (LTSSM Analysis function)
Software
| Item |
PCI Express |
USB |
Thunderbolt |
General |
| Calibration |
* |
GRL-USB31-RXA
* |
GRL-TBT3-RXA
* |
– |
| Link Sequence Generation |
MX183000A-PL011
|
MX183000A-PL012
|
– |
– |
| Link Training |
MX183000A-PL021
|
MX183000A-PL022
|
– |
– |
| Jitter Tolerance Test |
Pass/Fail |
– |
GRL-USB31-RXA
|
GRL-TBT3-RXA
|
– |
| Margin |
MX183000A-PL001
|
MX183000A-PL001
|
– |
MX183000A-PL001
|
*: Please Contact our Business Section about MP1900A support.
Related Document
Brochure
Datasheet
Product Introduction
Related Product
Related Solution
제품비트 오류율 테스터(BERT)/오실로스코프이동/무선통신 관련 측정기광통신관련 측정기RF/마이크로파 관련 측정기신호 발생기시그널 애널라이저/스펙트럼 애널라이저전송로 및 이더넷 테스트벡터 네트워크 아날라이저(VNA)광 디바이스/RF 마이크로파 컴포넌트
