High-Quality Data Output with High-Speed Tr/Tf and Low Intrinsic Jitter

The PAM4 PPG MU196020A supports output of low-noise and low-distortion high-quality data signals with a high Tr/Tf speed (20 to 80%) of 8.5 ps, a low intrinsic jitter of 170 fs rms, and a high analog bandwidth for generating wide open Eye PAM4 waveforms and high-reproducibility measurements.

Typical 58-Gbit/s PRBS15 Output Waveform
(J1789A 40 cm Cable and 1400 mV Differential)

53.125-Gbaud PRBS15 Output Waveform
(J1789A 40 cm Cable and Differential)

4Tap Emphasis Output at 20 dB max

The optional 4Tap Emphasis function built into the MU196020A can generate the Pre-Emphasis and De-Emphasis signals required by each standard for maximum rates of 64.2G. Since each tap can be changed independently up to 20 dB, corrected waveforms for various transmission paths can be output with good reproducibility.

116-Gbit/s PAM4 Signal Error-Free BER Measurement using High Input Sensitivity Function

Combining the PAM4 ED MU196040B with the PAM4 PPG supports BER measurements of 116-Gbit/s (58 Gbaud) PAM4 signals. Error-free BER measurement is achieved by the industry-best high sensitivity performance of 23 mV @ 26 Gbaud and 36 mV @ 53 Gbaud. The resulting high-accuracy BER measurements make it easy to troubleshoot previously difficult-to-analyze PAM4 devices. In addition, true DUT performance can be verified because even CEI-112G-VSR-defined worst-case stressed signals can be received at low-error rates (<E-8), exceeding the specifications.

Error-Free Measurement of PAM3 Signals at 23 mV @ 26 Gbaud, and 36 mV @ 53Gbaud

CEI-112G-VSR-defined Worst-Case Stressed PAM4 Signal

PAM4 BER Measurement Screen

All-in-One 64Gbaud BER Measurement Solution

The 8-slot main chassis can accommodate various module combinations, such as PPG/ED, existing synthesizer, jitter modulation source, noise generator, etc. A compact, high cost-performance, next-generation, all-in-one measurement solution can be configured without other external instruments.

PAM4 Signal Jitter Tolerance Test using One MP1900A

Supports detection and analysis of FEC Symbol Errors  UPDATED

The input data is captured when the number of FEC symbol errors exceeds the threshold setting. The causes of FEC-uncorrectable errors can be analyzed from the captured data.

Jitter/Noise Types^*      *: The upper noise addition rate is 32.1G.

Sine Wave Jitter (SJ)

Random Jitter (RJ)

CM/DM Noise

White Noise

Jitter Tolerance Test Function (MX183000A-PL001)

• Easy Jitter Tolerance measurement
• PHY device Jitter Tolerance test with impressed SJ/RJ/BUJ
• Mask measurements supporting various standards
• Shorter measurement times using low error rate (1E-12, 1E-15, etc.) estimation function
• Tolerance measurement for device characteristics using four Binary, Upward, Downward, and Binary + Linear measurement methods
• Built-in Jitter Tolerance Mask standards for 200/400G including IEEE 802.3, CEI, etc.
• Support for both user-defined masks and new standards