High Speed PAM4 BER 측정 솔루션

High-Quality Data Output with High-Speed Tr/Tf and Low Intrinsic Jitter

The PAM4 PPG MU196020A supports output of low-noise and low-distortion high-quality data signals with a high Tr/Tf speed (20 to 80%) of 8.5 ps, a low intrinsic jitter of 170 fs rms, and a high analog bandwidth for generating wide open Eye PAM4 waveforms and high-reproducibility measurements.

Typical 58-Gbit/s PRBS15 Output Waveform
(J1789A 40 cm Cable and 1400 mV Differential)

53.125-Gbaud PRBS15 Output Waveform
(J1789A 40 cm Cable and Differential)

4Tap Emphasis Output at 20 dB max

The optional 4Tap Emphasis function built into the MU196020A can generate the Pre-Emphasis and De-Emphasis signals required by each standard for maximum rates of 64.2G. Since each tap can be changed independently up to 20 dB, corrected waveforms for various transmission paths can be output with good reproducibility.

Receive Electrical Stressed Eye with BER of <1E–12 using High-Sensitivity, Wideband Input ED

The electrical Stressed Eye BER standard is specified by IEEE, IBTA, etc. IEEE 802. 3 specifies a BER of <1E-6 for the electrical Stressed Eye which the PAM 4 ED MU196040A easily exceeds with a specification of <1E-12.
With an analog band of 40 GHz and a high sensitivity performance of 23 mV (PAM4, PRBS31), the MU196040A can easily correct for transmission path losses to recover the open Eye and achieve high BER Rx performance.

Electrical Stressed Eye Waveform
(QPRBS13, Differential, with CTLE)

PAM 4 BER Measurement Screen

All-in-One Measurement Solution

The 8-slot main chassis can accommodate various module combinations, such as the newly developed 32/64G PAM4 PPG/ED, existing 21/32G SI PPG/ED, synthesizer, jitter modulation source, noise generator, etc.
A compact, high cost-performance, next-generation, all-in-one measurement solution can be configured without other external instruments.

PAM4 Signal Jitter Tolerance Test using One MP1900A

Jitter/Noise Types^*      *: The upper noise addition rate is 32.1G.

Sine Wave Jitter (SJ)

Random Jitter (RJ)

CM/DM Noise

White Noise

Jitter Tolerance Test Function (MX183000A-PL001)

• Easy Jitter Tolerance measurement
• PHY device Jitter Tolerance test with impressed SJ/RJ/BUJ
• Mask measurements supporting various standards
• Shorter measurement times using low error rate (1E-12, 1E-15, etc.) estimation function
• Tolerance measurement for device characteristics using four Binary, Upward, Downward, and Binary + Linear measurement methods
• Built-in Jitter Tolerance Mask standards for 200/400G including IEEE 802.3, CEI, etc.
• Support for both user-defined masks and new standards