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지속 기간: 00:11:35
릴리스 날짜: 2013/08/27

Cutting Edge Pulse Measurement Capabilities with the NEW VectorStar B VNA

Pulsed S-parameter and related measurements are critical for many common applications, including test of radar sub-systems and components. In addition, pulsed measurements are often necessary for on-wafer device characterization, where pulsed operation is required for thermal reasons. Historically engineers have often had to face several test challenges including: too many test method trade-offs; a need for better analysis tools; inability to monitor pulse behavior over long periods of time; the need to eliminate measurement setup errors; and, timing and synchronization issues.
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