Anritsu is the leader of high frequency microwave connector technology and is driven by an ongoing commitment to exceed customer needs. Anritsu created and trademarked the K Connector with coverage to 40 GHz, along with a complete family of 40 GHz test equipment. It was an immediate success and today is used on many commercial components, test fixtures, and
defense systems. P/N: 11410-00235
Anritsu has teamed with Diamond Engineering and Diamond Microwave Chambers to create a robust anechoic chamber solution for conducting various antenna measurements.
Overview of RF and Microwave instruments available to meet a variety of solutions. Featuring the frequency range, measurements, and other key features. P/N: 11410-00800
Operation manual for the MS46121B and MS46121A vector network analyzer. P/N: 10410-00344
ShockLine VNAs supports remote operations commanded via the TCP/IP or VXI-11 protocols. This manual provides operation and programming information for this activity. P/N: 10410-00746
This manual is a reference document for the Anritsu ShockLine VNA user interface (UI) menus and dialog boxes. This chapter describes the document conventions used in this manual and lists related ShockLine VNA documentation. P/N: 10410-00337
In 1965, Anritsu filed the patent that defined the first modern Vector Network Analyzer (VNA).
We are proud to continue that tradition of innovation to the present day—with the world’s first portfolio of VNAs that bring Nonlinear Transmission Line (NLTL) technology to every measurement scenario from on-wafer device characterization to R&D testing to manufacturing and field operations. P/N: 11410-00905
The ShockLine family of vector network analyzers (VNAs) achieve a new level of capability, flexibility, and value
for RF and microwave network analysis applications. ShockLine VNAs deliver excellent performance for measurements from 50 kHz up to 43.5 GHz and banded E-band measurements from 55 GHz to 92 GHz. These instruments are ideal for testing passive and many active components with general purpose VNA requirements. P/N: 11410-01071
Introduces Anritsu 5G solutions and products.
Anritsu will contribute to customer's 5G product development and future innovation of network.
The Anritsu VectorStar and ShockLine vector network analyzers (VNAs) are compatible with the SWISSto12 MCK systems, and are ideal for active and passive material measurements. P/N: 11410-01167
The Anritsu VectorStar and ShockLine vector network analyzers (VNAs) are compatible with Compass Technology hardware fixtures and CTG software systems, and make an ideal solution for material measurements. P/N: 11410-01182
Anritsu’s ShockLine and VectorStar series vector network analyzers are now compatible with all the available solutions from Keycom Technologies for various types of material measurements methods including: resonator, frequency change, probe type, co-axial tube and waveguide type S-parameter, free space, capacitance, epsilometery, and many more. P/N: 11410-01191
The MS46121B is a series of two PC-controlled 1-Port USB ShockLine Vector Network
Analyzers with frequency ranges from 40 MHz to 4 GHz and 150 kHz to 6 GHz. The
VNAs are packaged in a compact housing and are externally controlled via USB from
a user supplied PC running the same Graphical User Interface (GUI) software as the
rest of the ShockLine family of VNAs. P/N: 11410-01013
The ShockLine Family of Vector
Network Analyzers provide a broad range of solutions to meet your unique performance, application, and budget needs. P/N: 11410-01039
The MS46121B is part of the ShockLine family of Vector Network Analyzers from Anritsu. It is available in two frequency ranges of 40 MHz to 4 GHz and 150 kHz to 6 GHz, and is capable of 1-port s-parameter and band pass time domain
(distance to fault) measurements. P/N: 11410-00994
This poster features sections on Circuits and Waves, S-Parameters, Reflection Coefficient, Phase and Group Delay, Non Linear Transmission Lines, VNA Architecture, Superposition/True Mode Stimulus, Time Domain, Pulse Measurements, and a Reflection Coefficient Table. P/N: 11410-00934
Many microwave test applications do not need the level of performance provided by an expensive, high-end VNA. This is particularly true in production, where testing is typically not as rigorous as in device characterization and cost-of-test is critical. VNAs integrated into manufacturing test systems where S-parameter measurements represent only a part of the test list, may also require only moderate performance. This application note will examine these requirements and how they factor in to deciding which VNA is appropriate for a production environment. PN: 11410-01158
Although the TRL family of calibration algorithms have been around for over 40 years, there are still questions sometimes regarding differences between the family members. This is partially due to differences in various implementations over the years. The purpose of this document is to discuss some of the differences in the context of vector network analyzers (VNAs). P/N: 11410-01124
Vector network analyzers (VNAs) are used to measure the performance of a wide variety of passive and active RF and microwave devices. Passive devices can be less demanding to test than active devices, thus requiring less performance from the VNA. However, one interesting exception to this is the measurement of very low insertion loss passive components such as precision adapters or airlines. These types of devices can present a difficult challenge to characterize because of the desire for very low uncertainties on these small insertion losses. This application note talks about these challenges and provides a helpful technique. P/N: 11410-01090
The superposition technique relies on the inherent linear nature of a transmission line, and mathematically derives the differential and common-mode transmission line characteristics through superposition while stimulating just one side of the balanced transmission line at a time. The true-balanced/differential technique, also known as True-Mode Stimulus, uses two sources to create actual differential and common-mode stimuli. This white paper offers guidance to signal integrity designers on the differences between these approaches and which one may best fit their need. P/N: 11410-00659