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Test and Measurement
High Speed BUS Test

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High Speed BUS Test

Jitter Tolerance Test Function (MX183000A-PL001)

Supports versatile Jitter Tolerance measurements
Injects SJ/RJ/BUJ for PHY device Jitter Tolerance tests
Supports Mask measurements for various standards
Shortens measurement time using low-error-rate (1E-12, 1E-15, etc.) estimation function
Uses Binary, Upward, Downward, and Binary + Linear search methods to measure tolerance points dependent on device characteristics
Users can customize the Jitter Tolerance test mask.

Low-Rate Estimated BER Measurement

PCIe Link Training and LTSSM Analysis Function (MX183000A-PL021)

Protocol aware, all-in-one, PCI Express Gen 1 to 5 Receiver Test
Link Training and LTSSM Analysis functions

Supports physical layer measurements of add-in cards and system boards

Tx/Rx Link Equalization Response Test
Rx Link Equalization Test
Receiver Jitter Tolerance Test

Link Training State transitions

LTSSM Log

USB Link Training (MX183000A-PL022)

Protocol aware, all-in-one, USB3.1 Rx test solution
Link Training and LTSSM Analysis

Controls transition to Loopback (Link Training function)

Supports Link troubleshooting (LTSSM Analysis function)

High Speed Serial Data Test Solutions

Related Products

Signal Quality Analyzer-R MP1900A

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