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Test and Measurement
High Speed BUS Test

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High Speed BUS Test

Jitter Tolerance Test Function (MX183000A-PL001)

Supports versatile Jitter Tolerance measurements
Injects SJ/RJ/BUJ for PHY device Jitter Tolerance tests
Supports Mask measurements for various standards
Shortens measurement time using low-error-rate (1E-12, 1E-15, etc.) estimation function
Uses Binary, Upward, Downward, and Binary + Linear search methods to measure tolerance points dependent on device characteristics
Users can customize the Jitter Tolerance test mask.

Low-Rate Estimated BER Measurement

PCIe Link Training and LTSSM Analysis Function (MX183000A-PL021)

Protocol aware, all-in-one, PCI Express Gen 1 to 5 Receiver Test
Link Training and LTSSM Analysis functions

Supports physical layer measurements of add-in cards and system boards

Tx/Rx Link Equalization Response Test
Rx Link Equalization Test
Receiver Jitter Tolerance Test

Link Training State transitions

LTSSM Log

USB Link Training (MX183000A-PL022)

Protocol aware, all-in-one, USB3.1 Rx test solution
Link Training and LTSSM Analysis

Controls transition to Loopback (Link Training function)

Supports Link troubleshooting (LTSSM Analysis function)

High Speed Serial Data Test Solutions

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Signal Quality Analyzer-R MP1900A

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