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Differential Component and Device S-Parameter Measurements


When making differential component or device S-parameter measurements there are two methodologies. When measuring passive components, such as interconnects or active components operating in their linear region, combining single ended measurements using "superposition" provides an accurate and cost effective solution. However, if it is desired to make measurements on active components or devices operating outside of their linear region, a technique commonly called "true mode stimulus" should be used. VectorStar™ MS4640B, configured with its internal second source and DifferentialView™ options provides a convenient and highly stable way to make such differential S-parameter measurements to 110 GHz.