May 31, 2010

Anritsu Corporation is pleased to announce that it will be demonstrating connection tests with Samsung’s latest TD-LTE devices at NGMN Shanghai from 2 to 4 June.

TD-LTE is a new wireless communication technology combining Time Domain Division (TDD) with the next-generation 3GPP LTE (Long Term Evolution) FDD standard. It is being developed in parallel with FDD technology and is the focus of new next-generation TD-SCDMA services in China. Anritsu’s long cooperative partnership with Samsung as a test vendor for its LTE FDD platform has helped promote rapid development of TD-LTE tests, starting from early stage. As a result, Anritsu is pleased to be able to demonstrate TD-LTE connection tests in cooperation with Samsung at NGMN Shanghai. Samsung is the world leader in development of TD-LTE devices and Anritsu and Samsung have successfully achieved full protocol stack connection tests. At NGMN Shanghai, Anritsu plans to demonstrate connection tests between Samsung’s TD-LTE devices and Anritsu’s MD8430A LTE eNodeB Simulator to download streaming data from a connected server.

Anritsu continues its partnership with Samsung in FDD/TDD technologies to bring high-quality LTE services to world markets as soon as possible.