Anritsu to Conduct LTE Demonstration with Samsung Device at MWC
February 15, 2010
Anritsu Corporation (Hall 1, stand B31) announces its demonstration with Samsung Electronics’ LTE USB Modem at Barcelona Mobile World Congress (MWC) held February 15 - 18.
LTE is the next-generation, high-speed, mobile wireless technology planned for rollout in 2010 by the world’s leading operators. Anritsu has been working with Samsung Electronics as a primary test vendor to help Samsung Electronics prove its LTE capable devices.
Anritsu and Samsung Electronics have been jointly testing Samsung’s world-leading LTE device. Together, they have already achieved excellent results, such as demonstrating 100 Mbps (downlink) and 50 Mbps (uplink) data throughput, and obtaining R&TTE validation, Europe’s radio regulatory requirement, using Anritsu’s LTE radio frequency conformance test system.
At the MWC, Anritsu will be demonstrating its LTE solutions, including the MT8820C Radio Communication Analyzer, a next-generation one box tester, and TS36.521 RF conformance tests with the ME7873L LTE radio frequency conformance test system using Samsung’s LTE devices.
MD8430A -- LTE Signaling Tester (e-NodeB Simulator)
RTD -- Rapid Test Designer (test script editing and execution software)
ME7832L -- LTE Protocol Conformance Test System
ME7873L -- LTE RF Conformance Test System
MT8820C -- Radio Communication Analyzer
MS2830A -- Signal Analyzer