Visit Anritsu Booth #633 at DesignCon!

Solution Demonstrations Include:

• High Speed Serial Bus Receiver Test Solution (USB3.1-C, Thunderbolt-3, PCIe-G4)
• 56Gbps PAM4 BER test solutions (400Gbps of IEEE and CEI)
• 100G AOC/Q-SFP Test Solution (IEEE, IBTA, CEI)
• 70GHz 4-Port VNA Signal Integrity Solution
• 43.5GHz 4-Port VNA Signal Integrity Solution
• Automated VNA Signal Integrity Compliance Testing

Don’t Miss our Technical Sessions!

Hear industry experts present on the latest in testing solutions on Wednesday, February 1st in Ballroom F and on Thursday, February 2nd in Great America 2.

Wednesday, February 1, 2017

Time	Topic	Speaker(s)	Outlook Link
4:00 p.m. - 4:45 p.m	De-embedding Sensitivities, Symmetry and Differential Pair Coupling	Jon Martens

Thursday, February 2, 2017

Time	Topic	Speaker(s)	Outlook Link
10:15 AM - 10:55 AM	100G AOC/Q-SFP Test Solution (100GE, IBTA, CEI)	James Morgante
11:05 AM - 11:45 AM.	Signal Integrity: VNA Applications	Joe Mallon
2:50 PM - 3:30 PM	Toward 400G (IEEE802.3 and CEI) 56G PAM4 Bit Error Rate Test Solution	Hiroshi Goto
3:45 PM - 5:00 PM	High Speed Serial Bus Receiver Test Solution	Mike Engbretson