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TEST AND MEASUREMENT

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Events
Tradeshows
DesignCon 2017

Search Contact Us My Anritsu United States

TradeShow

DesignCon 2017

2/1/2017 - 2/2/2017 , Santa Clara, California, BOOTH 633

Visit Anritsu Booth #633 at DesignCon!

Solution Demonstrations Include:

High Speed Serial Bus Receiver Test Solution (USB3.1-C, Thunderbolt-3, PCIe-G4)
56Gbps PAM4 BER test solutions (400Gbps of IEEE and CEI)
100G AOC/Q-SFP Test Solution (IEEE, IBTA, CEI)
70GHz 4-Port VNA Signal Integrity Solution
43.5GHz 4-Port VNA Signal Integrity Solution
Automated VNA Signal Integrity Compliance Testing

Don’t Miss our Technical Sessions!

Hear industry experts present on the latest in testing solutions on Wednesday, February 1st in Ballroom F and on Thursday, February 2nd in Great America 2.

Wednesday, February 1, 2017

Time

Topic

Speaker(s)

Outlook Link

4:00 p.m. - 4:45 p.m

De-embedding Sensitivities, Symmetry and Differential Pair Coupling

Jon Martens

Thursday, February 2, 2017

Time

Topic

Speaker(s)

Outlook Link

10:15 AM - 10:55 AM
100G AOC/Q-SFP Test Solution (100GE, IBTA, CEI)
James Morgante

11:05 AM - 11:45 AM.
Signal Integrity: VNA Applications
Joe Mallon

2:50 PM - 3:30 PM

Toward 400G (IEEE802.3 and CEI) 56G PAM4 Bit Error Rate Test Solution

Hiroshi Goto

3:45 PM - 5:00 PM
High Speed Serial Bus Receiver Test Solution
Mike Engbretson

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Time	Topic	Speaker(s)	Outlook Link
10:15 AM - 10:55 AM	100G AOC/Q-SFP Test Solution (100GE, IBTA, CEI)	James Morgante
11:05 AM - 11:45 AM.	Signal Integrity: VNA Applications	Joe Mallon
2:50 PM - 3:30 PM	Toward 400G (IEEE802.3 and CEI) 56G PAM4 Bit Error Rate Test Solution	Hiroshi Goto
3:45 PM - 5:00 PM	High Speed Serial Bus Receiver Test Solution	Mike Engbretson