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TEST AND MEASUREMENT

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Events
Tradeshows
DesignCon 2016

Search Contact Us My Anritsu United States

TradeShow

DesignCon 2016

1/20/2016 - 1/21/2016 , Santa Clara, California, BOOTH 717

Visit Anritsu Booth #717 at DesignCon!

Solution Demonstrations Include:

High Speed Serial Bus Test Solution (PCIe G4 and 100G Ethernet)
56G NRZ and PAM4 Accurate Jitter Tolerance Test
40/100G AOC and Q-SFP Test Solutions (IBTA)
70GHz 4 Port Signal Integrity Solution
4-Port 70 kHz-110GHz Broadband VNA Solution
New 43.5GHz 4-port VNA. Differential S-parameter Measurements

MP1800a — MP1800A Signal Quality Analyzer

Vector Star — MP1800A Signal Quality Analyzer

Don’t Miss Our Technical Sessions!

Hear industry experts present on the latest in testing solutions on Thursday, January 21 in Great America 2.

Time	Topic	Speaker(s)	Outlook Link
9:20 a.m. – 10:00 a.m.	56G PAM4 Accurate BER Measurement and JTOL Test with 4-tap emphasis	Hiroshi Goto, Anritsu Company
10:15 a.m. – 10:55 a.m.	20Gbps+ High Speed Serial BUS Test Solution	Darren Gray, Granite River Labs
11:05 a.m. - 11:45 a.m.	100G EDR and QSFP+ Cable Test Solutions	James Morgante, Anritsu Company
2:00 p.m. – 2:40 p.m.	Signal Integrity: VNA Applications	Joe Mallon, Anritsu Company
2:50 p.m. – 3:30 p.m.	Mobile-apps-like Signal Integrity Software	Dr. Ching-Chao Huang, AtaiTec
3:45 p.m. – 5:00 p.m.	20Gbps+ High Speed Serial BUS Test Solution	Darren Gray, Granite River Labs

DesignCon 2016

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