DesignCon 2016
1/20/2016 - 1/21/2016 , Santa Clara, California, BOOTH 717
Visit Anritsu Booth #717 at DesignCon!
Solution Demonstrations Include:
- High Speed Serial Bus Test Solution (PCIe G4 and 100G Ethernet)
- 56G NRZ and PAM4 Accurate Jitter Tolerance Test
- 40/100G AOC and Q-SFP Test Solutions (IBTA)
- 70GHz 4 Port Signal Integrity Solution
- 4-Port 70 kHz-110GHz Broadband VNA Solution
- New 43.5GHz 4-port VNA. Differential S-parameter Measurements
MP1800A Signal Quality Analyzer
VectorStar™ Vector Network Analyzers
Time
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Topic
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Speaker(s)
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Outlook Link
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9:20 a.m. – 10:00 a.m.
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56G PAM4 Accurate BER Measurement and JTOL Test with 4-tap emphasis |
Hiroshi Goto, Anritsu Company
|
 |
10:15 a.m. – 10:55 a.m.
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20Gbps+ High Speed Serial BUS Test Solution |
Darren Gray, Granite River Labs
|
 |
11:05 a.m. - 11:45 a.m.
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100G EDR and QSFP+ Cable Test Solutions |
James Morgante, Anritsu Company
|
 |
2:00 p.m. – 2:40 p.m.
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Signal Integrity: VNA Applications |
Joe Mallon, Anritsu Company
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 |
2:50 p.m. – 3:30 p.m.
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Mobile-apps-like Signal Integrity Software |
Dr. Ching-Chao Huang, AtaiTec
|
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3:45 p.m. – 5:00 p.m.
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20Gbps+ High Speed Serial BUS Test Solution |
Darren Gray, Granite River Labs
|
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DesignCon 2016