TradeShow
DesignCon 2015
1/27/2015 - 1/30/2015 , Santa Clara, CA
Visit Anritsu Booth #717 at DesignCon!
Demonstrations include:
- Signal Integrity Test Solution: Complete 32G Jitter Tolerance Test Solution
- High-Speed 64G PAM4 Signal Generation and Analysis
- 100G AOC/DAC QSFP+ Cable Test Solution
- 40G/100G OTN Test Solution
- 40GHz 4-Port Signal Integrity Solution
- 4-Port 70kHz-110GHz Broadband VNA Solution
- Simultaneous Forward and Reverse Differential S-Parameter Measurements
- Spectral Content of High-Speed SERDES Signals
MP1800A Signal Quality Analyzer
VectorStar™ Vector Network Analyzers
Time |
Topic |
Speaker(s) |
Outlook Link |
8:30 a.m. – 9:10 a.m. |
Critical Elements for Conducting Accurate Ultra-High-Speed SI BER Measurements |
Hiroshi Goto, Anritsu Company |
 |
9:20 a.m. – 10:00 a.m. |
Channel Testing Using a 32G NRZ/PAM-4 Waveform Generator and 65 GHz Oscilloscope to Analyze Jitter |
Hiroshi Goto, Anritsu Company
Alan Blankman, Teledyne LeCroy |
|
10:15 a.m. - 10:55 a.m. |
Achieving Accurate Jitter Tolerance Test at 28/32 Gbps for 100G+ Applications |
Daniel Gonzalez, Anritsu Company |
|
11:05 a.m. – 11:45 a.m. |
S-parameter Quality Metrics and Analysis to Measurement Correlation |
Joe Mallon, Anritsu Company
Yuri Shlepnev, Ph.D., Simberian |
|
2:00 p.m. – 2:40 p.m. |
The Case for VNAs & S-parameters: Measuring for Max Performance |
Joe Mallon, Anritsu Company |
|
2:50 p.m. – 3:30 p.m. |
Channel Testing Using a 32G NRZ/PAM-4 Waveform Generator and 65 GHz Oscilloscope to Analyze Jitter |
Hiroshi Goto, Anritsu Company
Alan Blankman, Teledyne LeCroy |
|
3:45 p.m. – 4:45 p.m. |
InfiniBand –100 Gbps and Beyond and Techniques for Effective Testing of AOC/DAC QSFP+ Cables |
Bill Lee, InfiniBand Trade Association
James Morgante, Anritsu Company |
|
 |
