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TEST AND MEASUREMENT

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Events
Tradeshows
DesignCon 2015

Search Contact Us My Anritsu United States

TradeShow

DesignCon 2015

1/27/2015 - 1/30/2015 , Santa Clara, CA

Visit Anritsu Booth #717 at DesignCon!

Demonstrations include:

Signal Integrity Test Solution: Complete 32G Jitter Tolerance Test Solution
High-Speed 64G PAM4 Signal Generation and Analysis
100G AOC/DAC QSFP+ Cable Test Solution
40G/100G OTN Test Solution
40GHz 4-Port Signal Integrity Solution
4-Port 70kHz-110GHz Broadband VNA Solution
Simultaneous Forward and Reverse Differential S-Parameter Measurements
Spectral Content of High-Speed SERDES Signals

MP1800a — MP1800A Signal Quality Analyzer

Vector Star — MP1800A Signal Quality Analyzer

Don’t Miss Our Technical Sessions!

Hear industry experts present on the latest in testing solutions on Thursday, January 29 in Great America 2.

Time	Topic	Speaker(s)	Outlook Link
8:30 a.m. – 9:10 a.m.	Critical Elements for Conducting Accurate Ultra-High-Speed SI BER Measurements	Hiroshi Goto, Anritsu Company
9:20 a.m. – 10:00 a.m.	Channel Testing Using a 32G NRZ/PAM-4 Waveform Generator and 65 GHz Oscilloscope to Analyze Jitter	Hiroshi Goto, Anritsu Company Alan Blankman, Teledyne LeCroy
10:15 a.m. - 10:55 a.m.	Achieving Accurate Jitter Tolerance Test at 28/32 Gbps for 100G+ Applications	Daniel Gonzalez, Anritsu Company
11:05 a.m. – 11:45 a.m.	S-parameter Quality Metrics and Analysis to Measurement Correlation	Joe Mallon, Anritsu Company Yuri Shlepnev, Ph.D., Simberian
2:00 p.m. – 2:40 p.m.	The Case for VNAs & S-parameters: Measuring for Max Performance	Joe Mallon, Anritsu Company
2:50 p.m. – 3:30 p.m.	Channel Testing Using a 32G NRZ/PAM-4 Waveform Generator and 65 GHz Oscilloscope to Analyze Jitter	Hiroshi Goto, Anritsu Company Alan Blankman, Teledyne LeCroy
3:45 p.m. – 4:45 p.m.	InfiniBand –100 Gbps and Beyond and Techniques for Effective Testing of AOC/DAC QSFP+ Cables	Bill Lee, InfiniBand Trade Association James Morgante, Anritsu Company

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