Skip to main content
HOME
ProductsSupportAbout AnritsuContact Us
Products
HOME
Test and MeasurementComponents and AccessoriesService AssuranceFood and Pharmaceutical EquipmentOptical Devices, Ultrafast Electron Devices
Test and Measurement
Back to Previous Menu
ProductsTechnologiesIndustriesBuyVideo GallerySupportDiscontinued ModelsAbout AnritsuContact Us
Technologies
Back to Previous Menu
5G, 4G and 3G Testing with AnritsuBase Station TestingBluetoothCPRI and OBSAIC-RANEthernetFibre ChannelFirstNetInterference HuntingIoT (Internet of Things)Land Mobile Radio (LMR)LTEMicrowave Components and Device CharacterizationOTDROTN, SDH/SONET, PDH/DSnPassive Intermodulation (PIM)Remote Spectrum MonitoringShockline NLTLSignal IntegritySyncETD-SCDMAW-CDMA/HSPA/HSPA EvolutionWiMAXWLAN
Base Station Testing
Back to Previous Menu
BTS WebinarsBTS ResourcesBTS Glossary 0-9BTS Glossary A-BBTS Glossary C-DBTS Glossary E-GBTS Glossary H-MBTS Glossary N-RBTS Glossary S-Z
Industries
Back to Previous Menu
AutomotiveAvionics - Aircraft ManufacturingEnergy and PetrochemicalRadar and Electronic PeacekeepingSatellite CommunicatuionsSmart Grid
Automotive
Back to Previous Menu
Wireless ConnectivitySafety Driver AidsIn-vehicle NetworksIntelligent Transport SystemsElectromagnetic Interference
Buy
Back to Previous Menu
Request QuotePromotionsUsed Test EquipmentContact Us
Support
Back to Previous Menu
Repair and CalibrationTraining and EducationTechnical SupportDownloadsProfessional Services
Repair and Calibration
Back to Previous Menu
Repair Calibration PricingContact Service Supporta-Sure
Training and Education
Back to Previous Menu
Technical WorkshopsInstructor Led Training
Instructor Led Training
Back to Previous Menu
PIM Master™ CertificationCertified Site Master
Components and Accessories
Back to Previous Menu
High Return Loss Connectors and CablesInstrumentation Grade AdaptersPrecision TerminationsMeasurement Components and AccessoriesDiscontinued ModelsContact Us
Service Assurance
Back to Previous Menu
eoSight Big Data AnalyticsvProbeeoLive Real-time AnalyticseoMind Streaming AnalyticsMasterClaw MonitoringSupportContact UsAbout AnritsuCustom Software
Custom Software
Back to Previous Menu
TelecommunicationsMobile & Web AppsEmbedded Software DevelopmentConsultingQuality Assurance Services
Food and Pharmaceutical Equipment
Back to Previous Menu
Products & SolutionsSupportAbout UsNewsEventsContact UsKnowledge CenterVideo Gallery
Optical Devices, Ultrafast Electron Devices
Back to Previous Menu
Optical DevicesUltrafast Electron DevicesAbout UsContact Us
About Us
Back to Previous Menu
Corporate InformationMessage from the President
Contact Us
Back to Previous Menu
Contact with Form
Support
HOME
Test and MeasurementService AssuranceFood and Pharmaceutical EquipmentOptical Devices, Ultra-high Frequency Electronic Devices
About Anritsu
HOME
Corporate InformationGroup CompaniesR&DEmploymentInvestor RelationsSustainabilityQuality and Product SafetyThe Anritsu BrandVideo GalleryNews
Corporate Information
Back to Previous Menu
ProfileTop Management MessageVisionCorporate GovernanceOn track to a brighter futureHistory
Vision
Back to Previous Menu
Charter of Corporate BehaviorCode of Conduct
Corporate Governance
Back to Previous Menu
Corporate Structure and AuditingInternal Control and Risk ManagementOfficer CompensationShareholdings
On track to a brighter future
Back to Previous Menu
TelecommunicationsOptical CommunicationsHigh-Speed Digital CommunicationIP NetworksLeading 3G FieldMobile Phone Services4G LTEIoT/5GProviding Food SafetyMass Food Production AutomationEnsuring Quality of Life
R&D
Back to Previous Menu
R&D SystemsAnritsu Technical ReviewAdvanced Technologies DevelopmentInformatics Originating DevelopmentDevice DevelopmentLatest Communications Measurement Technologies
Employment
Back to Previous Menu
Current VacanciesMeet the Anritsu TeamContact Human Resources
Investor Relations
Back to Previous Menu
IR NewsCorporate InformationFinancial InformationIR LibraryStocks and BondsContact IRShareholders and Investors
Corporate Information
Back to Previous Menu
Company ProfileTop Management MessageCorporate GovernanceDisclosure Policy
IR Library
Back to Previous Menu
Latest IR MaterialsFinancial MaterialsIntegrated ReportMid Term Business Plan/Business StrategySustainabilityGeneral Meeting of ShareholdersOther Materials
Stocks and Bonds
Back to Previous Menu
Stocks, Bonds and RatingsAnalyst CoverageIR Calendar
Contact IR
Back to Previous Menu
IR FAQContact Investor RelationsTerms and Conditions of Use
Shareholders and Investors
Back to Previous Menu
HistoryBusiness SegmentProducts & SolutionsSustainabilityEnvironment
Business Segment
Back to Previous Menu
Test and MeasurementProducts Quality AssuranceOthers
Sustainability
Back to Previous Menu
Sustainability ReportSustainability NewsTop Management MessageSustainability ManagementUN Global CompactHuman Rights and DiversityHuman ResourcesHealth and SafetySupply Chain ManagementQuality and Product SafetyCorporate PhilanthropyEnvironmentInternal ControlComplianceRisk ManagementStakeholders
Environment
Back to Previous Menu
Excellent Eco ProductAnritsu's statement with regard to WEEE and RoHS (EU)
Contact Us
HOME
Corporate InformationTest and MeasurementComponents and AccessoriesService AssuranceFood and Pharmaceutical EquipmentOptical Devices and Ultrafast Electron Devices
TEST AND MEASUREMENT
 Search Contact Us My Anritsu United Kingdom

VectorStar™ Vector Network Analyzers

Vector Network Analyzers

 

Get better, faster, more accurate broadband measurements with VectorStar™ dual and multiport VNAs, offering frequency coverage of 70 kHz to
20 | 40 | 50 | 70 | 110 GHz with extensions to 1 THz. Our newest vector network analyzers deliver precision performance for R&D and production test engineers who measure microwave or mm-wave components and devices.

 

Today's applications demand accuracy, long-term calibration stability, and industry-best broadband frequency coverage from your vector network analyzer. Discover which VectorStar VNA configuration is right for you by selecting an application area below.

 

topborder


Radar


Radar Applications

 

Find pulse distortion problems, spend more time measuring and less time correcting set up errors when characterizing radar components and subsystems.


 
Find out more

 
topborder


On-Wafer


Broadband On-Wafer Device Characterization Applications

 

Discover the smallest, lightest modules and best stability in a broadband vector network analyzer for 2-port and 4-port
on-wafer device characterization.


 
Find out more


Components


Active and Passive Components Application

 

Reduce cycle time, improve accuracy with the best VNA performance and widest frequency band for measuring active and passive components.
Find out more


Signal Integrity


Signal Integrity Applications


See your design clearly with high-quality S-parameters as low as 70 kHz. Minimize DC-extrapolation and causality issues so you can obtain correspondence between measurement and 3D-EM simulation.
Find out more
Products
Technologies
Products line-up
Video Gallery
Discontinued Models
Buy
Request a Quote
Used Test Equipment
Contact Sales Office
Support
Repair and Calibration
Training and Education
Technical Support
Downloads
Professional Services
About Anritsu
News
Corporate Information
Employment
Investor Relations
Sustainability
Anritsu World Wide
Sitemap Privacy Policy Terms of Use

Copyright 2019
Select a country/region
Australia Brazil Canada China Denmark Finland France Germany Hong Kong India Italy Japan South Korea Mexico Russian Federation Singapore Sweden Taiwan United Arab Emirates United Kingdom United States More
Confirm your country below to see local events, contact information and special offers.