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EuMW Workshops

Anritsu Workshops at EuMW - Register your place now

Six workshops focussing on leading Vector Network Analysis techniques and technologies will be available.

The workshops take place on the 8th Oct in meeting room Prag, Level 2.

Either register below or visit Anritsu on Stand 107 to register.

1. Accurate Differential Device Characterization Using VectorStar

Differential devices are used in a variety of applications. This seminar will explain how a Vector Network analyzer can be used to characterize these devices and given an overview of the methodologies available to make such measurements. In particular the appropriate use of superposition and true mode stimulus methodologies will be covered. In addition, test fixtures are often used thereby further increasing the likelihood of inappropriate DUT evaluation. This workshop will discuss how the advanced capabilities of fixture de-embedding within VectorStar, together with a real time display of corrected measurements, can improve the device analysis and device characterization.

Start Time: 10:00
Length: 40 minutes


2. Expanding Waveguide Boundaries in Device Characterization: Broadband 70 kHz to 145 GHz VNA

The continuing push for higher data throughput in wireless communication systems has resulted in a need for communication channels operating at higher frequencies and a demand for accurate device characterization beyond 110 GHz. Until now, coaxial connector frequency limitations and VNA source and receiver mm-wave limitations have prevented device characterization above 110 GHz using a vector network analyzer: This workshop will discuss the different industry-first developments that are included in the design of the VectorStar 145 GHz Broadband System. The discussion will provide an overview of a 0.8mm connector and describe the architecture of a 145 GHz mm-Wave module technology development.

Start Time: 11:00
Length: 40 minutes


3. What Have You Been Missing In Your Pulsed VNA Measurements?

This workshop will discuss pulse measurement methods used by VNAs and the associated trade-offs. The differences between narrowband and wideband methodologies will be the explained and the associated benefits to the user will be presented. Application to component measurements and on-wafer measurements will be discussed.

Start Time: 13:00
Length: 40 minutes


4. Demystify Noise Figure Measurements

This workshop will discuss different approaches to noise figure measurements and the associated advantages and disadvantages. Secondly, implementation techniques and trade-offs for the cold-source noise figure measurement method will be examined. Finally, a model for uncertainties will be presented, highlighting those areas which often need the most attention.

Start Time: 14:00
Length: 40 minutes


5. Improved Measurements Overcome High-Speed Interconnect Challenges

As speeds increase, signal integrity engineers increasingly have to make measurements using microwave vector network analyzers. Various considerations will be highlighted including the importance of the extent of the measurement frequency range at low and high ends, how this affects achieving correlation between 3D-EM simulation and measurement, and some practical de-embedding techniques.

Start Time: 15:00
Length: 40 minutes


6. Advances in mm-Wave and TeraHz region Materials Measurements

Materials measurement possibilities in the mm-wave range have improved in terms of repeatability, accuracy, and sample configurations. This supports those interested in the spectroscopic nature of the measurements and those wanting to identify specific biological, pharmacological or simple molecular behaviors. Waveguide-fixtured measurements of liquids and solids will be presented in W-band including those parameterized with temperature. Free-space measurements of sheet-like materials based on horn antenna configurations from 70 GHz to 500 GHz will also be shown.

Start Time: 16:00
Length: 40 minutes

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