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VectorStar, Smart Now, Smart later


VectorStar Network Analyzers are technologically and economically smart.

 

Anritsu’s industry-leading technology delivers performance where it really matters. The VectorStar 40 kHz to 140 GHz flagship broadband system provides industry-best performance in all three critical performance areas: broadband frequency coverage, dynamic range, and measurement stability.

 
Guide to Understanding VNA Calibration
 
Click here to read more about VectorStar Understanding VNA Calibration
 

Anritsu Workshops at EuMW - Register your place now

 

1. Noise Figure Measurement
Along with gain, noise figure is one of the fundamental indicators of performance of amplifiers. A variety of methods have been utilized at RF and microwave frequencies, each with particular advantages and disadvantages. This session will describe the various techniques available for these frequency ranges. It will conclude with an exploration of the difficulties in making noise figure measurements at mm-wave frequencies and present a practical method along with results

Start Time: 10:00
Length: 45 minutes
Speaker: Stefano Balzarini, Anritsu


2. Intermodulation Measurements at mm-Wave Frequencies
One of the challenges of making intermodulation measurements at mm-Wave frequencies has been the amount of bench space taken up by the extension modules required to produce the required mm-wave signals. This seminar will describe how to make swept intermodulation measurements based on the VectorStar Vector Network Analyzer using highly stable miniature frequency extension modules.

Start Time: 11:00
Length: 45 minutes
Speaker: Ferdinand Gerhardes, Anritsu


3. Highly Stable Measurement of Broadband mm-Wave Devices
Participants will learn about the root causes of the stability issues that have arisen in the past when making broadband millimetric s-parameter measurements. The most recent solution will then be presented that addresses those root-cause issues and which demonstrates significantly improved measurement stability. This delivers benefits including longer intervals between measurement calibrations and better measurement results

Start Time: 13:00
Length: 45 minutes
Speaker: Barry Smith, Anritsu


4. Advances in On-wafer Device Characterization
There is a growing need for more precise on-wafer characterization of both two and four-port semiconductor devices up to 110GHz to enable accurate and complete device models to be constructed. Participants in this session will learn about a highly compact broadband vector network analysis system with configurations for both two-port and four-port on-wafer measurement to >110 GHz. Participants will also learn about probe technology enhancements that allow metrology grade modeling of two-port and four-port devices from DC to 110GHz and the recommended calibration techniques used to calibrate down to the probe tip. Calibration types covered will include: TRL/LRL/LRM, Advanced LRM, LRRM and Hybrid-LRRM

Start Time: 14:00
Length: 1 hour 15 minutes
Speaker: Christian Sattler, Anritsu
Anthony Lord, Cascade Microtech


5. Non-Linear Device Characterization
In order to optimize power added efficiency, gain and noise figure, semiconductor devices must be characterized under the conditions in which they are expected to perform. In many communication amplifier cases, they will be operated in the non-linear region and the devices themselves will present non-fifty ohm impedances. In order to optimize design of matching circuits it is necessary to characterize such devices using a non-linear vector network analysis system that utilizes source and load impedance tuners. The test system architecture of such a measurement system will be described and compared with other methods. Practical results will also be presented.

Start Time: 15:30
Length: 45 minutes
Speaker: Steve Reyes, Anritsu


6. RCS & Antenna Measurements
This session is presenting applications of Anritsu Vector Star and a new vector network analyzer OEM product in line with antenna measurements. Attention will be given to the benefits of a new board that is mainly enhancing the system dynamic range and offers in parallel a price attractive solution.

Dynamic range is an important figure of merit for antenna and radar cross section measurement technology, which is defined as the difference between the maximum and minimum detectable signal, i.e. difference between saturation and noise level of the measurement device. Long cables are sometimes a limiting factor since they reduce the dynamic range. The board will be used as a backbone for antenna measurements, in both near-field and compact ranges. Due to the small size and its light weight the new concept can be mounted directly on the positioner, i.e. very close to the antenna under test (AUT). This setup has the advantage of shortening cable lengths to supply the signal to the source antenna and the AUT. Furthermore costs due to cables and desktop VNAs are highly reduced. Even additional mixers, which are normally installed next to the AUT to increase the dynamic range of antenna measurement systems, can be omitted.

In the case of radar cross section measurements, the shielded board can be installed next to the transmit and receive antennas, which permits even shorter cable lengths compared to the near- and far field measurement cases. In this work, experimental results will be presented showing the advantages of the new concept along with comparison results dealing with accuracy issues.

Start Time: 16:30
Length: 1 hour
Speaker: Prof. Dr.-Ing. Dirk Heberling,
Institute of High Frequency Technology, RWTH Aarchen University

 
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