This technical data sheet provides technical specifications for the VectorStar ME7838A4 Series Multiport Broadband Vector Network Analyzers. P/N: 11410-00704
This Measurement Guide provides instructions for using the 3744A-Rx mm-Wave Receiver Module for making noise figure measurements. P/N: 10410-00328
Anritsu is the leader of high frequency microwave connector technology and is driven by an ongoing commitment to exceed customer needs. Anritsu created and trademarked the K Connector with coverage to 40 GHz, along with a complete family of 40 GHz test equipment. It was an immediate success and today is used on many commercial components, test fixtures, and
defense systems. [P/N: 11410-00235]
This manual provides general service and maintenance instructions for Anritsu ME7838A4 Multiport Broadband/Millimeter-Wave (BB/mm-Wave) Vector Network Analyzer System.
Continual demand to accurately measure dielectric and magnetic properties of materials is a common need and is apparent in our every day lives. There is a need to quantitatively characterize material properties at RF and microwave frequencies. Learn more about the use of vector network analyzers (VNAs) as a flexible and versatile tool to accurately and quantitatively characterize material properties and showcase the broad applicability of the VNA as a tool to accurately do this at high frequencies.
Uncertainties and the Impact on Eye Diagrams/Time Domain Modeling
The characterization and measurement of E/O and O/E components at higher microwave frequencies has a different uncertainty distribution than at lower frequencies. A careful process can help minimize many of those categories. The individual uncertainty components have very different effects on final
subsystem modeled time domain results, such as eye diagrams. Understanding that error propagation can be useful. In a practical example, optimizing the critical uncertainty components can lead to noticeably better eye behavior in the final model.
By using instrument grade O/E calibration modules characterized by Anritsu and de-embedding
techniques included in both VectorStar and ShockLine software, Anritsu VNAs can make s-parameter
measurements of high speed optical components just like their electrical counterparts.
Overview of RF and Microwave instruments available to meet a variety of solutions. Featuring the frequency range, measurements, and other key features.
High-performance waveguide band system using
compact Anritsu mmWave modules.
This quick start guide provides a brief overview of the installation and use of 366xX-1 Verification Kits and the 2300-579 Performance Verification Software (PVS) with VectorStar MS4640A/B Series VNAs.
Refer to the VectorStar MS4640A/B Series 366xX-1 Verification Kits and 2300-579 PVS User Guide – 10410-00270 for detailed information about safety, installation, configuration, setup, and verification testing.
Quick Start Guide
In this Understanding Guide we will introduce the basic fundamentals of the Vector Network
Analyzer (VNA). Specific topics to be covered include phase and amplitude measurements,
scattering parameters (S-parameters), and the polar and Smith chart displays.
This guide provides warranty, safety and regulatory compliance information for the VectorStar™ Series VNA products. The VectorStar™ Series VNA products provide powerful network measurement tools for
performance analysis of RF and microwave devices with frequency ranges spanning from 70 kHz to 70 GHz in a single connector, and up to 1.1 THz using broadband mm-wave modules.
This quick start guide provides a brief overview of the MN469xC Multiport VNA System assembly. For important safety and compliance information and for more details about the assembly, configuration, setup, and initial equipment test, refer to the VectorStar MN469xC Series Multiport VNA Test Set Installation Guide.
Quick Start Guide
This manual provides general information, installation, operating, and maintenance information for the VectorStar MN469xC Series Multiport Test Sets. The following model Multiport Test Sets are discussed in this manual:
MN4694C, K Connectors, for the VectorStar MS4642A/B or MS4644A/B VNAs
MN4697C, V Connectors, for the VectorStar MS4645A/B or MS4647A/B VNAs
Throughout this manual, the term test set is used to refer to the MN469xC Series Multiport Test Set, the term VNA is used to refer to the VectorStar MS464xA/B Series Vector Network Analyzer, and the term DUT is used to refer to the device under test.
The Broadband Test Set Declaration of Conformity is a special document issued by Anritsu to state that the product meets all of the applicable legislation and European directives.
The VectorStar (Microwave Vector Network Analyzer) Declaration of Conformity is a special document issued by Anritsu to state that the product meets all of the applicable legislation and European directives.
Sequential peeling is a model/measurement-based method at network extraction for de-embedding. It uses isolatable phase responses of defects to create a lumped-element description of a structure (shunt, series, or cross-bar) that can be physically meaningful and useful in sequential de-embedding. The method works best when the significant reflections are electrically small and isolated and the overall loss of the fixture is not too great but there are corrections available to help with the loss element.
Two techniques are presented for handling and studying the problem of non-insertable DUTs. Further information on how to enable passivity enforcement is located in the VectorStar User Interface Reference Manual (PN 10410-00319).
For every measurement scenario from on-wafer device characterization to R&D testing to manufacturing and field operations, Anritsu continues to be the leader in VNA technologies and measurements.
Confidence on the Cutting Edge
In the Lab | On the Manufacturing Floor | In the Field
This poster features sections on Circuits and Waves, S-Parameters, Reflection Coefficient, Phase and Group Delay, Non Linear Transmission Lines, VNA Architecture, Superposition/True Mode Stimulus, Time Domain, Pulse Measurements, and a Reflection Coefficient Table.