Overview of RF and Microwave instruments available to meet a variety of solutions. Featuring the frequency range, measurements, and other key features.
This technical data sheet provides technical specifications for the VectorStar ME7838A4 Series Multiport Broadband Vector Network Analyzers.
High-performance waveguide band system using
compact Anritsu mmWave modules.
This quick start guide provides a brief overview of the installation and use of 366xX-1 Verification Kits and the 2300-579 Performance Verification Software (PVS) with VectorStar MS4640A/B Series VNAs.
Refer to the VectorStar MS4640A/B Series 366xX-1 Verification Kits and 2300-579 PVS User Guide – 10410-00270 for detailed information about safety, installation, configuration, setup, and verification testing.
Quick Start Guide
The VectorStar ME7838A mm-wave system combines the MS4640B series VNA and 3739B test set to control 2 external mm-wave modules for measurement
frequencies from 110 GHz to 750 GHz and higher in waveguide bands. The
3739B test set routes the internal RF and LO signals from VectorStar thus
eliminating the need for external sources. If 4 ports are required, a SM6586 test set and the MN4697B 4 port test set with 2 additional modules can be attached. OML or VDI modules may be used.
The VectorStar E and W band millimeter-wave (mm-wave) system incorporates the high performance compact Anritsu mm-wave modules in an economical extended E or W band configuration.
Anritsu is the leader of high frequency microwave connector technology and is driven by an ongoing commitment to exceed customer needs. Anritsu created and trademarked the K Connector® with coverage to 40 GHz, along with a complete family of 40 GHz test equipment. It was an immediate success and today is used on many commercial components, test fixtures, and
In this Understanding Guide we will introduce the basic fundamentals of the Vector Network
Analyzer (VNA). Specific topics to be covered include phase and amplitude measurements,
scattering parameters (S-parameters), and the polar and Smith chart displays.
This quick start guide provides a brief overview of the MN469xC Multiport VNA System assembly. For important safety and compliance information and for more details about the assembly, configuration, setup, and initial equipment test, refer to the VectorStar MN469xC Series Multiport VNA Test Set Installation Guide.
Quick Start Guide
This manual provides general information, installation, operating, and maintenance information for the VectorStar MN469xC Series Multiport Test Sets. The following model Multiport Test Sets are discussed in this manual:
MN4694C, K Connectors, for the VectorStar MS4642A/B or MS4644A/B VNAs
MN4697C, V Connectors, for the VectorStar MS4645A/B or MS4647A/B VNAs
Throughout this manual, the term test set is used to refer to the MN469xC Series Multiport Test Set, the term VNA is used to refer to the VectorStar MS464xA/B Series Vector Network Analyzer, and the term DUT is used to refer to the device under test.
This guide provides warranty, safety and regulatory compliance information for the VectorStar™ Series VNA products. The VectorStar™ Series VNA products provide powerful network measurement tools for
performance analysis of RF and microwave devices with frequency ranges spanning from 70 kHz to 70 GHz in a single connector, and up to 1.1 THz using broadband mm-wave modules.
This manual provides general service and maintenance instructions for Anritsu MN469xC Series Multiport Test Set. It contains procedures for:
Testing the system for proper operation
Verifying System Performance in conjunction with a 2-port MS4640A or MS4640B VectorStar VNA
Troubleshooting tests and techniques
Locating and replacing failed parts in the MN469xC Series Test Set
The Broadband Test Set Declaration of Conformity is a special document issued by Anritsu to state that the product meets all of the applicable legislation and European directives.
The VectorStar (Microwave Vector Network Analyzer) Declaration of Conformity is a special document issued by Anritsu to state that the product meets all of the applicable legislation and European directives.
Sequential peeling is a model/measurement-based method at network extraction for de-embedding. It uses isolatable phase responses of defects to create a lumped-element description of a structure (shunt, series, or cross-bar) that can be physically meaningful and useful in sequential de-embedding. The method works best when the significant reflections are electrically small and isolated and the overall loss of the fixture is not too great but there are corrections available to help with the loss element.
This digest is a short form catalog of Anritsu's test and measurement product offerings. Download to get a quick overview of the best of Anritsu. For more detailed specifications please see the full catalog.
Two techniques are presented for handling and studying the problem of non-insertable DUTs. Further information on how to enable passivity enforcement is located in the VectorStar User Interface Reference Manual (PN 10410-00319).
For every measurement scenario from on-wafer device characterization to R&D testing to manufacturing and field operations, Anritsu continues to be the leader in VNA technologies and measurements.
Confidence on the Cutting Edge
In the Lab | On the Manufacturing Floor | In the Field
By using instrument grade O/E calibration modules characterized by Anritsu and de-embedding
techniques included in both VectorStar and ShockLine software, Anritsu VNAs can make s-parameter
measurements of high speed optical components just like their electrical counterparts.
This white paper provides an overview of the high-frequency technology deployed in Anritsu’s VNA families. It is shown that NLTL technology results in miniature VNA reflectometers that provide enhanced performance over broad frequency ranges, and reduced measurement complexity when compared with existing solutions. These capabilities, combined with the frequency-scalable nature of the reflectometers provide VNA users with a unique and compelling solution for their current and future high-frequency measurement needs.