BERTWave Series Remote Control Operation Manual
Version: 22th Edition
MP2100B BERTWave Operation Manual
Version: 11th Edition
Introduces Anritsu Optical Measuring Instruments, Bit Error Rate Testers (BERT), Transport and Ethernet Testing products.
This Solution Brochure is a document for Optical Measuring Instruments, Bit Error Rate Testers (BERT), Transport and Ethernet Testing products.
The BERTWave series is designed especially for mass-production of optical modules and features an All-in-one BERT (for bit error rate measurement) plus sampling oscilloscope (for Eye pattern analysis) to help increase optical module production eﬃciency and cut costs.
MX210001A Jitter Analysis Software Operation Manual
Version: 8th Edition
The all-in-one MP2100B BERTWave supporting simultaneous BER and eye-pattern measurements. BERTWave support 4ch simultaneous BER measurement and Scope sampling speed support 150 ksample/s. BERTWave is ideal for both R&D and manufacturing tests because it increases efficiency and reduces measurement costs.
MX210002A Transmission Analysis Software Operation Manual
Version: 9th Edition
BERTWave MP2100B support 4ch BER test and fast eye pattern analysis because sampling speed is 150 ksample/s. Therefor BERTWave increases efficiency and reduces measurement costs.
Total Solution for Optical Module Evaluation / reduce Inspection Times and Improves Productivity MP2100B BERTWave MS9740A Optical Spectrum Analyzer.
With a built-in BERT and sampling oscilloscope, the BERTWave MP2100B is the ideal, low-cost measurement solution for evaluating both the characteristics of optical transceivers and AOC, as well as transmission-path quality.
The all-in-one BERTWave MP2100B also supports Total Jitter component analysis required for developing and manufacturing AOC. The AOC interface can be evaluated during simultaneous sending and receiving to simplify evaluation of AOC characteristics and transmission-path quality.
The Protection Adapters J1678A and J1679A are for protecting DUTs and measuring instruments against ESD/EOS and support high-reliability measurements.
The recent rapid increases in data volumes at network equipment, servers, and storage due to increasing use of smartphones, cloud computing, FTTx rollout, video streaming, etc., seem likely to increase even further in future. To cope with demand, many appliances and facilities are using digital signals exceeding the Gbit/s band. Dealing with these high-speed signals requires paying attention not only to the digital aspects but also to analog-type behavior, and care is required in choosing tools for monitoring these signals. This document discusses the key points when handling digital signals exceeding 10 Gbit/s from the perspective of measurement tools.
Electronic components of electronic devices and measurement devices break down when subjected to high voltages caused by electrostatic discharge (ESD) or electrical over-stress (EOS).Signals sent to I/O connectors of electronic, measurement and other devices must be within the rated voltage or the devices may fail. This document should be used to help build an environment that avoids ESD or EOS.
This note introduces standard remote sequences making use of the BERTWave functions and speed to measure optical modules and devices. The remote sequences described in this note can be used to configure a simple test system for manufacturing optical modules and devices by selecting the best commands from remote commands built into the BERTWave.
Simultaneous Jitter, EYE Pattern and EYE Mask Measurements
To cope with rapid rises in data volumes, data centers are introducing active optical cable (AOC) interconnects with transmission speeds faster than 10 Gbit/s between servers. These interconnects require Eye pattern and BER measurements to assure quality while overcoming problems of longdistance transmissions, high speeds and power consumption.
Ideal probe for GHz-band sampling oscilloscope, Choice of 10:1 or 20:1 attenuation ratio, Low capacity input ideal for monitoring high-speed signal waveforms, Short input ground lead ideal for high-frequency circuit evaluation.
S21 Measurement, Linear Equalizer/Filter/Emphasis Waveform Simulation