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Vector Network Analyzer 70GHz MS4647B

Anritsu Introduces Differential Noise Figure Measurement Option for VectorStar™ VNAs to Address High Performance Test Requirements

13/06/2018

New Option for Industry-leading VNAs Creates First Solution to Conduct Extensive Characterization of Differential Noise Figure on Devices Used in 5G, Microwave Systems

Signal Quality Analyzer-R MP1900A Customers

World-First PCI Express Test Solution with Multivendor Oscilloscope Support

04/06/2018

Anritsu Releases PCI Express® Test Solution in Collaboration with Granite River Labs and Teledyne LeCroy

Wireless Connectivity Test Set MT8862A

2x2 MIMO WLAN Evaluation at Actual Operation

21/05/2018

Launch of 2x2 MIMO Measurement Software MX886200A-010 for MT8862A

Network Master Pro MT1000A

Strengthening Network Master Pro MT1000A Functions Support of 5G Mobile Network I&M

08/05/2018

World’s Smallest Handheld Tester with eCPRI/1914.3(RoE) and Accurate Latency Measurement Functions for 5G ready mobile network

Signalling Tester Base Station Simulator MD8430A

Signalling Tester MD8430A Adds DL 6CA Gigabit LTE Evaluation Functions for LTE-Advanced Pro Support

03/04/2018

Launch of Gigabit LTE (DL 6CA, UL 256 QAM) Evaluation Functions as MD8430A Software Options

Huawei Ground-breaking NB-IoT Chipsets Now Supported by Anritsu Wireless Test Solution

30/03/2018

Universal Wireless Test Set MT8870A Provides Huawei with Improved Product Quality and Manufacturing Efficiencies

Spectrum Analyzer & Signal Analyzer MS2850A

Anritsu Announces Signal Analyzer MS2850A Selected by Samsung for 5G system development

22/02/2018

Samsung’s 5G T&M partner to power its first end-to-end 5G communication systems

Radio Communication Test Station MT8000A

Anritsu Launches New Tester for Developing 5G Products

19/02/2018

Radio Communication Test Station MT8000A contributes to solving 5G verification problems

Signal Quality Analyzer-R MP1900A

Signal Quality Analyzer-R MP1900A Earns PCI Express® 3.0 Architecture Link EQ Test and Rx Test Certification

01/02/2018

Integrated Test Solution Shortens Inspection Times of High-speed Serial Bus Interfaces During Development While Offering Cost-effective Scalability to PCI Express 4.0 and 5.0 Architecture

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