This manual is a reference document for the Anritsu ShockLine VNA user interface (UI) menus and dialog boxes. This chapter describes the document conventions used in this manual and lists related ShockLine VNA documentation. P/N: 10410-00337
ShockLine VNAs supports remote operations commanded via the TCP/IP or VXI-11 protocols. This manual provides operation and programming information for this activity. P/N: 10410-00746
This poster features sections on Circuits and Waves, S-Parameters, Reflection Coefficient, Phase and Group Delay, Non Linear Transmission Lines, VNA Architecture, Superposition/True Mode Stimulus, Time Domain, Pulse Measurements, and a Reflection Coefficient Table. P/N: 11410-00934
Introduces Anritsu 5G solutions and products.
Anritsu will contribute to customer's 5G product development and future innovation of network.
Overview of RF and Microwave instruments available to meet a variety of solutions. Featuring the frequency range, measurements, and other key features. P/N: 11410-00800
Anritsu is the leader of high frequency microwave connector technology and is driven by an ongoing commitment to exceed customer needs. Anritsu created and trademarked the K Connector with coverage to 40 GHz, along with a complete family of 40 GHz test equipment. It was an immediate success and today is used on many commercial components, test fixtures, and
defense systems. P/N: 11410-00235
The ShockLine family of vector network analyzers (VNAs) achieve a new level of capability, flexibility, and value
for RF and microwave network analysis applications. ShockLine VNAs deliver excellent performance for measurements from 50 kHz up to 43.5 GHz and banded E-band measurements from 55 GHz to 92 GHz. These instruments are ideal for testing passive and many active components with general purpose VNA requirements. P/N: 11410-01071
Anritsu's ShockLine Family of Vector
Network Analyzers are a series of five VNA
models (with 15 products to choose from) that provide a broad range of solutions to meet your unique performance, application, and budget needs. P/N: 11410-01039
In 1965, Anritsu filed the patent that defined the first modern Vector Network Analyzer (VNA).
We are proud to continue that tradition of innovation to the present day—with the world’s first portfolio of VNAs that bring Nonlinear Transmission Line (NLTL) technology to every measurement scenario from on-wafer device characterization to R&D testing to manufacturing and field operations. P/N: 11410-00905
Operation manual for the MS46121B and MS46121A vector network analyzer. P/N: 10410-00344
The MS46121B is part of the ShockLine family of Vector Network Analyzers from Anritsu. It is available in two frequency ranges of 40 MHz to 4 GHz and 150 kHz to 6 GHz, and is capable of 1-port s-parameter and band pass time domain
(distance to fault) measurements. P/N: 11410-00994
Although the TRL family of calibration algorithms have been around for over 40 years, there are still questions sometimes regarding differences between the family members. This is partially due to differences in various implementations over the years. The purpose of this document is to discuss some of the differences in the context of vector network analyzers (VNAs). P/N: 11410-01124
Vector network analyzers (VNAs) are used to measure the performance of a wide variety of passive and active RF and microwave devices. Passive devices can be less demanding to test than active devices, thus requiring less performance from the VNA. However, one interesting exception to this is the measurement of very low insertion loss passive components such as precision adapters or airlines. These types of devices can present a difficult challenge to characterize because of the desire for very low uncertainties on these small insertion losses. This application note talks about these challenges and provides a helpful technique. P/N: 11410-01090
The superposition technique relies on the inherent linear nature of a transmission line, and mathematically derives the differential and common-mode transmission line characteristics through superposition while stimulating just one side of the balanced transmission line at a time. The true-balanced/differential technique, also known as True-Mode Stimulus, uses two sources to create actual differential and common-mode stimuli. This white paper offers guidance to signal integrity designers on the differences between these approaches and which one may best fit their need. P/N: 11410-00659
In this Understanding Guide we will introduce the basic fundamentals of the Vector Network
Analyzer (VNA). Specific topics to be covered include phase and amplitude measurements,
scattering parameters (S-parameters), and the polar and Smith chart displays.
This guide provides a return loss performance verification test procedures for Anritsu model MS46121A/B
ShockLine 1-port USB VNA. Blank performance verification test records are provided at the end of this
document. Make copies of the blank test records and use them to record measured values.
The One-port ShockLine VNA Declaration of Conformity is a special document issued by Anritsu to state that the product meets all of the applicable legislation and European directives. P/N: 10101-00035
The MS46121B and MS46122B USB Vector Network
Analyzers are ideal for testing 1 & 2 port devices in
university laboratories. The combination of small size
and great performance make the USB VNAs excellent
for passive device test applications where low cost,
performance and small form factor are desired. The
MS46121B and MS46122B VNAs reduce bench space
requirements allowing for more ShockLine VNAs to be
installed for student use. They are also easily ported
from making measurements in a lab to then showing
a demonstration in a lecture hall.
The MS46121B is a series of two PC-controlled 1-Port USB ShockLine Vector Network
Analyzers with frequency ranges from 40 MHz to 4 GHz and 150 kHz to 6 GHz. The
VNAs are packaged in a compact housing and are externally controlled via USB from
a user supplied PC running the same Graphical User Interface (GUI) software as the
rest of the ShockLine family of VNAs.
This paper provides an overview of the high-frequency technology deployed in Anritsu's VNA families. It is shown that NLTL technology results in miniature VNA reflectometers that provide enhanced performance over broad frequency ranges, and reduced measurement complexity when compared with existing solutions. These capabilities, combined with the frequency-scalable nature of the
reflectometers provide VNA users with a unique and compelling solution for their current and future high-frequency measurement needs.