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Look closely, see clearly with VectorStar VNA Workshop

12/02/2014 - 27/03/2014

Join us for a FREE Technical VNA workshop - You will learn

1. Accurate Differential Device Characterization Using VectorStar

  • Differential devices are used in a variety of applications. This seminar will explain how a Vector Network Analyzer can be used to characterize these devices and given an overview of the methodologies available to make such measurements. In particular the appropriate use of superposition and true mode stimulus methodologies will be covered. In addition, test fixtures are often used thereby further increasing the likelihood of inappropriate DUT evaluation. This workshop will discuss how the advanced capabilities of fixture de-embedding within VectorStar, together with a real time display of corrected measurements, can improve the device analysis and device characterization.

    2. Expanding Waveguide Boundaries in Device Characterization: Broadband 70 kHz to 145 GHz VNA

  • The continuing push for higher data throughput in wireless communication systems has resulted in a need for communication channels operating at higher frequencies and a demand for accurate device characterization beyond 110 GHz. Until now, coaxial connector frequency limitations and VNA source and receiver mm-wave limitations have prevented device characterization above 110 GHz using a vector network analyzer: This workshop will discuss the different industry-first developments that are included in the design of the VectorStar 145 GHz Broadband System. The discussion will provide an overview of a 0.8mm connector and describe the architecture of a 145 GHz mm-Wave module technology development.

    3. What Have You Been Missing In Your Pulsed VNA Measurements?

  • This workshop will discuss pulse measurement methods used by VNAs and the associated trade-offs. The differences between narrowband and wideband methodologies will be the explained and the associated benefits to the user will be presented. Application to component measurements and on-wafer measurements will be discussed.

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