Different materials have varying energy-dependent x-ray attenuation coefficients. X-ray images acquired at high energy and low energy will exhibit different attenuation characteristics.
The x-rays generated from an x-ray inspection system have several energy levels. The dual energy inspection system produces two different images from two different energy x-rays simultaneously.
High energy x-rays produce a brighter image and low energy x-rays produces a darker image. By subtracting the two images acquired at different energies, the system eliminates an image having the same gray level, leaving only contaminants.
The dual energy technology delivers the following unique features compared to conventional X-ray technology:
(1) Low density items can be detected.
(2) Even overlapping products can be inspected without false rejecting.
Analyzing two different x-ray energy signals, it clearly distinguishes contaminants from products. Performs accurate inspection of low density bones in metal and overlapping products.
A variety of models is available for a wide range of products. For details of detection areas, please submit an online inquiry form.
[Example model] Maximum width: 390 mm, Maximum height: 150 mm (KD7416DWZ)