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Signal Quality Analyzers MP1800A

 
MP1800A
功能
  • Highest quality waveforms, including lowest intrinsic jitter
  • Expandable slot configurations for serial and parallel applications
  • Configurable BER Testing (BERT) from 100 Mbit/s to full 100 Gbit/s of data output with a single chassis
  • Optical (SFP & XFP) and electrical interfaces available
  • Differential electrical interfaces
  • 56 Gbps BER measurement using 4CH PPG/ED when used with Anritsu multiplexer/demultiplexer
  • Jitter Modulation up to 25 Gbit/s
  • 4/6 slot chassis providing flexibility for synthesizer, PPG, ED, mux/demux and optical Interface modules
  • Windows XP GUI plus remote control over GPIB and Ethernet
  • Easy to operate at high-security sites such as Data Centers because there is not a built-in hard disk on the MT1810 chassis

 

The MP1800 Signal Quality Analyzer (SQA) provides bit error rate (BER) and quality analysis for serial digital signals directly from 100 Mbit/s to 28 Gbit/s with configurations that support 50 Gbit/s. The modular design of the MP1800A Signal Quality Analyzer (SQA) series offers customers a flexible cost-effective solution for performing measurements at the ideal bit error rate.

The MP1800 SQA provides Pulse Pattern Generator (PPG) and Error Detectors (ED) in a single chassis. It allows for multi-channel support for parallel testing. Complicated searching for input thresholds or phase adjustments is simplified with the touch of a single key. It is ideal for research and development of 100 GE, optical modulators, high-speed logic, ICs, digital systems, and PON.


 


The MP1800 Series provides solutions for:

  • Ultra High Speed Backplane Test Solution - Crosstalk, emphasis and skew tolerance test
  • 40+Gbit/s Optical Modulation Solution - I/Q signal transmission test
  • 100GbE Device Test Solution - High quality and functional test signals
  • Manufacturing Solution for Multiple Optical Modules and High-Speed Connectors - Low Cost, Low Power, Short Test Time, and High Quality
  • Evaluating PON Devices - Simple Evaluation of Devices using Burst Data

Available application software for:

  • Eye Margin
  • Q Measurement
  • Bit Error Analysis using ISI
  • Eye Diagram
  • Bathtub
  • Jitter generation and Jitter tolerance test
  • SONET / SDH / 1GbE/10GbE Pattern Editor

Read more about how the MP1800 Series is a flexible Evaluation Solution for High-Speed Devices

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