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Results 1 - 1 of about 1 for 11410-00512.pdf. Pulsed S-parameter Measurements Application Note - Anritsu ... Many devices, particularly power devices, were not designed to operate continuously or with CW signals. When devices are being tested on-wafer, this becomes even truer since thermal resistance is often greatly increased. In these cases, S-parameter measurements must often be performed in a pulsed environment... Downloads