The Bluetooth Test Set MT8852B is the market leading RF measuring instrument for design proving and production test of a wide range of products that integrate Bluetooth technology. It supports Basic Rate (BR), Enhanced Data Rate (EDR) and Bluetooth low energy (BLE) measurement of transmit power, frequency, modulation, and receiver sensitivity required by Bluetooth RF test specification.
In production, a single key press initiates a measurement script that tests a device in less than 10 seconds.
Measurements performed as defined in the Bluetooth RF Test Specification
- Measurements performed in Bluetooth test mode - Loopback or Tx mode supported
- Initialization and control of test devices through UART, USB or USB-Adaptor HCI control interface
- Built-in support for Bluetooth low energy 2-Wire control interface
- BR/EDR/Bluetooth low energy dirty transmitter for receiver sensitivity test cases
Audio testing capability
The MT8852B supports all three codec air interfaces (µ-Law, A-Law and CVSD) on up to three SCO audio channels. It offers comprehensive testing facilities integrated within a Bluetooth wireless technology test set. Rear-panel jack-plug connectors provide analog inputs and outputs for all three audio channels.
Bluetooth low energy testing
With the Bluetooth low energy option and BLE Data Length Extension option, MT8852B can conduct radio layer tests that comply fully with the newly adopted Bluetooth v4.2 standard. The extension of the data packet length in Bluetooth low energy from 37 octets to 255 octets increases the effective throughput of the system.
These Bluetooth low energy measurement options add six Bluetooth low energy test cases to the standard product. These test cases can be run as part of a test script so that test program creation is simplified and test times are minimized.
Adaptive Frequency Hopping inspection function
The Adaptive Frequency Hopping (AFH) option facilitates analysis of interference from, and co-existence with, interfering signals such as WLAN. This option provides graphical displays of FER and masked channels when interfering signals are introduced, allowing optimization of hardware designs.
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