Skip to main content
mp2100b

BERTWave™

MP2100B
This product has been discontinued
Overview
  • Built-in 4ch BERT and sampling oscilloscope
  • Simultaneous 4ch Bit Error Rate (BER) measurements
  • High-quality waveform PPG (1 ps rms Jitter)
  • High-input sensitivity (10 mVp-p minimum input sensitivity)
  • High-speed Eye Mask test and Eye pattern analysis at 150 ksample/s max.
  • Supports differential signal BER measurement, Eye Mask test and Eye pattern analysis
  • Up to six built-in Bessel filters for full-featured application support
  • Compact (18 cm deep) test set for optical module evaluation
  • Simultaneous measurement of BER, Jitter, Eye pattern and Eye Mask
  • Supports WDP measurements
  • Calculates optimum values for sampling simultaneously with equalizer and emphasis values to display Eye Pattern
  • Simultaneous Eye Pattern, Eye Mask and Jitter measurements of simulated waveform
The BERTWave MP2100B is an all-in-one test set with built-in BERT and available sampling oscilloscope supporting evaluation of optical modules, including BER measurements, Eye Mask tests, Eye pattern analyses, etc.

A BERT and sampling oscilloscope are required measuring instruments for evaluating optical modules used by optical communications systems. Previous evaluations of optical modules, such as QSFP+ and SFP+ modules, required provision of a separate BERT and sampling oscilloscope. However, the BERTWave MP2100B incorporates a BERT supporting from one up to 4 channels as well as an optional sampling oscilloscope in a single, compact, 18 cm deep cabinet, slashing equipment investment costs and saving bench-top space. In addition, the BERTWave MP2100B reduces measurement times by eliminating the need to change cable connections at simultaneous BER measurements, Eye Mask tests, and Eye pattern analyses. Additionally, adding the SFP+ plug-in port supports optical BER measurements.

The BERTWave MP2100B BERT function supports BER measurements at speeds ranging from 125 Mbit/s to 12.5 Gbit/s; its available built-in 4ch BERT option makes it easy to configure test systems for multichannel modules, such as QSFP+ and AOC. Further, in addition to supporting BER measurements for differential signals, it also supports Eye Mask and Eye pattern Measurements.

The BERTWave MP2100B sampling oscilloscope has a bandwidth of 25 GHz (typ.) for electrical interfaces and a bandwidth of 9 GHz (typ.) for optical interfaces. In addition, up to six optional Bessel filters can be built-in for measuring optical signals using the scope. Using these filters, MP2100B supports extinction ratio measurements, Eye Mask tests and Eye pattern analyses for various applications. Further, the scope has a Fast Sampling Mode to secure the fastest high-speed measurements; sampling speeds of up to 150 ksample/s are supported by Fast Sampling Mode, which is 1.5 times faster than legacy models and supports time-saving high-speed Eye Mask tests and Eye pattern analyses.

Using the Jitter Analysis MX210001A software facilitates easy all-in-one simultaneous Jitter analysis, Eye pattern and Eye Mask measurements and the 150 ksample/s sampling speed makes even more efficient use of measurement time. Combined use with MATLAB® supports waveform dispersion measurements for specific signals, such as WDP, TWDP, and dWDP waveforms.

Last, the Transmission Analysis MX210002A software adds functions for analyzing device transmission (S21 gain and phase), plus a De-Embedded waveform simulation function executed by linear equalizer, filter, and Emphasis calculations. Simultaneous waveform sampling and simulation as well as simultaneous Eye pattern and Eye Mask measurements are supported. Combined use with the MX210001A software also enables simultaneous Jitter measurements of simulated waveforms.

MATLAB® is a registered trademark of The MathWorks Inc.

BERT

Operation Bit Rate With MP2100B-092 Without MP2100B-092
PPG, ED Common:
Variable bit-rate range (1 kbit/s step)
   125 Mbit/s to 12.5 Gbit/s
PPG, ED Common:
Variable bit-rate range (1 kbit/s step)
   8.5 Gbit/s to 11.32 Gbit/s

1/N bit-rate operation range
   N=2: 4.25 Gbit/s to 5.66 Gbit/s
   N=4: 2.125 Gbit/s to 2.83 Gbit/s
   N=8: 1.0625 Gbit/s to 1.415 Gbit/s
   N=16: 531.25 Mbit/s to 707.5 Mbit/s
   N=32: 265.625 Mbit/s to 353.75 Mbit/s
   N=64: 132.813 Mbit/s to 176.875 Mbit/s
Test Pattern PRBS: 27-1, 29-1, 215-1, 223-1, 231-1 (Invert ON/OFF)
USER Data: 1.3 Mbits programmable (sample pattern file such as CJPA, etc.)
Electrical Data Output Data, Xdata
Amplitude 0.1 Vp-p to 0.8 Vp-p
Electrical Data Input Data, Xdata
O/E Input Optical data
Wavelength Range 750 nm to 1650 nm

Sampling Oscilloscope

Bandwidth (-3 dB) Electrical: DC to 20 GHz minimum, DC to 25 GHz typ.
Optical: DC to 9 GHz (typ., at electrical -3 dB cutoff without filter)
Display Eye pattern, Pulse pattern, Coherent Eye
Measurement Function Statistical (NRZ), Histogram, Mask compliance
Sampling Speed Normal: 100 ksample/s (typ.)
Fast Sampling Mode: 150 ksample/s (max.)
O/E Input (Option 023) Optical data
Wavelength Range 750 nm to 1650 nm
Clock Recovery (Option 055) 0.1 GHz to 2.7 GHz, 8.5 GHz to 12.5 GHz

Jitter Analysis Software MX210001A

Operating Conditions Operates only when installed in MP2100B with correct license information
The installer runs with V3.00.00 or later
Other use conditions comply with MP2100B series
The WDP runs under MATLAB R2010b SP1
Measurement Algorithm Histogram mode, Pattern search mode
Histogram Mode Measurement Items TJ (1.0E-12), TJ (user defined), RJ (d-d), DJ (d-d), DDPWS, J2 Jitter analysis, J9 Jitter analysis, Eye opening
Pattern Search Mode Measurement Items TJ (1.0E-12), TJ (user defined), RJ (d-d), RJ (rms), DJ (d-d), PJ (p-p), DDJ (p-p), DCD, ISI (p-p), Eye opening, J2 Jitter analysis, J9 Jitter analysis, DDPWS, PJ Frequency
WDP Measurement Requires installation of MATLAB® 2010b by MathWorks
Measurement Items WDP, dWDP, TWDP, dTWDP, WDPc, dWDPc, TWDPc, dTWDPc

Transmission Analysis Software MX210002A

Operating Conditions Operates only when installed in MP2100B with correct license information
The installer runs with V3.00.00 or later
Other use conditions comply with MP2100B series
Measurement Mode Transmission analysis, Waveform estimation
Transmission Analysis Measurement Items Gain graph, Phase graph, Group delay graph
(Phase graph and Group delay graph switching display)
Waveform Estimation Equalizer Setting Selects reflector, non-reflector at calculation
Emphasis Format 2Post/1Pre, 3Post, 1Post/1Pre, 2Post, 1Post
Device Character Reads S2P file
Jitter Analysis Displays estimated waveform calculation results at MX210001A
(when MX210001A installed in MP2100A)
Lineup

Software

Jitter Analysis Software

The Jitter Analysis Software MX210001A has high-speed and Jitter-measurement functions supporting all-in-one measurements, such as simultaneous Jitter analysis, Eye Pattern measurement and Eye Mask test measurements.
Moreover, the high-speed sampling increases measurement efficiency by reducing measurement time. And combining the MX210001A with MATLAB supports WDP, TWDP and dWDP measurements for evaluating the waveform dispersion of specific signals.

>>>Click here for details about the Jitter Analysis Software MX210001A

Transmission Analysis Software

The Transmission Analysis Software MX210002A to the BERTWave supports Tx analyses (S21 Gain, Phase), and waveform simulation (de-embedded) using linear equalizer, filter, and emphasis operations; simultaneous waveform sampling and simulation support simultaneous Eye Pattern measurement and Eye Mask test measurements. Furthermore, combined tracking with the MX210001A software permits simultaneous Jitter measurement of simulated waveforms.

>>>Click here for details about the Transmission Analysis Software MX210002A

Library
VIDEOS
How to Prevent ESD and EOS Damaging Measuring Instruments and DUT

How to Prevent ESD and EOS Damaging Measuring Instruments and DUT
Learn the necessary steps to prevent ESD/EOS damage to your DUT and your measuring instrument.

MP2100B-E-v1.00

MP2100B
The BERTWave MP2100B is an all-in-one test set with built-in BERT and sampling oscilloscope supporting evaluation of optical modules, including BER measurements, Eye Mask tests, Eye pattern analyses, etc.