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DesignCon 2016

1/20/2016 - 1/21/2016 , Santa Clara, California, BOOTH 717

Visit Anritsu Booth #717 at DesignCon!

Solution Demonstrations Include:

  • High Speed Serial Bus Test Solution (PCIe G4 and 100G Ethernet)
  • 56G NRZ and PAM4 Accurate Jitter Tolerance Test
  • 40/100G AOC and Q-SFP Test Solutions (IBTA)
  • 70GHz 4 Port Signal Integrity Solution
  • 4-Port 70 kHz-110GHz Broadband VNA Solution
  • New 43.5GHz 4-port VNA. Differential S-parameter Measurements

MP1800a
MP1800A Signal Quality Analyzer


Vector Star
VectorStar™ Vector Network Analyzers

Don’t Miss Our Technical Sessions!

Hear industry experts present on the latest in testing solutions on Thursday, January 21 in Great America 2.


Time

Topic

Speaker(s)

Outlook Link

9:20 a.m. – 10:00 a.m.

56G PAM4 Accurate BER Measurement and JTOL Test with 4-tap emphasis

Hiroshi Goto, Anritsu Company

10:15 a.m. – 10:55 a.m.

20Gbps+ High Speed Serial BUS Test Solution

Darren Gray, Granite River Labs

11:05 a.m. - 11:45 a.m.

100G EDR and QSFP+ Cable Test Solutions

James Morgante, Anritsu Company

2:00 p.m. – 2:40 p.m.

Signal Integrity: VNA Applications

Joe Mallon, Anritsu Company

2:50 p.m. – 3:30 p.m.

Mobile-apps-like Signal Integrity Software

Dr. Ching-Chao Huang, AtaiTec

3:45 p.m. – 5:00 p.m.

20Gbps+ High Speed Serial BUS Test Solution

Darren Gray, Granite River Labs



DesignCon 2016