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DesignCon 2015

1/27/2015 - 1/30/2015 , Santa Clara, CA

Visit Anritsu Booth #717 at DesignCon!

Demonstrations include:

  • Signal Integrity Test Solution: Complete 32G Jitter Tolerance Test Solution
  • High-Speed 64G PAM4 Signal Generation and Analysis
  • 100G AOC/DAC QSFP+ Cable Test Solution
  • 40G/100G OTN Test Solution
  • 40GHz 4-Port Signal Integrity Solution
  • 4-Port 70kHz-110GHz Broadband VNA Solution
  • Simultaneous Forward and Reverse Differential S-Parameter Measurements
  • Spectral Content of High-Speed SERDES Signals
MP1800a
MP1800A Signal Quality Analyzer


Vector Star
VectorStar™ Vector Network Analyzers

Don’t Miss Our Technical Sessions!

Hear industry experts present on the latest in testing solutions on Thursday, January 29 in Great America 2.


Time

Topic

Speaker(s)

Outlook Link

8:30 a.m. – 9:10 a.m.

Critical Elements for Conducting Accurate Ultra-High-Speed SI BER Measurements

Hiroshi Goto, Anritsu Company

9:20 a.m.  – 10:00 a.m.

Channel Testing Using a 32G NRZ/PAM-4 Waveform Generator and 65 GHz Oscilloscope to Analyze Jitter

Hiroshi Goto, Anritsu Company
Alan Blankman, Teledyne LeCroy

10:15 a.m. - 10:55 a.m.

Achieving Accurate Jitter Tolerance Test at 28/32 Gbps for 100G+ Applications

Daniel Gonzalez, Anritsu Company

11:05 a.m.  – 11:45 a.m.

S-parameter Quality Metrics and Analysis to Measurement Correlation

Joe Mallon, Anritsu Company
Yuri Shlepnev, Ph.D., Simberian

2:00 p.m. – 2:40 p.m.

The Case for VNAs & S-parameters: Measuring for Max Performance

Joe Mallon, Anritsu Company

2:50 p.m. – 3:30 p.m.

Channel Testing Using a 32G NRZ/PAM-4 Waveform Generator and 65 GHz Oscilloscope to Analyze Jitter

Hiroshi Goto, Anritsu Company
Alan Blankman, Teledyne LeCroy

3:45 p.m. – 4:45 p.m.

InfiniBand –100 Gbps and Beyond and Techniques for Effective Testing of AOC/DAC QSFP+ Cables

Bill Lee, InfiniBand Trade Association
James Morgante, Anritsu Company



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